JPS5892854A - Ion concentration analyser - Google Patents
Ion concentration analyserInfo
- Publication number
- JPS5892854A JPS5892854A JP56181583A JP18158381A JPS5892854A JP S5892854 A JPS5892854 A JP S5892854A JP 56181583 A JP56181583 A JP 56181583A JP 18158381 A JP18158381 A JP 18158381A JP S5892854 A JPS5892854 A JP S5892854A
- Authority
- JP
- Japan
- Prior art keywords
- alternating current
- electrode
- ion concentration
- ion
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus
- G01N27/4165—Systems checking the operation of, or calibrating, the measuring apparatus for pH meters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/28—Electrolytic cell components
- G01N27/30—Electrodes, e.g. test electrodes; Half-cells
- G01N27/301—Reference electrodes
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- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Molecular Biology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、イオン電極、比較電極を被検液中に浸漬した
ままｉｌ極の内部抵抗が正常であるかどうかを点検でき
る′ようにしたイオン濃度計に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ion concentration meter that allows checking whether the internal resistance of an il electrode is normal while the ion electrode and reference electrode are immersed in a test liquid.
イオン濃度、例えばｐＨ値を連続測定する場合、カラス
電極への叡物質コーティング若しくはガラス応答膜の変
電による感度変化郷の要因によって測定誤差を生じる。When ion concentration, for example, pH value, is continuously measured, measurement errors occur due to factors such as changes in sensitivity caused by coating the glass electrode with a chemical substance or by changing the electrical current of the glass response membrane.
そのため定期的に電極洗浄作業を行なったり、計器の校
正作業を実行したりする必要がある。Therefore, it is necessary to periodically clean the electrodes and calibrate the instruments.
しかしながら、被検液の性状や測定電像の経時的変化、
劣化等積々の要因によって不規則的、突発的に測定不良
を起すことが多いため、定期的な洗浄や校正作業はその
効果を期待することができないものである。このような
事情は１１計だけでなくイオン濃度計全般に共通し、そ
の解決が要望されている。However, changes over time in the properties of the test liquid and the measured electromagnetic image,
Since measurement failures often occur irregularly and suddenly due to cumulative factors such as deterioration, regular cleaning and calibration work cannot be expected to be effective. This situation is common not only to the 11 meters but also to all ion concentration meters, and a solution is desired.
本発明者らは、このような事情下にあって、電極への異
物質コーティング等の前述した誤差要因が、イオン電極
と比較電極の間に等価的に存在する起電力源の内部抵抗
と関連しているという現象、殊に測定誤差や測定不良を
生じた場合は前記起電力源の内部抵抗に変化がみられる
という現象に基づき、イオン電極と比較電極間に存在す
る起電力源の内部抵抗をイオン濃度の測定動作に弊害を
及ぼすことなく測定できるよう工夫して、測定誤差や測
定不良の発生を予期し効果的な電極洗浄作業。Under these circumstances, the present inventors have determined that the above-mentioned error factors such as foreign substance coating on the electrode are related to the internal resistance of the electromotive force source that equivalently exists between the ion electrode and the reference electrode. Based on the phenomenon that the internal resistance of the electromotive force source that exists between the ion electrode and the reference electrode changes based on the phenomenon that the internal resistance of the electromotive force source changes when a measurement error or defect occurs. We have devised a way to measure the ion concentration without causing any harm to the measurement operation, and to anticipate the occurrence of measurement errors and poor measurements and perform effective electrode cleaning work.
校正作業を行なうための一助たらんとするものである。It is intended to help with proofreading work.
而して、本発明は、試料に浸漬されたイオン電＆及び比
較電極と、両電極間電位を測定する回路系からなるイオ
ン濃度計において、低周波の交流電流を前記両電極間に
流す電源手段を設けて、両電極間の起電力源によって発
生する直流分電位に前記交流電流に起因した交流電位を
重畳させると共に、この交流分電位から両電極間におけ
る起電力源の内部抵抗を測定するよう構成したことを要
旨としている。ここに電源手段を交流に選んだのは、測
定電極が分極することをさけるため、及びイオン濃度が
直流で検出されるので、その濃度信号と干渉し合わない
ようにするためである。またその周波数を超低周波に選
んだのは、１！極と回路系とがシールド線で連結されて
いて、シールド線カ等価的にローパスフィルタを構成し
高周波信号は減衰が叡しいこと、及び回路系の入力側に
は−よる減衰も激しいことに基づいている。この電源手
段の周波数を具体的にどの程度の周波数に選ぶかは次の
実施例の中で説明する０
以下図面に基づき説明する。第１図は本発明の一実施例
を示し、図中、１はイオン電極として例えばガラス電極
、２は比較電極、３はこれら両電極が浸漬さねた試料、
４は前記両電極１，２間の直流分電位を増幅し、指示等
して測定する直流分信号測定回路である。この回路４と
前記イオン電極１とはシールド線５．抵抗Ｒ１とコンデ
ンサＣ饋からなるローパスフィルタ、増幅率が１となる
よう接続された演算増幅器６及び交流分をカットするフ
ィルタ７とを介して接紗されている。８は低周波の交流
電流を前記両室＆１，２間に流すための電源手段で、低
周波の交流電圧Ｅｘ、ｙ を発生する発生器９と、直
流電圧ＥＰＨを充電するコンデンサＣ１と、前記交流電
圧Ｅｚνをコンデンサの充電１
電圧ＥＰａに重畳させで出力する演算増幅器１０と、前
記コンデンサＣ！に直流電圧を蓄電させるためのスイッ
チＳ１とから成っている。この電源手段８の演算増幅器
１０の出力端はスイッチＳ？及び抵抗ｋ。Accordingly, the present invention provides an ion concentration meter consisting of an ion electrode and a reference electrode immersed in a sample, and a circuit system for measuring the potential between the two electrodes. A means is provided to superimpose an alternating current potential caused by the alternating current on a direct current potential generated by the electromotive force source between the two electrodes, and to measure the internal resistance of the electromotive force source between the two electrodes from this alternating current potential. The main point is that it is structured as follows. The reason why the power supply means was chosen to be AC is to avoid polarization of the measurement electrode, and because the ion concentration is detected by DC, to avoid interference with the concentration signal. Also, the reason why the frequency was chosen as ultra-low frequency is 1! The poles and the circuit system are connected by a shielded wire, and the shielded wire equivalently constitutes a low-pass filter, and high-frequency signals are attenuated properly, and the input side of the circuitry is also severely attenuated. ing. How to specifically select the frequency of this power supply means will be explained in the following embodiments.The following will be explained based on the drawings. FIG. 1 shows an embodiment of the present invention, in which 1 is an ion electrode such as a glass electrode, 2 is a reference electrode, 3 is a sample in which both of these electrodes are immersed,
Reference numeral 4 denotes a DC component signal measuring circuit that amplifies the DC component potential between the electrodes 1 and 2, and measures it by giving an instruction or the like. This circuit 4 and the ion electrode 1 are connected to a shield wire 5. It is connected via a low-pass filter consisting of a resistor R1 and a capacitor C, an operational amplifier 6 connected so that the amplification factor is 1, and a filter 7 for cutting off alternating current. Reference numeral 8 denotes a power supply means for flowing a low frequency alternating current between the two chambers &1 and 2, which includes a generator 9 that generates a low frequency alternating current voltage Ex, y, a capacitor C1 that charges the direct current voltage EPH, and the An operational amplifier 10 that superimposes an alternating current voltage Ezν on a charging voltage EPa of a capacitor and outputs the same, and the capacitor C! and a switch S1 for storing DC voltage. The output terminal of the operational amplifier 10 of this power supply means 8 is connected to the switch S? and resistance k.
を介してシールド線５の出力端側に接続されている。前
記スイッチｓ２とＳ！は一方がオンのときは他方がオフ
するよう連動させである。スイッチＳ１がオンのときコ
ンデンサＣ２に直流電圧ＥＰＭが充電されるが、この電
圧は、演算増幅器６の増幅率が１であるからイオン電極
１と比較電極２の間に等価的に存在する起電力源の電圧
に等しくなる。このように両電伸１，２間の起電力に等
しい電圧ＥＰＨをコンデンサＣ！に充電し、この電圧と
発生器９が発生する交流電圧ト、Ｌνとを重畳した電圧
を電源手段８が出力するようにしたのは、イオン電＆１
からＸ１！手段８に向けてイオン濃度測定信号である直
流電派が流れないようにするためである。これによって
スイッチ５２がオンされていてもイオン濃度測鎖信号の
全てが＠流分信号測定回路４に入力される。前記発生器
９の発生する交ａｍ圧の周波数は、シールド＃５ａび抵
抗に、とコンデンサＣ１とから構成されるローパスフィ
ルタによって大幅に減衰されたり通過阻止されたりしな
い周波数に選んである。イオン電極としてガラス電極を
用いた場合、前記周波数は０．１〜１ｉｉｚ 程度が望
ましい。It is connected to the output end side of the shielded wire 5 via. Said switches s2 and S! are linked so that when one is on, the other is off. When the switch S1 is on, the capacitor C2 is charged with the DC voltage EPM, and since the amplification factor of the operational amplifier 6 is 1, this voltage is equivalent to the electromotive force that exists between the ion electrode 1 and the comparison electrode 2. equal to the source voltage. In this way, the voltage EPH equal to the electromotive force between the two electric wires 1 and 2 is applied to the capacitor C! The reason why the power supply means 8 outputs a voltage obtained by superimposing this voltage and the alternating current voltage T, Lν generated by the generator 9 is that the ion electric power &1
From X1! This is to prevent the DC current, which is the ion concentration measurement signal, from flowing toward the means 8. As a result, even if the switch 52 is turned on, all of the ion concentration measurement chain signals are input to the flow signal measurement circuit 4. The frequency of the AC pressure generated by the generator 9 is selected to be a frequency that is not significantly attenuated or blocked by the low pass filter composed of the shield #5a, the resistor, and the capacitor C1. When a glass electrode is used as the ion electrode, the frequency is desirably about 0.1 to 1 Hz.
図中、１１は電極内部抵抗を測定し、指示するための抵
抗測定回路である。この回路１１．の入力側には直流分
をカットし、交流分のみ通すフィルタ１２が設けられて
いる。In the figure, 11 is a resistance measuring circuit for measuring and indicating the internal resistance of the electrode. This circuit 11. A filter 12 is provided on the input side of the filter 12 to cut the DC component and pass only the AC component.
この構成によれば、イオン電＆１と比較電極２間に発生
した直流分電位による電流がシールド線５、ローパスフ
ィルタ、演算増幅器６、フィルタ７を通じて直流分信号
測定回路４に入力され、該回路内で増幅され、校正され
る等してイオン＃度信号として測定される。このとき、
スイッチＳＩがオンしていると、コンデンサ０２に前記
両極１，２間に発生した直流分電位ＥＰＲが充電されて
いる。According to this configuration, a current due to the DC component potential generated between the ion electrode &1 and the reference electrode 2 is input to the DC component signal measuring circuit 4 through the shield wire 5, the low-pass filter, the operational amplifier 6, and the filter 7, and The signal is amplified, calibrated, etc., and measured as an ion #degree signal. At this time,
When the switch SI is on, the capacitor 02 is charged with the DC potential EPR generated between the two poles 1 and 2.
次にスイッチＳ！をオンにすると一コンデンサＣ２に充
電された直流電圧Σ■と発生器９の発生する交流電圧］
！、Ｌνとが重畳した電圧Ｅｐ＊＋ｈｔ、νが電源手段
８から出力され、両電極１，２間に交流−流を流す０す
ると、両電極間における起電力源の内部抵抗と前記交流
電流とによって両電極１．２間に交流分電位を発生する
。この交流分電位は、両電極間の起電力源による直流分
電位（イオン濃度信号）と重畳した状態でシールド線５
、ローパスフィルタを経て演算増幅器６から出力される
。この出力電圧を求めるためにスイッチＳ！をオンした
場合の！１Ｉｓ１図と等価な回路を第２図に示す。図中
。Next is Switch S! When turned on, the DC voltage Σ■ charged in the capacitor C2 and the AC voltage generated by the generator 9]
! . An alternating current potential is generated between both electrodes 1.2. This AC component potential is superimposed on the DC component potential (ion concentration signal) caused by the electromotive force source between both electrodes.
, and is output from the operational amplifier 6 through a low-pass filter. Switch S! to find this output voltage! When turned on! FIG. 2 shows a circuit equivalent to FIG. 1Is1. In the figure.
Ｒｏは動電＆１，２間の起電力源の内部抵抗％ＥＰＨは
該起電力源の電圧である。ＥＯを求めるべき電圧とする
と、
ここで発生器９の周波数が十分低くｊＷＣＩ（剣１Ｌ＋
ｋ＋ ）（ｌとすると、上式は、
となる。この式における第１ ′ｆＡ（Ｅｐｉ ）は直
流分電位であるから、フィルタ７を通じて＠流分信号測
定回路４に選択的に入力され、イオン濃度として測定さ
れる。一方、ｇｊ６２項（ＥＸ、ν”’Ｔ；ＴＸａ）は
交流分電位であるからフィルタ１２を通じて抵抗測定回
路１１に選択的に入力され、内部抵抗Ｒａとじて測定さ
れる。Ro is the internal resistance of the electromotive force source between electrodynamic &1 and 2. EPH is the voltage of the electromotive force source. If EO is the voltage to be determined, then the frequency of generator 9 is sufficiently low and jWCI (sword 1L +
k+ ) (l), the above equation becomes: Since the first 'fA (Epi) in this equation is a DC component potential, it is selectively input to the current component signal measurement circuit 4 through the filter 7, and the ion On the other hand, since the gj62 term (EX, ν'''T; TXa) is an AC potential, it is selectively input to the resistance measuring circuit 11 through the filter 12 and measured as the internal resistance Ra.
か（して、この内部抵抗の１１１１定を一日に１回。(Then, check this internal resistance at a constant value of 1111 once a day.)
２回というように定期的に行なうこと（より内部抵抗の
抵抗値の変化を、監視し、沖ｌ定不良等を生じるであろ
う場合のおおよその見当が可能となる。By doing this periodically, such as twice, it is possible to monitor changes in the resistance value of the internal resistance, and to roughly predict when a malfunction, etc., may occur.
同、図示例ではイオン濃度を測定するための回路４と、
内部抵抗を測定するための回路１１とを別個に設けてい
るが、電源手段８の交流は低周波であるから、一台のペ
ン式レコーダーに直流分電位の上に交流分電位が重畳し
た状態（第３図参照、尚、図中、Ａは通常の測定時、Ｂ
は内部抵抗点検中（内部抵抗率）、Ｃは内部抵抗点検中
（内部抵抗大）を夫々示す。）で描かせ、その記録値か
ら内部抵抗ＲＧの変化を監視することもできる。In the illustrated example, a circuit 4 for measuring ion concentration,
Although a circuit 11 for measuring the internal resistance is provided separately, since the alternating current of the power supply means 8 is a low frequency, one pen-type recorder is in a state where the alternating current potential is superimposed on the direct current potential. (See Figure 3. In the figure, A is for normal measurement, B is for normal measurement,
indicates that the internal resistance is being inspected (internal resistivity), and C indicates that the internal resistance is being inspected (internal resistance is large). ), and the change in internal resistance RG can be monitored from the recorded value.
本発明に糸るイオン濃度計は上述の如く構成したため、
次のような効果がある。Since the ion concentration meter according to the present invention is constructed as described above,
It has the following effects.
■不規則的、突発的な測定不良も、内部抵抗の変化を監
視することによって予期することができ、そのため、電
極洗浄作業や計器の校正作業を効果的に行なうことがで
きる。殊に、標準液による校正に加えて本発明による内
部抵抗の測定を点検項目に追加することによりイオン濃
度計の保守点検がより計画的にできる。■Irregular and sudden measurement failures can be predicted by monitoring changes in internal resistance, which allows for effective electrode cleaning and instrument calibration. In particular, by adding the internal resistance measurement according to the present invention to the inspection items in addition to the calibration using the standard solution, maintenance and inspection of the ion concentration meter can be carried out more systematically.
■内部抵抗の測定を交流電流を流すことによって行なっ
ているため、イオン濃度信号である直流分信号と干渉す
ることがなく、そのためイオン濃度の測定時に同時に内
部抵抗を測定することができ、頗る便利である〇
■電源手段から電極に流す変流電流として低周波の電流
を用いているので、電極と電極間電位を測定する回路系
との間のシールド線やローパスフィルタ等によって５１
Ｒ分電位がカットされることがなく、そのため信号蓋が
比較的大きいので別途に、アンプ等が不要となり、簡易
な構成で内部抵抗の測定が行なえる。■Since the internal resistance is measured by passing an alternating current, there is no interference with the direct current component signal, which is the ion concentration signal. Therefore, the internal resistance can be measured at the same time as the ion concentration measurement, which is extremely convenient. Since a low-frequency current is used as the variable current flowing from the power supply means to the electrodes, it is possible to reduce the
Since the R potential is not cut off and the signal lid is relatively large, there is no need for a separate amplifier or the like, and internal resistance can be measured with a simple configuration.
図は本発明の一実施例を示し、第１図は全体回路図、第
２図は第１図におけるスイッチＳｉをオフ、Ｓ２をオン
した場合の等価回路図、第３図は本発明の他の一実施例
であり、直流分電位に交流分電位を重畳した状態をペン
式記録計に描かせた図である０
１・・・イオン電極、 ２・・・比較ｉｔ徊、 ３・・
・試料。
８・・・電源手段。
第１図
自発手続補正書
昭和５７年１２月２２日
特許庁長官 殿
１、事件の表示
昭和５６年 特 許 願第１８１５８３号手２１発明の
名称 イオン濃度計
３、補正をする者
事件との関係 特許出願人
４、代理人
８、補正の内容
本願明細書中、一部を下記の通り訂正攻します。
記
（１） 第９貞３行目と４行目との間に次の文章を挿
入します。 １
「■ イオン電極が、ガラス電極あるいは薄膜のように
こわれやすい材料もしくは構造のものである場曾、内部
抵抗が極度に低下する現象をとらえることによって前記
イオン電極の破壊を早期発見でき、従って本発明によれ
ば、イオン電極め破壊に気付くのが遅れ、折角の長期デ
ーを失なってしまうといった事態を未然に防止きる。」
（２）第９ｊｉｊ４行目の「■」を「■」に、第９頁９
行目の「■」を「■」に夫々訂正します。The figures show an embodiment of the present invention, in which Figure 1 is an overall circuit diagram, Figure 2 is an equivalent circuit diagram when the switch Si in Figure 1 is turned off and switch S2 is turned on, and Figure 3 is an example of an embodiment of the present invention. This is an example of 1. Ion electrode, 2. Comparison, 3.
·sample. 8...Power source means. Figure 1 Voluntary procedure amendment December 22, 1980 Commissioner of the Japan Patent Office 1, Indication of the case 1981 Patent Application No. 181583 Hand 21 Title of the invention Ion concentration meter 3, Person making the amendment Relationship with the case Patent Applicant 4, Agent 8, Contents of Amendment: Part of the specification of the present application will be corrected as follows. Note (1) Insert the following sentence between the 3rd and 4th lines of the 9th Tei. 1 "■ If the ion electrode is made of a fragile material or structure, such as a glass electrode or a thin film, destruction of the ion electrode can be detected early by detecting the phenomenon of extremely low internal resistance. According to the invention, it is possible to prevent a situation in which damage to the ion electrode is not noticed too late and valuable long-term data is lost.'' (2) Change the ``■'' in the 4th line of the 9th jij to ``■''. Page 9 9
Correct the "■" in each line to "■".
Claims (1)
電位を測定する回路系からなるイオン濃度計において、
低周波の交流電流を前記両電極間に流す電源手段を設け
て１両電極間の起電力源によって発生する直流分電位に
前記交流電流に起因した交流会電位を重畳させると共に
、この交流会電位から両電＆間における起電力源の内部
抵抗を測定するよう構成したことを特徴とするイオン濃
度計。In an ion concentration meter consisting of an ion electrode and a reference electrode immersed in a sample, and a circuit system that measures the potential between the two electrodes,
A power supply means for flowing a low-frequency alternating current between the two electrodes is provided to superimpose the alternating current potential caused by the alternating current on the direct current component potential generated by the electromotive force source between the two electrodes, and to reduce the alternating current potential. An ion concentration meter characterized in that it is configured to measure the internal resistance of an electromotive force source between both electric currents and between.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56181583A JPS5892854A (en) | 1981-11-11 | 1981-11-11 | Ion concentration analyser |
| KR8203828A KR850001435B1 (en) | 1981-11-11 | 1982-08-25 | Detector of ion density |
| DE19823239572 DE3239572A1 (en) | 1981-11-11 | 1982-10-26 | Apparatus for measuring ion concentrations |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56181583A JPS5892854A (en) | 1981-11-11 | 1981-11-11 | Ion concentration analyser |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5892854A true JPS5892854A (en) | 1983-06-02 |
| JPS6316706B2 JPS6316706B2 (en) | 1988-04-11 |
Family
ID=16103339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56181583A Granted JPS5892854A (en) | 1981-11-11 | 1981-11-11 | Ion concentration analyser |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS5892854A (en) |
| KR (1) | KR850001435B1 (en) |
| DE (1) | DE3239572A1 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60205345A (en) * | 1984-03-30 | 1985-10-16 | Yokogawa Hokushin Electric Corp | Ph meter with self-diagnosing function |
| JPH01219425A (en) * | 1988-02-29 | 1989-09-01 | Matsushita Electric Ind Co Ltd | Microwave oven with piezoelectric element sensor |
| JPH09508205A (en) * | 1994-01-21 | 1997-08-19 | チバ コーニング ダイアグノスティクス コーポレイション | Electrical connection device for electrochemical sensor |
| JP2005331454A (en) * | 2004-05-21 | 2005-12-02 | Tanita Corp | Oxidation reduction electrometer |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2226412B (en) * | 1988-12-21 | 1993-04-28 | Forex Neptune Sa | Monitoring drilling mud compositions using flowing liquid junction electrodes |
| EP0497994B1 (en) * | 1991-01-28 | 1995-04-12 | KNICK ELEKTRONISCHE MESSGERÄTE GMBH & CO. | Method and circuit for monitoring an ion- or redox-potential measuring electrode system |
| US5469070A (en) * | 1992-10-16 | 1995-11-21 | Rosemount Analytical Inc. | Circuit for measuring source resistance of a sensor |
| DE19743979A1 (en) * | 1997-10-06 | 1999-04-08 | Conducta Endress & Hauser | Operation of electrochemical sensor, especially an amperometric gas sensor |
| GB9815248D0 (en) * | 1998-07-15 | 1998-09-09 | Johnson Matthey Plc | Apparatus |
| WO2003052387A2 (en) | 2001-12-14 | 2003-06-26 | Rosemount Analytical Inc. | A pH SENSOR WITH INTERNAL SOLUTION GROUND |
| DE102005048273A1 (en) * | 2005-10-08 | 2007-04-19 | Knick Elektronische Messgeräte GmbH & Co. KG | Measuring device for electrochemical measured variables in liquids, in particular pH or redox potential measuring device, and method for measuring such electrochemical measured variables |
| EP1936367A1 (en) * | 2006-12-22 | 2008-06-25 | Mettler-Toledo AG | Method and device for monitoring and/or determining the status of a measuring probe |
| GB2566463A (en) * | 2017-09-13 | 2019-03-20 | Univ Southampton | pH Sensor and Calibration method |
| CN114614781A (en) * | 2020-12-04 | 2022-06-10 | 梅特勒-托利多仪器（上海）有限公司 | PH signal conditioning circuit |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4189367A (en) * | 1978-10-19 | 1980-02-19 | Leeds & Northrup Company | Method for testing ion selective electrodes in continuous measuring systems |
-
1981
- 1981-11-11 JP JP56181583A patent/JPS5892854A/en active Granted
-
1982
- 1982-08-25 KR KR8203828A patent/KR850001435B1/en active
- 1982-10-26 DE DE19823239572 patent/DE3239572A1/en not_active Ceased
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4189367A (en) * | 1978-10-19 | 1980-02-19 | Leeds & Northrup Company | Method for testing ion selective electrodes in continuous measuring systems |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60205345A (en) * | 1984-03-30 | 1985-10-16 | Yokogawa Hokushin Electric Corp | Ph meter with self-diagnosing function |
| JPH01219425A (en) * | 1988-02-29 | 1989-09-01 | Matsushita Electric Ind Co Ltd | Microwave oven with piezoelectric element sensor |
| JPH09508205A (en) * | 1994-01-21 | 1997-08-19 | チバ コーニング ダイアグノスティクス コーポレイション | Electrical connection device for electrochemical sensor |
| JP2005331454A (en) * | 2004-05-21 | 2005-12-02 | Tanita Corp | Oxidation reduction electrometer |
| JP4530203B2 (en) * | 2004-05-21 | 2010-08-25 | 株式会社タニタ | Redox potentiometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6316706B2 (en) | 1988-04-11 |
| KR840001336A (en) | 1984-04-30 |
| KR850001435B1 (en) | 1985-10-02 |
| DE3239572A1 (en) | 1983-05-26 |
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