JPS582731A - Moisture sensitive element - Google Patents

Moisture sensitive element

Info

Publication number
JPS582731A
JPS582731A JP56102713A JP10271381A JPS582731A JP S582731 A JPS582731 A JP S582731A JP 56102713 A JP56102713 A JP 56102713A JP 10271381 A JP10271381 A JP 10271381A JP S582731 A JPS582731 A JP S582731A
Authority
JP
Japan
Prior art keywords
moisture
moisture sensitive
sensitive member
semiconductor substrate
diffusion layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56102713A
Other languages
Japanese (ja)
Inventor
Shintaro Inagaki
慎太郎 稲垣
Youzou Kouno
河野 容三
Setsuo Kotado
古田土 節夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP56102713A priority Critical patent/JPS582731A/en
Publication of JPS582731A publication Critical patent/JPS582731A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403Cells and electrode assemblies
    • G01N27/414Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS

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  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
  • Non-Adjustable Resistors (AREA)

Abstract

PURPOSE:To use even a moisture sensitive member having the high impedance without any trouble, by forming a gate electrode of MOSFET with a water permeable substance and providing a moisture sensitive member between the electode and an insulating film. CONSTITUTION:A source dispersing layer 1 and a drain dispersing layer 2 are formed on a semiconductor substrate 3. An insulating film 4 such as SiO2 is provided on the surface of the substrate 3 and a moisture sensitive member 5 such as Al2O3 and a water permeable gate electrode 6 are layered in turn on this film. As this moisture sensitive element is an active element to detect the moisture according to the change of electric current or voltage, it is connectable with a display device without using a measuring circuit completely or with using a simple measuring circuit. As the moisture sensitive member having the high impedance is also used without any trouble, the restiction concerning the selection of materials is eased remarkably.

Description

【発明の詳細な説明】 この発明は、大気中または(大気と異なる)ガス中ea
t変化を、電atた電圧変化として取参出すための小形
の感・慢嵩子に閤する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for detecting ea in the atmosphere or in a gas (different from the atmosphere).
The t change is inserted into a small sensor to extract it as a voltage change.

■度欄定の方法は、無数KTo)枚挙にいとtが1kI
Aが、現在使用されている小形の11度針のはとんどけ
、11変によってそのインピーダンスが変化する感温材
料を備えた線量素子と、そOインピーダンスの変化を測
定し表示するための一気一路よ)威る。これは、これら
電気信号を用いる感−素子は構造が簡単で、可動部分が
なく、小形化に有利なためである。しかし、多くの感湿
材料は、S低酸化AJ雪へ中各種セランクスに代表され
るように高インピーダンスであ〕、こOため、感湿素子
のインピーダンスは抵抗値で数十Mmから数十MO。
■The method of determining the degree column is countless KTo), and t is 1kI.
A is a dose element equipped with a temperature-sensitive material whose impedance changes according to the small 11-degree needle currently in use, and a device for measuring and displaying changes in impedance. It's all the way). This is because sensing elements that use these electrical signals have a simple structure, have no moving parts, and are advantageous for miniaturization. However, many moisture-sensitive materials have high impedance, as typified by low oxidation AJ snow, and various types of selanx. .

容量値で数+PFから数+mFQ度と大変高−0このえ
め、そOインピーダンスを精度良く検出するためKは、
高入力インピーダンスの電圧針もしくは、それに見合う
た複me電気園路を必要とするし、高いインピーダンス
に由来する電気線管O影響t−tぬがれない。また感温
素子Oインピーダンスをなるぺ〈低くするために感湿材
料をなるべく大きくして、静電容量を測る感激素子にお
いてはその電極面積を大きくする。電気抵抗を測る感猥
素十KkPいては電Ii形状を櫛形にするなどO工夫を
畳する。このため、この種の感激素子O小形化は、低イ
ンピーダンス化の要請と矛盾し、数alfたは数■のナ
イスが限界である。電気回路を含め九11度針全体の大
きさを考えた場合も、I鎗な電気a路のため、や祉)小
形化に限界がある。
The capacitance value ranges from several + PF to several + mFQ, which is very high.In order to accurately detect the impedance, K is
It requires a voltage needle with a high input impedance or a corresponding multiple electric field, and the electrical conduit O effect due to the high impedance cannot be removed. Furthermore, in order to reduce the impedance of the temperature sensitive element as much as possible, the moisture sensitive material is made as large as possible, and the electrode area of the sensitive element that measures capacitance is made large. The sensitizer used to measure electrical resistance is 10 KkP, and the shape of the electrode Ii is made into a comb shape. For this reason, this type of miniaturization of the sensing element O conflicts with the demand for lower impedance, and is limited to a few alf or a few square meters. Considering the overall size of the 911 degree hand including the electric circuit, there is a limit to miniaturization due to the large electrical path.

本発明の目的は、高インピーダンスの感温部材でも支障
なく使用できて、且■度変化に応じた感温部材Oインピ
ーダンス変化を直接電圧中電流の変化として出力する小
形で能動的な線量素子を提供する事にある0 本発明は1通常OM08FITのゲート電極を遣水性の
膜とし、それ−とI!Ill属の間に1周mow度によ
ってそのインピーダンスが変化する感温部材を挿入した
構造である。感温部材としては、陽極酸化ムloom膜
中8aO*スパック属などが用いられる。
The object of the present invention is to provide a small active dose element that can be used without any problems even with high impedance temperature sensing members, and that directly outputs changes in impedance of the temperature sensing member O in response to temperature changes as changes in voltage and current. The purpose of the present invention is to provide (1) a gate electrode of a normal OM08FIT with a water-repellent film, and an I! It has a structure in which a temperature-sensitive member whose impedance changes depending on the mow degree of one rotation is inserted between the elements. As the temperature-sensitive member, 8aO*Spac group in an anodic oxidized room film or the like is used.

ゲート電極に適当な電圧を印加し、半導体基板中にチャ
ンネルが形成された状態で感■部材Oイyピーダンスが
、温度に応じて変化すると、チャンネルを流れる電流側
そのインピーダンス変化に応じて変化し、外部に出力さ
れる。
When an appropriate voltage is applied to the gate electrode and the impedance of the sensing member changes depending on the temperature with a channel formed in the semiconductor substrate, the current flowing through the channel changes in accordance with the change in impedance. , is output to the outside.

つffK11面によシ本発明につ−で具体的に説明する
The present invention will be specifically explained on page 11.

本発明で用いる半導体基板は、all、ymを問わ1に
いが、ここでは便宜上 、m基板を用いた場合について
説明する。第1図は本素子O断画園である。図中1はソ
ース拡散層、2はト°レイン拡歓層で、ともに半導体基
1[3中に設けられた戸履拡散層である。絶縁膜4と感
湿部材5を介してゲージ電II6が半導体基板上に設け
られている。
The semiconductor substrate used in the present invention can be either all or ym, but for convenience, the case where an m substrate is used will be described here. Figure 1 shows this element O-dangaen. In the figure, 1 is a source diffusion layer, and 2 is a train expansion layer, both of which are door diffusion layers provided in the semiconductor substrate 1. A gauge electrode II 6 is provided on the semiconductor substrate with an insulating film 4 and a moisture sensing member 5 interposed therebetween.

本尭明O動作原理社次の過シである1本素子のソース拡
散層とドレイン拡散層OMのチャンネルに流れる電#l
IDは次の式で褒わされる。
The current flow in the channel of the source diffusion layer and drain diffusion layer OM of one element is as follows:
ID is rewarded with the following formula:

I動翼(−〇s)・C−U えだし ここで C:感aS材と絶縁go合成審量 W:ゲート幅 L:ゲート長 一一チヤンネル内のホールの有効鳥勤度vd=ドレイン
電圧 vI:ゲート電圧 、  Vt :ゲートOしきい値電圧 11[K応じて感温材の容量が変化する場合は。
I rotor blade (-〇s)・C-U Erased here C: Sensitive aS material and insulation go composite judgment W: Gate width L: Gate length 1. Effective frequency of hole in channel vd = drain voltage vI: Gate voltage, Vt: Gate O threshold voltage 11[K] When the capacitance of the temperature sensitive material changes depending on the voltage.

C#i次式で表される。C#i is expressed by the following equation.

C= (Ci  ’ + Ch  ”)−’ここで Ci : J!l縁膜の容量 Ch: 感湿部材の容量 こ0*に、感温部材の容量1の変化は S*素子中を流
れる電流InKJIllK現れる。
C= (Ci ' + Ch '') - 'where Ci: J!L capacitance Ch: capacitance of moisture-sensitive member 0*, change in capacitance 1 of temperature-sensitive member is S* current flowing through the element InKJIllK appears.

まえ、感温部材の抵抗Bが、変化する場金燻。First, the resistance B of the temperature-sensitive member changes.

ch −oとなり絶縁層の抵抗をRiとして、 V、F
が次O様に表される v 、 −Ri  v 、# 8+81 ζζで vl:絶縁膜上の電位 Vy’:ゲート電極の電位 こ0INK、中はり−の変化がI勝に現れる。
ch -o and the resistance of the insulating layer is Ri, V, F
v, -Riv, #8+81ζζ, which is expressed as O, where vl: potential on the insulating film Vy': potential of the gate electrode.

次に1本発明の実施例の等価回路とその特性を−2と図
3にそれぞれ示す。この実施例では、感温部材として陽
極酸化Ahへ、ゲート電極として。
Next, an equivalent circuit of an embodiment of the present invention and its characteristics are shown in FIG. 2 and FIG. 3, respectively. In this example, anodized Ah is used as the temperature sensitive member and as the gate electrode.

透水性OAj、絶縁層として8 i 0n、半導体Is
板として鵡履81を用いて艷る。感湿部材の大きさ#1
24pyBX@Osmと非常に小さく、そのインピーダ
ンス4徹pvと非常に大きいが1本発明O動作原履に愈
んら支障はない。図2のように1本素子と外部の3鵞に
Ωの#I抵抗を直列にした≠インバータの回路を作)、
ソース拡散層とドレイン拡散層0間の電位差’i d 
a t e通常のぺ/レコーダに直接入力してIllか
甘え特性を図3に示す。vlとして一定の電圧を印加し
た状態で、S度を(lR,H,(薯対置度)から551
1R,H,まで変化させた時に、前記vd畠は、約4ゼ
ルト変化している。このように本素子は、外部に特別の
1m定回路を必要とせず、直接表示器に接続できる特徴
を有している。
Water permeability OAj, 8 i On as insulating layer, semiconductor Is
It is worn using sandals 81 as a board. Moisture sensitive member size #1
Although it is very small at 24pyBX@Osm and its impedance is very large at 4 pv, it does not impede the operation principle of the present invention in any way. As shown in Figure 2, create an inverter circuit by connecting one element and three external resistors with #I resistors of Ω in series),
Potential difference 'i d between source diffusion layer and drain diffusion layer 0
Figure 3 shows the Ill/Amae characteristics obtained by directly inputting data into a normal PE/recorder. With a constant voltage applied as vl, the S degree is changed from (lR, H, (opposite degree) to 551
When changing to 1R,H, the vd Hatake changes by about 4 zelts. In this way, this element has the feature that it can be directly connected to a display without requiring a special 1 m constant circuit externally.

以上1図面に従って本発明の原理と実施例について説明
を行った。本発明による感温素子は、電流または電圧の
変化によってi1度の検出を行う能動素子であるから、
全く測定回路を用いずに、 tたは簡素な測定回路を用
いて衰示装置に接続できる。さらに本発明の感温素子は
、高インピーダンスの感湿部材でも支障なく用いる事か
でlるので。
The principle and embodiments of the present invention have been explained above with reference to one drawing. Since the temperature sensing element according to the present invention is an active element that detects i1 degrees by changes in current or voltage,
It is possible to connect to the attenuation device without any measuring circuitry or with a simple measuring circuit. Furthermore, the temperature sensing element of the present invention can be used without any problem even with high impedance moisture sensing members.

感湿部材を数十jfflサイズまたはそれ以下Kまで小
形化できる。このように本発明を用−れば、感涙素子の
小形化のみならず、ff1度針全体2の小形化にも非常
に有効である。さらに本発明による感湿素子は、半導体
基板ヒに形成されるので、同一半導体基板上に1通常の
MO8IC技術にょ9電気回路を組み込む事も可能であ
〕、検出部と信今処理部を一体化した集積化センナと成
す8mできる。
The moisture sensitive member can be downsized to several tens of JFFL size or even smaller. As described above, the present invention is very effective in reducing not only the size of the lachrymal sensitive element but also the entire 1 degree ff needle 2. Furthermore, since the moisture sensing element according to the present invention is formed on a semiconductor substrate, it is also possible to incorporate nine electric circuits using ordinary MO8IC technology on the same semiconductor substrate. It can be made up of 8m with integrated senna.

電気的雑音の点から見ると1本発11による感温素子は
一種の能動素子であるから、高入カインビー/yスO測
定回路を使用しないので、雑音島策が容品である。
From the point of view of electrical noise, the temperature-sensing element based on the single-sensor 11 is a kind of active element, so it does not use a high-input Cainbee/ysO measurement circuit, so it is a good noise-reduction measure.

材料の点から見ると1本感湿素子は高インピーダンスの
感湿性材料を支障なく使用できるので。
From a material standpoint, a single moisture-sensitive element can use high-impedance moisture-sensitive materials without any problems.

材料選択上の制約が大幅に緩和される。Restrictions on material selection are significantly relaxed.

素子構造の点から見ると1本発明では電流の流れる半導
体基板とAI、α膜のような感温部材の間に、 8i0
*のような絶縁膜が挿入されているので。
From the point of view of the device structure, in the present invention, there is an 8i0
An insulating film like * is inserted.

次のような諸効果がもたらされる。1)II極酸化Al
oom膜のように内部に大量のイオンを含む感湿材料を
用いても、半導体基板中にイオン性の汚染が侵入する事
がなく1品質の長期安定性と感湿材料O選択上の制約緩
和が得られる。2)@極酸化AJ*Oa膜のように製造
工寝で、導体や半導体とO界面が剥離したシ、界面にバ
リア膜が発生し感度低下を生じる特性を有する感湿材料
を支障なく用いる事ができ、付着強度や感度0JiLI
A素子構造である。3)絶縁膜の耐圧が高いので、高駆
動電圧で使    、9用でき、チャンネル中を流れる
電流値を大きくできるし、ゲートのしきい値電圧の高低
に係わらず最適の動作電圧を設定しゲート電極に印加で
きもさらに、雰囲気透過性Oゲート電極が感温部材を履
っているため9周■の雰囲気O■変変動がすみ中かに感
湿部材に伝達されるため、応答速度が非常に速い。また
、!IIIIl気逓遥性11に履われた感一部材が、水
分に対するトラ、プを形威し、水分吸着が棗好なため、
高感度の素子が得られる。このように本発明による感温
素子は数多くの判点を備えている。
The following effects are brought about. 1) II polar oxidation Al
Even if a moisture-sensitive material containing a large amount of ions is used, such as an oom membrane, ionic contamination will not enter the semiconductor substrate, resulting in long-term stability of the quality and alleviation of constraints on the selection of moisture-sensitive materials. is obtained. 2) It is possible to use moisture-sensitive materials without problems, such as the extremely oxidized AJ*Oa film, which has the property of peeling off at the conductor/semiconductor-O interface during manufacturing, and forming a barrier film at the interface, resulting in a decrease in sensitivity. is possible, adhesion strength and sensitivity are 0JiLI
It has an A-element structure. 3) Since the insulating film has a high breakdown voltage, it can be used at high driving voltages, and the current flowing through the channel can be increased, and the optimal operating voltage can be set regardless of the gate threshold voltage. In addition, since the atmosphere-permeable O gate electrode is equipped with a temperature-sensitive member, changes in the atmosphere during nine cycles are transmitted to the humidity-sensitive member in the blink of an eye, so the response speed is extremely high. fast. Also,! The sensitive material worn on the III1 air flow property 11 has a strong resistance to moisture, and has good moisture absorption.
A highly sensitive element can be obtained. As described above, the temperature sensing element according to the present invention has many advantages.

本発明は実施例に@定されず、いくつかの賓形が考えら
れる。例えば、ゲート電極として雰−気を透過する愈な
いし孔を膜状た構造を採用することができる。感温部材
の代〕に特定のガスでそのインピーダンスが変化する感
ガス部材を用いれば感ガス素子が実現できるなどである
The present invention is not limited to specific embodiments, and several forms are possible. For example, it is possible to adopt a structure in which the gate electrode has a film-like hole or hole that transmits the atmosphere. If a gas-sensitive member whose impedance changes with a specific gas is used instead of the temperature-sensitive member, a gas-sensitive element can be realized.

【図面の簡単な説明】[Brief explanation of the drawing]

第1@は本発明による感温素子の断面図。 館2図社夷箇例の特性を測定するため0m路。 第3図は実施例の特性を示す図である。 図中の1はソース拡散層、2#iドレイン拡散層。 3は半導体基板、4は絶縁膜、5は感温部材、6はゲー
11.7は感温素子である。 特許出願人  安立電気株式会社 代理人 弁理士  小 池 龍太部
The first @ is a cross-sectional view of a temperature-sensitive element according to the present invention. 0m road to measure the characteristics of the building. FIG. 3 is a diagram showing the characteristics of the embodiment. In the figure, 1 is a source diffusion layer, and 2#i is a drain diffusion layer. 3 is a semiconductor substrate, 4 is an insulating film, 5 is a temperature sensing member, 6 is a gate 11, and 7 is a temperature sensing element. Patent Applicant Anritsu Electric Co., Ltd. Agent Patent Attorney Ryotabe Koike

Claims (2)

【特許請求の範囲】[Claims] (1)  ソース拡散層(1)とドレイン拡散層(2)
とを備えた半導体基板(6)と;鍍半導体基板上に設け
られた絶縁膜(着と;雰−気の一度に応じてそのインピ
ーダンスが変化する轡性な有し、該絶縁属上に設けられ
た感湿部材(6)と;鋏感湿部#が周囲の雰■気に接触
するごとき#−気透過性をもたせ、かつ該感温部材を覆
って付着されて訃)。 鍍ツース拡散層と該ドレイン拡散層の間の該半導体基板
中に前記感温部材のインビーダyxK対応し九電流の通
るチャンネルを形成するためのダート電極(2)とを備
えた感湿素子。
(1) Source diffusion layer (1) and drain diffusion layer (2)
a semiconductor substrate (6) comprising: an insulating film (6) provided on the coated semiconductor substrate; The moisture sensing member (6) is made air permeable so that the humidity sensing portion of the scissors comes into contact with the surrounding atmosphere, and is attached to cover the temperature sensing member. A moisture sensing element comprising a dirt electrode (2) for forming a channel through which a current passes, corresponding to the invider yxK of the temperature sensing member, in the semiconductor substrate between the tooth diffusion layer and the drain diffusion layer.
(2)  前記感mus材として、陽極酸化ム4αを用
いた事t4I徽とする特許請求の範11111項記載O
感■素子。
(2) Claim 11111 states that anodized 4α is used as the mus-sensitive material.
Feeling ■ Motoko.
JP56102713A 1981-06-30 1981-06-30 Moisture sensitive element Pending JPS582731A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56102713A JPS582731A (en) 1981-06-30 1981-06-30 Moisture sensitive element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56102713A JPS582731A (en) 1981-06-30 1981-06-30 Moisture sensitive element

Publications (1)

Publication Number Publication Date
JPS582731A true JPS582731A (en) 1983-01-08

Family

ID=14334901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56102713A Pending JPS582731A (en) 1981-06-30 1981-06-30 Moisture sensitive element

Country Status (1)

Country Link
JP (1) JPS582731A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6085358A (en) * 1983-08-19 1985-05-14 イ−エムアイ・リミテツド Moisture sensitive element and manufacture thereof
US8016002B2 (en) 2005-11-29 2011-09-13 Bridgestone Corporation Sealing/pump-up device
CN108982592A (en) * 2018-07-18 2018-12-11 南京航空航天大学 A kind of preparation method of hypersensitivity plant ash base humidity sensor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53132981A (en) * 1977-04-25 1978-11-20 Massachusetts Inst Technology Charge flow transistor and machine using same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53132981A (en) * 1977-04-25 1978-11-20 Massachusetts Inst Technology Charge flow transistor and machine using same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6085358A (en) * 1983-08-19 1985-05-14 イ−エムアイ・リミテツド Moisture sensitive element and manufacture thereof
JPH0240973B2 (en) * 1983-08-19 1990-09-14 Soon Ii Emu Ai Plc
US8016002B2 (en) 2005-11-29 2011-09-13 Bridgestone Corporation Sealing/pump-up device
CN108982592A (en) * 2018-07-18 2018-12-11 南京航空航天大学 A kind of preparation method of hypersensitivity plant ash base humidity sensor
CN108982592B (en) * 2018-07-18 2020-12-01 南京航空航天大学 Preparation method of high-sensitivity plant ash-based humidity sensor

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