JPS5875002A - Method for measuring insulation length of insulating molded goods - Google Patents
Method for measuring insulation length of insulating molded goodsInfo
- Publication number
- JPS5875002A JPS5875002A JP17417381A JP17417381A JPS5875002A JP S5875002 A JPS5875002 A JP S5875002A JP 17417381 A JP17417381 A JP 17417381A JP 17417381 A JP17417381 A JP 17417381A JP S5875002 A JPS5875002 A JP S5875002A
- Authority
- JP
- Japan
- Prior art keywords
- electrodes
- scale
- conductive layer
- insulating molded
- molded goods
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、中空部内壁の途中に導電層を有する絶縁成
型品の絶縁距離を測定する方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for measuring the insulation distance of an insulating molded product having a conductive layer in the middle of the inner wall of a hollow part.
電カケープルの接続部や終端部等には第１図に示すよう
な絶縁成型品１が使用されることがある。An insulating molded product 1 as shown in FIG. 1 is sometimes used for connection parts, termination parts, etc. of electric cables.
すなわち、電気絶縁性のゴムやプラスチックから成る本
体１の中空部２の内壁の途中に所定の範囲にわたって半
導電層３を設けたものである。That is, a semiconducting layer 3 is provided over a predetermined range midway along the inner wall of a hollow portion 2 of a main body 1 made of electrically insulating rubber or plastic.
これらの絶縁成型品は、絶縁層＠１，１．，１２．１３
及びｔ４を測定して半導電層３が所定の位置にあるか検
査する必要がある。These insulating molded products have an insulating layer @1, 1. ,12.13
It is necessary to measure and t4 to check whether the semiconducting layer 3 is in a predetermined position.
従来からこのような絶縁距離の測定にあたってはノギス
が多用されているが、例えばｔ ２．２４部のように、
光が通らず境界を目視することが難しい部分については
経験的な感にたよらざるを得ない。しかしそのような方
法では目視の間違いや、作業能率の点で問題があり、何
らかの科学的な方法が求められていた。Conventionally, calipers have often been used to measure such insulation distances, but for example, as in t 2.24 parts,
For areas where light does not pass through and it is difficult to see the boundaries visually, we have no choice but to rely on our experience. However, such methods have problems in terms of visual errors and work efficiency, so some kind of scientific method was needed.
この発明は斯かる事情に鑑み、境界を目視で確認しなく
とも容易に測定することのできる方法を提供すべくなさ
れたもの、で、スケールにメグ、テスター、ブザー等の
検知器に接続された一対の電極を設け、この電極部を中
空部内壁にそって移動させて導電層（または絶縁層）の
境界を探知し、スケールで絶縁距離を直読することを特
徴としている。In view of the above circumstances, this invention was made to provide a method that can easily measure boundaries without visually checking them. It is characterized by providing a pair of electrodes, moving this electrode part along the inner wall of the hollow part to detect the boundary of the conductive layer (or insulating layer), and directly reading the insulation distance on a scale.
これを第２図以下を参照して説明すれば、第２図に於い
て４．が、先端部に一対の電極５１．５２を設けたスケ
ールで、電極５１．５２はリード線６を介して検知器、
例えばテスター７に接続されている。This will be explained with reference to FIG. 2 and below. is a scale equipped with a pair of electrodes 51.52 at the tip, and the electrodes 51.52 are connected to the detector via the lead wire 6.
For example, it is connected to the tester 7.
この場合、電極５１．５２の配置は、第６図（ａ）に示
すような平行、同図（ｂ）のようなたて型側れであって
もよい。In this case, the electrodes 51 and 52 may be arranged in parallel as shown in FIG. 6(a), or vertically oriented on the sides as shown in FIG. 6(b).
このような測定装置による測定は、絶縁成型品の中空部
２内にスケール４の先端部を挿入し、電極５１．５２部
を内壁に当接させる。このとき、テスター７の指針が振
れ＼ば、電極５１．５２は導電層６を介して導通してい
るので、電極部が導電層３部に位置していることが判る
。For measurement using such a measuring device, the tip of the scale 4 is inserted into the hollow part 2 of the insulating molded product, and the electrodes 51 and 52 are brought into contact with the inner wall. At this time, if the pointer of the tester 7 swings, it can be seen that the electrodes 51 and 52 are electrically connected through the conductive layer 6, so that the electrode portion is located on the conductive layer 3 portion.
その後電極５１．５２を内壁に当接した１＼スケール４
を徐々に後退させ、電極５１．５２部が導電層３部を通
過すれば、電極５１．５２間の専心が解かれるため、テ
スター７の指針が戻る。After that, the electrodes 51 and 52 were brought into contact with the inner wall 1\Scale 4
When the electrodes 51 and 52 pass through the conductive layer 3, the electrodes 51 and 52 are no longer focused, and the pointer of the tester 7 returns to its original position.
これにより導電層乙の境界が知れるので、このとき成型
品の端縁との関係でスケール４を読めば、そのま＼絶縁
距離ｔを知ることができる。This allows the boundary of the conductive layer B to be known, so by reading the scale 4 in relation to the edge of the molded product, the insulation distance t can be determined directly.
この例は、導通状態から絶縁状態への変位による場合で
あるが、逆の場合であっても同様に測定することができ
る。勿論スケール４を出し入れして数回スケールを直読
して平均値を求めるようにしても差支えない。In this example, the displacement from the conducting state to the insulating state is taken, but the measurement can be performed in the same way even in the opposite case. Of course, it is also possible to put the scale 4 in and take it out and directly read the scale several times to find the average value.
第４図は内部の導電層３の他に外部にも導電層３１を有
する成型品の絶縁距離ｔ１を測定する場合の例を示して
いる。FIG. 4 shows an example of measuring the insulation distance t1 of a molded product having an external conductive layer 31 in addition to the internal conductive layer 3.
この場合スケール４はノギスのようなスライド式のもの
が用いられ、電極の一方５１は本体４１の先端部に、他
方５２はバーニヤのようなスライダー４２に夫々設けら
れている。しかして絶縁距離ｔ０の測定にあたっては、
測定部の反対側に導電体、例えば銅棒８を挿入し、内外
の導電層６と６１を導通させておく。In this case, the scale 4 is of a sliding type such as a caliper, and one electrode 51 is provided at the tip of the main body 41, and the other electrode 52 is provided on a slider 42 such as a vernier. However, when measuring the insulation distance t0,
A conductor, for example, a copper rod 8, is inserted on the opposite side of the measurement part, and the inner and outer conductive layers 6 and 61 are electrically connected.
斯かる状態において、スケール４を挿入し、電極５１．
５２間をひろげて行くが、ひろげた状態からせばめて行
くかして、テスター７の状態を監視して導電層６及び６
１の境界を探知し、スケール４を直読して絶縁距離ｔ、
を測定する。In this state, the scale 4 is inserted and the electrodes 51.
The tester 7 monitors the state of the conductive layers 6 and 6.
1 and directly read the scale 4 to find the insulation distance t,
Measure.
この例における銅棒８を用いない場合、電極５１゜５２
を夫々導電層６，３１に接触させれば、内外導電層がシ
ョート状態にあるか否かをチェックすることもできる。If the copper rod 8 in this example is not used, the electrodes 51°52
By contacting the conductive layers 6 and 31, respectively, it is possible to check whether or not the inner and outer conductive layers are short-circuited.
勿論この例のようなスケールであれば、スケールの構造
を工夫することによって、内側の導電層乙の長さを測定
することもできる。Of course, with a scale like this example, the length of the inner conductive layer B can also be measured by devising the structure of the scale.
以上の説明から明らかなように、この発明は、導電層を
利用してその境界を電気的に探知して、スケール値を直
読する方法であるから、目視の間違いや感違いを生ずる
ことなく、確実かつ容易に測定することができる等の利
点がある。As is clear from the above description, this invention uses a conductive layer to electrically detect the boundary and directly read the scale value, so there is no visual error or misunderstanding. It has advantages such as being able to measure reliably and easily.
第１図（ａ）、 （ｂ）、−（Ｃ）及び（ｄ）は絶縁成
型品の例を示す縦断面図、第２図はこの発明に係る測定
法の一例を示す説明図、第３図（ａ）、 （ｂ）はスケ
ールの例を示す説明図、第４図は測定法の他の例を示す
説明図である。
１：絶縁成型品本体、６及び３１：導電層、４ニスケー
ル、５１及び５２二電極、
７ニテスター、８：銅棒、
１、１ 、、１２．１３及びｔ４：絶縁距離。1(a), (b), -(C) and (d) are longitudinal sectional views showing examples of insulating molded products; FIG. 2 is an explanatory view showing an example of the measurement method according to the present invention; Figures (a) and (b) are explanatory views showing examples of scales, and Fig. 4 is an explanatory view showing other examples of measurement methods. 1: Insulating molded product body, 6 and 31: Conductive layer, 4 two scales, 51 and 52 two electrodes, 7 Ni tester, 8: Copper rod, 1, 1, 12.13 and t4: Insulation distance.
Claims (1)
、この電極部を絶縁成型体の中空部内壁にそって移動さ
せて導電層（または絶縁層）の境界を探知し、スケール
の値を直読することを特徴とする絶縁成型体の絶縁距離
を測定する方法。1. A pair of electrodes connected to a detector is installed on the scale, and this electrode section is moved along the inner wall of the hollow part of the insulating molded body to detect the boundary of the conductive layer (or insulating layer) and calculate the value on the scale. A method for measuring the insulation distance of an insulating molded body, characterized by direct reading.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17417381A JPS5875002A (en) | 1981-10-30 | 1981-10-30 | Method for measuring insulation length of insulating molded goods |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17417381A JPS5875002A (en) | 1981-10-30 | 1981-10-30 | Method for measuring insulation length of insulating molded goods |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5875002A true JPS5875002A (en) | 1983-05-06 |
Family
ID=15973975
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17417381A Pending JPS5875002A (en) | 1981-10-30 | 1981-10-30 | Method for measuring insulation length of insulating molded goods |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5875002A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100349121B1 (en) * | 1999-10-19 | 2002-08-17 | 삼성전기주식회사 | A method of measuring the insulating distance between layers in a printed circuit board for rambus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5527981A (en) * | 1978-08-21 | 1980-02-28 | Inoue Japax Res Inc | Length or position detecting and measuring device |
-
1981
- 1981-10-30 JP JP17417381A patent/JPS5875002A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5527981A (en) * | 1978-08-21 | 1980-02-28 | Inoue Japax Res Inc | Length or position detecting and measuring device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100349121B1 (en) * | 1999-10-19 | 2002-08-17 | 삼성전기주식회사 | A method of measuring the insulating distance between layers in a printed circuit board for rambus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3588689A (en) | Variable impedance system for electrical cable fault locating and temperature monitoring | |
| JPS5920642Y2 (en) | touch signal probe | |
| US3812424A (en) | Capacitive wire gauge | |
| DE3708389A1 (en) | DEVICE FOR MEASURING STEAM LEAKAGE | |
| JP3170022B2 (en) | Dimension measuring device | |
| ES8704019A1 (en) | Method for detecting and obtaining information about changes in variables. | |
| US4308498A (en) | Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components | |
| JPS5875002A (en) | Method for measuring insulation length of insulating molded goods | |
| US3407352A (en) | Method of and apparatus for monitoring the thickness of a non-conductive coating on a conductive base | |
| KR940015522A (en) | Material surface resistivity measurement method and measuring probe for use therein | |
| US2742707A (en) | Electrical device for measuring angles | |
| JPS59119276A (en) | Insulation resistance measuring device | |
| JP2692780B2 (en) | Concrete filling detection system | |
| JPH0750138B2 (en) | Defect inspection method for transparent conductive circuit board | |
| JPS5824724Y2 (en) | feeler gauge | |
| SU1295310A1 (en) | Device for measuring electric conduction of electrolyte solutions | |
| KR100218499B1 (en) | Probing measurement method and pad | |
| JPH11132988A (en) | Probe of gauge for measuring crack | |
| JPS6331009Y2 (en) | ||
| JP4413373B2 (en) | Probe unit for four-terminal measurement | |
| SU943608A1 (en) | Device for electric contact quality evaluation | |
| SU1691785A1 (en) | Device for determination of short circuit position | |
| SU723382A1 (en) | Liquid film thickness sensor | |
| JPH0524061Y2 (en) | ||
| SU447603A1 (en) | Device for determining binder in impregnated material |