JPS58190706A - Inclination angle detector - Google Patents

Inclination angle detector

Info

Publication number
JPS58190706A
JPS58190706A JP7154382A JP7154382A JPS58190706A JP S58190706 A JPS58190706 A JP S58190706A JP 7154382 A JP7154382 A JP 7154382A JP 7154382 A JP7154382 A JP 7154382A JP S58190706 A JPS58190706 A JP S58190706A
Authority
JP
Japan
Prior art keywords
sight
line
center
point
reference point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7154382A
Other languages
Japanese (ja)
Other versions
JPS6360322B2 (en
Inventor
Shiro Atsumi
渥美　士郎
Norimasa Hirogaki
広垣　節正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP7154382A priority Critical patent/JPS58190706A/en
Publication of JPS58190706A publication Critical patent/JPS58190706A/en
Publication of JPS6360322B2 publication Critical patent/JPS6360322B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Collating Specific Patterns (AREA)
  • Image Input (AREA)

Abstract

PURPOSE:To enhance the precision of angle of inclination of a shadow pattern by providing an inclination detector, wherein the sight reference point is not fixed but is moved after discrimination of direction in which the same is to be moved so as to make sure of the detection of the sight line. CONSTITUTION:The coordinates (a, b) of the center point C of a shadow pattern 1 is detected by a center detector 2, while a gravity center detector 3 detects the coordinates (v, w) of the gravity center G of the pattern 1. A sight reference point setting device 4 sets the gravity center as the sight reference point. The sight reference point is then moved towards the center at a predetermined pitch. On the other hand, a sight line detector 5 radiates radial lines passing through the thus set sight reference point at an angular interval of DELTAtheta and detects the number N of duplicated dots on these radial lines. The detector 5 then detects an angle theta which minimizes the value of the number N. This operation is repeated and, when the shifting of the sight reference point is finished, an inclination angle determination section 6 determines the inclination angle from the value of the angle theta.

Description

【発明の詳細な説明】 （技術分野） 本発明は印鑑照合機に関するものであり、特に印影パタ
ーンの傾斜角検出精度を向上させた、傾斜角検出装置の
改良に関するものである。DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to a seal stamp collation machine, and more particularly to an improvement of an inclination angle detection device that improves the accuracy of detecting the inclination angle of a seal imprint pattern.

（背景技術） 一般に、印鑑照合機は、被検印影を読取部にて読み取っ
た被照合印影パターンの中心座標および傾斜角度をそれ
ぞれ位置検出、部および傾斜角検出部にて検出し、一方
登録印影パターンの中心座標および傾斜角度をそれぞれ
位置検出部および傾斜角検出部にて検出し、その検出結
果に応じて両印影パターンの中心点と傾斜角度とが互い
に一致するように被照合印影パターンを位置整合部にて
位置整合した後、印影比較部にて両印影パターンの比較
を行ない、その結果により一致判定部にて両印影パター
ンの一致または不一致の判定をし、また位置検出の微小
な誤差や、傾斜角検出の微小な誤差を補償する為に、一
致判定部の出力を位置整合部にフィード・バックして、
位置および傾斜角を微調する操作を数回くり返した後に
被照合印影の真偽を判定する装置である。(Background Art) In general, a seal verification machine detects the center coordinates and inclination angle of a stamp pattern to be verified read by a reading unit using a position detection unit, a position detection unit, and an inclination angle detection unit. The center coordinates and inclination angle of the pattern are detected by a position detection section and an inclination angle detection section, respectively, and according to the detection results, the seal imprint pattern to be verified is positioned so that the center point and inclination angle of both seal imprint patterns coincide with each other. After position matching is performed in the alignment section, both stamp patterns are compared in the stamp comparison section, and based on the results, the match judgment section determines whether the two stamp patterns match or do not match, and also detects minute errors in position detection. , In order to compensate for minute errors in tilt angle detection, the output of the coincidence determination section is fed back to the position matching section,
This is a device that determines the authenticity of the seal imprint to be verified after repeating the operation of finely adjusting the position and angle of inclination several times.

従って、「位置整合の微調」と「印影比較」とをくり返
す回数を低減するためには、傾斜角検出の誤差や位置検
量の誤差が非常に微小であることが要求される。Therefore, in order to reduce the number of repetitions of "fine adjustment of position alignment" and "imprint comparison", it is required that errors in tilt angle detection and errors in position calibration be extremely small.

ところで傾斜角検出の場合、印鑑には必らず外枠がある
ことに着目し、外枠の外形特徴から傾斜角を検出できれ
ば、それに越したことはないのだが、印鑑形状は一般に
小判型、丸型および角型の三種類があり、小判型と角型
とは外形特徴から傾斜角を検出することができるが、丸
型の場合には外形特徴から傾斜角を検出することは不可
能である。そこで外枠内部の内部特徴を利用することに
なるが、全印影パターンから外枠パターンのみを取り除
いたいわゆる内部パターンの全域にわたって逐一２次元
的な探査を行なったり、文字を認識したりしていたので
は、処理が複雑である。そこで、この点を解決するため
の従来例として、本出願人が既に出願した特願昭５６−
２０５１１４号がある。この従来例は印影パターンには
一般に、文字と文字との間や、文字列と文字列との間に
間隙があるという特徴に着目した傾斜角検出法を開示し
ており、印影パターンの文字と文字との間や、文字列と
文字列との間にある間隙（以後、見通し線と略称する）
を検出し、見通し線の傾斜角をもって印影パターンの傾
斜角とする方法であり、パターンの内部特徴まで参照す
る割には、抽出特徴が単純なものであるため、処理も比
較的簡略である上、大半の印影パターンに適用可能であ
るから印影パターンの傾斜角検出には好適な方法である
。By the way, in the case of tilt angle detection, it would be better if we could focus on the fact that a seal always has an outer frame and detect the tilt angle from the outer shape characteristics of the outer frame, but the shape of the seal is generally oval, There are three types: round and square. For the oval and square shapes, the angle of inclination can be detected from the external features, but in the case of the round type, it is impossible to detect the angle of inclination from the external features. be. Therefore, the internal features inside the outer frame are used, and characters are recognized by performing two-dimensional exploration point by point over the entire area of the so-called inner pattern, which is obtained by removing only the outer frame pattern from the entire seal imprint pattern. The process is complicated. Therefore, as a conventional example to solve this point, the applicant has already filed a patent application filed in 1982-
There is No. 205114. This conventional example discloses an inclination angle detection method that focuses on the characteristic that stamp patterns generally have gaps between characters or between character strings. The gap between characters or between character strings (hereinafter abbreviated as line of sight)
This method uses the inclination angle of the line of sight as the inclination angle of the stamp pattern.The extracted features are simple, even though they refer to the internal features of the pattern, so the processing is relatively simple. This method is suitable for detecting the inclination angle of a stamp pattern because it can be applied to most stamp patterns.

ところが従来例は、第１図のフローチャートから明らか
な如（、見通し線を探査する際の基準点（以後、見通し
基準点と略称する）を印影パターンの中心点のみに限定
しているため、第２図（Ａ）、第２図ＣＢ）の如（、見
通し線ｌが中心点を通る一般の印影パターンには好適で
あるが、第２図（Ｃ）および第２図（ＤＪの如（見通し
線が中心点を通らない印影パターンの場合でも印影パタ
ーンの中心点を見通し基準点として見通し線を探査する
ため、一応見通し線と覚しき線を検出することは出来る
が、完全な見通し線を検出していないため、傾斜角の検
出精度が低下するという欠点があった。However, in the conventional example, as is clear from the flowchart in Fig. 1, the reference point (hereinafter referred to as the line-of-sight reference point) for searching the line of sight is limited to only the center point of the stamp pattern. It is suitable for general impression patterns such as those shown in Figure 2 (A) and Figure 2 CB), where the line of sight l passes through the center point, but it is suitable for general impression patterns such as those shown in Figure 2 (C) and Figure 2 (DJ). Even in the case of an imprint pattern where the line does not pass through the center point, the line of sight is searched using the center point of the imprint pattern as the line-of-sight reference point, so it is possible to detect lines that appear to be line-of-sight, but it is not possible to detect a complete line-of-sight. This has the disadvantage that the accuracy of detecting the inclination angle decreases.

（発明の課題） 本発明の目的はこれらの欠点を解決するため、見通し基
準点を中心点に限定せず、見通し基準点を移動すべき方
向を検出し、かつ該方向に移動させて確実に見通し線を
検出しうろようにしたものであり、以下詳細に説明する
。(Problems to be solved by the invention) In order to solve these drawbacks, the purpose of the present invention is to detect the direction in which the line-of-sight reference point should be moved, without limiting the line-of-sight reference point to the center point, and to move the line-of-sight reference point in that direction reliably. This method detects the line of sight and will be explained in detail below.

（発明の構成および作用） 第３図は本発明の第１の実施例であって、印影パターン
１の中心点座標Ｃ（ａ、ｂ）を中心点検出部２にて検出
し、重心点座標ａ（Ｖ、Ｗ）を重心点検出部３にて検出
し、見通し基準点設定部４は先ず、重心点を見通し基準
点に設定し、その後中心点へ向う方向に見通し基準点を
指定距離だけ移動させてゆき、見通し線検出部５は、設
定された見通し基準点を通る放射線を角度Δθ刻みに放
射し、該放射線上に存在する重複黒点数Ｎを検出し、重
複黒点数Ｎを最小にするθの値を検出するという従来例
と同様な見通し線検出を、見通し基準点を指定距離だけ
移動するまで繰り返し、傾斜角決定部６において見通し
基準点の移動が完了した時点で、それまでに得られた重
複黒点数Ｎのうちで、最小値を呈した場合のθから傾斜
角を決定するものである。(Structure and operation of the invention) FIG. 3 shows a first embodiment of the present invention, in which the center point coordinates C (a, b) of the stamp pattern 1 are detected by the center point detection section 2, and the center point coordinates C (a, b) of the stamp pattern 1 are detected. a(V, W) is detected by the center of gravity detection unit 3, and the line-of-sight reference point setting unit 4 first sets the center of gravity as the line-of-sight reference point, and then sets the line-of-sight reference point by a specified distance in the direction toward the center point. While moving, the line-of-sight detection unit 5 emits a ray passing through the set line-of-sight reference point at angles of Δθ, detects the number N of overlapping sunspots existing on the ray, and minimizes the number N of overlapping sunspots. Line-of-sight detection similar to the conventional example in which the value of θ is detected is repeated until the line-of-sight reference point has been moved by a specified distance. The inclination angle is determined from θ which exhibits the minimum value among the obtained number N of overlapping sunspots.

中心点検出部２は、印影パターン外枠内部をＸ・）′両
軸方向に塗りつぶしを施し、該塗りつぶし後パターンの
重心を中心点とする方法でよい。すなわち、第４図を用
いて説明すると、印影パターンが存在することを許容す
る領域内の各着目点１’　（Ｘ、　、　ＹＪ）にこでｉ
＝　１−ｍ、　ｊ＝　ｔ−ｎ　：ｌ］を、周囲の印影パ
ターン状況に応じて少なくとも３糟類に分類する。該３
種類とは、（１）〔条件１」を満足し、かつ〔条件２〕
を満足する着目点、例えば第４図の点Ｑ’ｌ、（２）〔
条件１〕あるいは〔条件２〕のいずれかを満足する着目
点、例えば第４図の点Ｔ、（３ば条件１〕を満足せず、
かつ〔条件２〕をも満足しない着目点、例えば第４図の
点Ｕの３種類である。The center point detection unit 2 may fill in the inside of the outer frame of the stamp pattern in both the X and )' axis directions, and use the center point as the center of gravity of the pattern after filling. That is, to explain using FIG.
= 1-m, j=t-n :l] are classified into at least three types according to the surrounding seal imprint pattern situation. Part 3
Type means (1) satisfying [Condition 1] and [Condition 2]
A point of interest that satisfies, for example, point Q'l in Figure 4, (2) [
A point of interest that satisfies either Condition 1] or [Condition 2], for example, point T in Figure 4, (3, which does not satisfy Condition 1),
There are three types of points of interest that also do not satisfy [Condition 2], for example, point U in FIG.

〔条件１〕とは、 「Ｘ座標が着目点と等しいＹＪであり、Ｘ座標がＸ１以
下の値を有する印影パターンの黒点が存在し、かつＸ座
標が着目点と等しいＹ、であり、Ｘ座標がＸ１以上の値
を有する印影パターンの黒点が存在する」 〔条件２〕とは、 「Ｘ座標が着目点と等しいＸｉであり、Ｘ座標がＹｊ以
下の値を有する印影パターンの黒点が存在し、かつＸ座
標が着目点と等しいＸｌであり、Ｘ座標がＸ５以下の値
を有する印影パターンの黒点が存在する」 であり、前記種類（１）に該当する点の値ＩＰ（ｘ、　
、　Ｙｊｌを２とし、種類（２）に該当する点の値ＩＰ
（Ｘ、　、　Ｙｊ）１を１とし、種類（３）に該当する
点の値ＩＰ（Ｘｌ、Ｙい１をＯとして、重心点を算出す
ると、その点が中心点Ｃ（ａ、ｂ）に他ならない。なお
中心点算出の式は！至（ＩＰ（Ｘ、、Ｙ、］） ｉ＝＋　ｊ−１ である。[Condition 1] is ``YJ where the X coordinate is equal to the point of interest, there is a black point of the stamp pattern whose X coordinate has a value of X1 or less, and Y where the X coordinate is equal to the point of interest; ``There exists a black point of the seal imprint pattern whose coordinates are equal to or greater than X1.'' [Condition 2] means, ``There exists a black point of the seal impression pattern whose X coordinate is Xi equal to the point of interest and whose X coordinate is less than or equal to Yj. , and the X coordinate is Xl, which is equal to the point of interest, and there is a black point of the seal imprint pattern whose X coordinate has a value of X5 or less.'', and the value IP(x,
, Yjl is 2, and the value IP of the point corresponding to type (2)
(X, , Yj) 1 is 1, and the value of the point corresponding to type (3) IP (Xl, Y) is 1, and when the center of gravity is calculated, the point becomes the center point C (a, b). This is none other than the formula for calculating the center point: !to(IP(X,,Y,]) i=+j-1.

重心点検出部３は、印影パターンが存在することを許容
する領域内の各着目点Ｐ（Ｘ、、Ｙｊ）につき、着目点
Ｐ（Ｘ、、ＹＪ）が黒点（論理「１」の点）のとき該着
目点の値ＩＰ（Ｘ、、Ｙｊｌを１とし、着目点Ｐ（Ｘｌ
、Ｙｊ）が白点（論理「０」の点）のとき、該着目点の
値ＩＰ（Ｘ＋、Ｙ；）ｌをＯとしにて重心点Ｑ（ｖ、ｗ
）を求める。For each point of interest P(X,, Yj) in the area where the seal imprint pattern is allowed to exist, the center of gravity detection unit 3 detects that the point of interest P(X,, YJ) is a black point (point of logic "1"). When the value IP(X, , Yjl of the point of interest is 1, the point of interest P(Xl
, Yj) is a white point (logical "0" point), the value IP(X+, Y;)l of the point of interest is set to O, and the center of gravity Q(v, w
).

こうして得られた中心点Ｃ（ａ、Ｊおよび重心点ａ（Ｖ
、Ｗ＞には以下に述べるような性質がある。すなわち中
心点Ｃ（α、ｈ）は外枠内部を塗りつぶしたパターンを
用いるため、内部パターンとは一般に無関係であり、印
影外枠形状から決定されろ真の中心点を検出している。The center point C(a, J and the center of gravity a(V
, W> have the following properties. That is, since the center point C(α, h) uses a pattern in which the inside of the outer frame is filled, it is generally unrelated to the inner pattern, and the true center point is detected based on the shape of the seal impression outer frame.

それに対し重心点αυ、ｗ）は外枠だけではなく、内部
パターンをも含めて重心点を求めているのであるから、
内部パターンすなわち内部文字の画数などの複雑さが均
等でな℃・場合には、印影外枠形状から決定されろ真の
中心点よりも複雑な文字の方に片寄った位置に重心点が
検出される。On the other hand, the center of gravity αυ, w) is calculated not only for the outer frame but also for the internal pattern.
If the complexity of the internal pattern, such as the number of strokes of the internal characters, is not uniform, the center of gravity may be detected at a position that is closer to the complex character than the true center point, which is determined from the shape of the outer seal frame. Ru.

所で、第２図（Ｃ）および第２図（Ｄ）の如（、見通し
線が中心点を通らない印影パターンにおいては、見通し
線が中心点よりも簡略な文字の方に片寄っており、これ
らの相対関係を概略的な図で示すと、第５図のようにな
る。すなわち、第５図において中心点Ｃ（α、ｂ）は、
見通し線ｌよりも下方にあり、重心点ａ＜、Ｖ、Ｗ＞は
、文字「山」よりも複雑な文字「梨」の方に片寄るため
、中心点Ｃ（α、ｂ）よりも更に下方にある。よって見
通し基準点を、最初にＧ（υ、＋７１）に設定した後、
ＧとＣとを結ぶ線上をＣの方向に向って移動してゆけば
、望ましい見通し基準膚Ｓに到達することができろわけ
である。By the way, in the imprint patterns in which the line of sight does not pass through the center point, as shown in Figures 2(C) and 2(D), the line of sight is biased toward the simpler characters than the center point, A schematic diagram of these relative relationships is shown in Fig. 5. That is, in Fig. 5, the center point C (α, b) is
It is below the line of sight l, and the center of gravity a<, V, W> is biased towards the character ``pear'', which is more complex than the character ``yama'', so it is further below the center point C(α, b). It is in. Therefore, after first setting the line-of-sight reference point at G (υ, +71),
By moving in the direction of C on the line connecting G and C, the desired visual reference skin S can be reached.

なお、見通し基準点を移動させる指定距離は、メツシー
の分解能を８ｄｏｔ／ｚＨとして行なった実験結果によ
れば、２点Ｇ−Ｃ間距離をメソシュ数に換算した値をｄ
とすると、２ｄメソシ一分あるいは（ｄ＋５）メッシュ
分のいずれか大きい方の値を採れば十分であることが確
認されたが、種々の条件に応じて実験的に定めろことが
できる。In addition, the specified distance to move the line-of-sight reference point is the value obtained by converting the distance between two points GC to the mesh number, according to the experimental results conducted with the mesh resolution of 8 dots/zH.
It has been confirmed that it is sufficient to take the larger value of one 2d mesh or (d+5) meshes, but it can be determined experimentally depending on various conditions.

以上説明したように、第１の実施例では見通し基準点を
重心点から中心点の方向へ移動させつつ、見通し線を検
出してゆくから、見通し線が中心点を通る一般の印影の
場合は勿論のこと、見通し線が中心点を通らない印影の
場合でも迅速に見通し線を検出しうろため、印影パター
ンの傾斜角を正確に検出することができる。As explained above, in the first embodiment, the line of sight is detected while moving the line of sight reference point from the center of gravity to the center point, so in the case of a general seal impression where the line of sight passes through the center point, Of course, even in the case of a seal imprint where the line of sight does not pass through the center point, the line of sight can be quickly detected, so the inclination angle of the seal imprint pattern can be detected accurately.

第１の実施例は中心点検出部として、印影パターン外枠
内部を塗りつぶした塗りつぶしパターンの重心点を中心
点とする方法を説明したが、第６図に示す如く、印影外
枠に外接する正方形あるいは長方形の中心点Ｃ（ａ、／
＋）〔ここでσ−（Ｘｓ　＋ＸＥ）／２゜Ａ＝（Ｙｓ十
Ｙ］ｉ、）／２　）　　を検出する公知の方法を用いて
も、一般的には同様な効果が生ずる。例外として、印影
外枠に著しいカスレがあるような不良印影パターンの場
合には傾斜角の検出精度が低下する場合がある。In the first embodiment, a method was explained in which, as the center point detection unit, the center point is the center point of a filled pattern that fills in the inside of the seal imprint outer frame.As shown in FIG. Or the center point C of the rectangle (a, /
+) [Here, σ-(Xs +XE)/2°A=(Ys+Y]i,)/2) Even if a known method for detecting σ-(Xs+XE)/2°A=(Ys+Y]i,)/2 is used, the same effect generally occurs. As an exception, in the case of a defective seal imprint pattern in which there is significant fading on the outer frame of the imprint, the accuracy of detecting the inclination angle may decrease.

第１の実施例は、いかなる場合でも見通し基準点を必ら
ず移動させる方法につき説明した。ｊｆｌわち移動の指
定距離を２ｄメツシユあるいは（ｄ＋５）メツシーのい
ずれか大きい方とした場合は、最低でも５メツシユ（Ｇ
とＣとが同一点すなわちｄ＝００とき）分は移動する事
になる。しかし、例えば中心点Ｃと重心点Ｇとが一致す
るかあるいは両者の距離が極端に短かい（例えば１メツ
シ一分以下）場合に、わざわざ移動する必要はない。そ
れゆえ、両者の距離が所定閾値よりも小さい場合には移
動させないなどの区別をすることは差し支えない。In the first embodiment, a method has been described in which the line-of-sight reference point is always moved in any case. jfl, that is, if the specified distance for movement is 2d mesh or (d+5) mesh, whichever is greater, at least 5 mesh (G
When and C are at the same point, that is, d=00, the distance will be moved. However, if, for example, the center point C and the center of gravity point G coincide, or the distance between them is extremely short (for example, less than 1 minute), there is no need to take the trouble to move them. Therefore, if the distance between the two is smaller than a predetermined threshold value, there is no problem in making a distinction such as not moving the object.

（発明の効果） 本発明は見通し線を検出するための見通し基準点を中心
点に限定せず、見通し基準点を重心点から移動開始し、
中心点の方向へ移動させて確実に見通し線を検出するも
のであるから、見通し基準法をいかなる場合でも固定し
てしまう場合ややみくもに見通し基準点を移動させる場
合と異なり迅速かつ確実に見通し線を検出することがで
きるため、印影パターンの傾斜角検出に利用することが
できろ。印影パターンの内でも特に丸型印影にとっては
有効である。(Effects of the Invention) The present invention does not limit the line-of-sight reference point for detecting the line of sight to the center point, but starts moving the line-of-sight reference point from the center of gravity,
Since the line-of-sight is reliably detected by moving the line-of-sight in the direction of the center point, unlike the case where the line-of-sight reference method is fixed in any case or the line-of-sight reference point is blindly moved, the line-of-sight can be detected quickly and reliably. It can be used to detect the inclination angle of a seal imprint pattern. This is particularly effective for round seal impressions among seal impression patterns.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の傾斜角検出装置のフローチャート、第２
図（Ａ）〜（Ｄ）は印影パターン例と見通し線側、第３
図は本発明の一実施例のブロック図、第４図Ｇ工塗りつ
ぶしパターンによる中心点検出部の説明図、第５図は中
心点、重心点および見通し基準点の相対関係を例示する
概略図、第６図は本発明の他の実施例の説明図である。 ■・・・印影パターン、　　２・・・中心点検出部阻３
・・・重心点検出部、　４・・・見通し基準点設定部、
５・・・見通し線検出部、６・・・傾斜角決定部。 特許出願人　　沖電気工業株式会社Figure 1 is a flowchart of a conventional tilt angle detection device;
Figures (A) to (D) are examples of seal imprint patterns, line-of-sight side, and third
The figures are a block diagram of an embodiment of the present invention, Figure 4 is an explanatory diagram of the center point detection unit using a G-type fill pattern, and Figure 5 is a schematic diagram illustrating the relative relationship between the center point, the center of gravity, and the line-of-sight reference point. FIG. 6 is an explanatory diagram of another embodiment of the present invention. ■... Seal impression pattern, 2... Center point detection part blocker 3
... Center of gravity detection section, 4. Line-of-sight reference point setting section,
5... line of sight detection section, 6... inclination angle determination section. Patent applicant Oki Electric Industry Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 印影パターンの中心点を検出する中心点検出部と、印影
パターンの重心点を検出するｌ８点検出部と、見通し基
準点設定部と、見通し線検出部と、傾斜角決定部とを有
し、前記見通し基準点設定部は、重心点を見通し基準点
とし、次いで見通し基準点を重心点から中心点へ向かう
方向へ、重心点と中心点との距離に応じて決定される所
定メッシュ分だけ移動させ、前記見通し線検出部は、前
記見通し基準点を通る放射線群のうちから印影パターン
と重なる点の数、すなわち重複黒点数を最小ならしめる
放射線を検出して、見通し線候補となし前記傾斜角決定
部は、見通し線候補のうちから、重複黒点数の最小値を
呈する見通し線と、該見通し線と対応する見通し基準点
とを検出し、該見通し線の傾斜角から印影パターンの傾
斜角を求めることを特徴とする傾斜角検出装置。It has a center point detection unit that detects the center point of the seal impression pattern, an 18 point detection unit that detects the center of gravity of the seal impression pattern, a line of sight reference point setting unit, a line of sight detection unit, and an inclination angle determination unit, The line-of-sight reference point setting unit sets the center of gravity as the line-of-sight reference point, and then moves the line-of-sight reference point in a direction from the center of gravity to the center point by a predetermined mesh determined according to the distance between the center of gravity and the center point. The line-of-sight detecting section detects, from among the group of rays passing through the line-of-sight reference point, a ray that minimizes the number of points overlapping the seal imprint pattern, that is, the number of overlapping sunspots, and selects the line-of-sight candidate as a line-of-sight candidate. The determining unit detects a line of sight exhibiting the minimum number of overlapping sunspots and a line of sight reference point corresponding to the line of sight from among the line of sight candidates, and calculates the inclination angle of the seal imprint pattern from the inclination angle of the line of sight. An inclination angle detection device characterized by:
JP7154382A 1982-04-30 1982-04-30 Inclination angle detector Granted JPS58190706A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7154382A JPS58190706A (en) 1982-04-30 1982-04-30 Inclination angle detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7154382A JPS58190706A (en) 1982-04-30 1982-04-30 Inclination angle detector

Publications (2)

Publication Number Publication Date
JPS58190706A true JPS58190706A (en) 1983-11-07
JPS6360322B2 JPS6360322B2 (en) 1988-11-24

Family

ID=13463755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7154382A Granted JPS58190706A (en) 1982-04-30 1982-04-30 Inclination angle detector

Country Status (1)

Country Link
JP (1) JPS58190706A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60165503A (en) * 1984-02-08 1985-08-28 Citizen Watch Co Ltd Image processing method
JPS6212805A (en) * 1985-07-10 1987-01-21 Fuji Electric Co Ltd Body attitude detecting device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0299576A (en) * 1988-10-05 1990-04-11 Hagiwara Kogyo Kk Mesh tack tape

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60165503A (en) * 1984-02-08 1985-08-28 Citizen Watch Co Ltd Image processing method
JPS6212805A (en) * 1985-07-10 1987-01-21 Fuji Electric Co Ltd Body attitude detecting device
JPH0375044B2 (en) * 1985-07-10 1991-11-28

Also Published As

Publication number Publication date
JPS6360322B2 (en) 1988-11-24

Similar Documents

Publication Publication Date Title
JP2531605B2 (en) Image registration device
US4301470A (en) Alignment apparatus
CN103837537B (en) A kind of without Grains metal inkjet forme dot area percentage measuring method
CN111402316B (en) Rapid detection method for ellipses in image based on anti-fake links
CN105261061B (en) A kind of method and device of identification redundant data
EP0382293A1 (en) Method of and apparatus for converting the resolution of an image represented by a pattern of bivalent pixels
JPS58190706A (en) Inclination angle detector
Frobin et al. Automatic Measurement of body surfaces using rasterstereograph
JPH0339603A (en) Contour detecting method for pattern and length measuring instrument using same method
JP3580088B2 (en) Appearance inspection method
JPH05198641A (en) Pattern inspecting apparatus
CN110689532B (en) Image comparison method and system
JP2002236925A (en) Image inspection device
JPS6149774A (en) Outside surface welding method of weld pipe
CN109719951A (en) 3D printing scanning system
JP2516844B2 (en) Parts detection method and device
JP5371015B2 (en) Cross mark detection apparatus and method, and program
JPH0122666B2 (en)
JPS6013512B2 (en) Seal verification device
JPS60246490A (en) Pattern recognizing system
JP2941322B2 (en) Drawing processing equipment
Zhang et al. A novel arc segmentation approach for document image processing
JPH09282453A (en) Position recognizing method
JPS622105A (en) Shape recognizing method
JP2611020B2 (en) Object recognition method