JPS58113839A - Detector for dew point - Google Patents
Detector for dew pointInfo
- Publication number
- JPS58113839A JPS58113839A JP21192581A JP21192581A JPS58113839A JP S58113839 A JPS58113839 A JP S58113839A JP 21192581 A JP21192581 A JP 21192581A JP 21192581 A JP21192581 A JP 21192581A JP S58113839 A JPS58113839 A JP S58113839A
- Authority
- JP
- Japan
- Prior art keywords
- light
- dew point
- dew condensation
- temperature
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
- G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、光学式の露点検出装置１４／に関する。一般
に、気体中で物体を冷却していって表面に露ができはじ
めるときの表向の温度を測定することによシ、気体の露
点を求めることができる。この露点を検知する装置とし
ては、光学式の露点検出装置が多く用いられている。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical dew point detection device 14/. Generally, the dew point of a gas can be determined by cooling an object in a gas and measuring the surface temperature when dew begins to form on the surface. As a device for detecting this dew point, an optical dew point detection device is often used.
光学式の露点検出装置には、被測定気体中にサーモモジ
ュールなどで電子冷却し温度調節さねている金属鏡など
の反射体を配電して、この反射体に光を投射し、被測定
気体の水分が反射体表面に結露しはじめて反射光量が低
下するときの反射体の温度を測定することにより、被測
定気体の露点を測定することが行われている。Optical dew point detection devices have a reflector such as a metal mirror that is electronically cooled and temperature-controlled using a thermo module placed in the gas to be measured, and light is projected onto this reflector to detect the gas being measured. The dew point of the gas to be measured is measured by measuring the temperature of the reflector when the amount of reflected light begins to condense on the surface of the reflector and the amount of reflected light decreases.
このように光学式露点検出装置では、結露による反射光
蓋の低下を検知しているが、光源の発生光量の低下や受
光器の受光感度の低下によっても、結露による反射光量
の低下と同様に受光器の受光出力が低下する。そこで、
結露による反射光量の低下分のみを検知するために、光
源、光反射体、受光器の光学系ｅ２ｆｆｉ配【ｄし、一
方の光反射体０みｔ温度調節可能とする以外は同じ動作
をするようにし、それらの両受光器の受光出力を比較し
て、結露がないときはバランスして出力が出ないように
し、結露が生じて反射光量の低下のときのみ出力が生じ
るように構成している。In this way, the optical dew point detection device detects a decrease in the amount of reflected light due to condensation, but the amount of reflected light may also decrease due to a decrease in the amount of light generated by the light source or the light receiving sensitivity of the receiver. The light receiving output of the light receiver decreases. Therefore,
In order to detect only the decrease in the amount of reflected light due to condensation, the optical system consisting of the light source, light reflector, and receiver is arranged in an e2ffi configuration, and the operation is the same except that the temperature of one light reflector is adjustable. Compare the received light outputs of both receivers, and configure the system so that no output is output in a balanced manner when there is no condensation, and output is output only when condensation occurs and the amount of reflected light decreases. There is.
しかし、結露のわずかなｉｔを検出しなければならない
ので、結露による反射光量の低下分は少なく、しかも光
源や受光器の温度特性、経時変化等による動作を２組の
光学系で全く同じにすることは至難である。そのため、
結露がなくても２組の光学系の動作のバランスがくずｆ
＋ 、差出力が発生する欠点がめった。However, since it is necessary to detect the slightest amount of condensation, the amount of reflected light decreases due to condensation is small, and the temperature characteristics of the light source and receiver, as well as the operation due to changes over time, etc., must be made exactly the same for the two sets of optical systems. That is extremely difficult. Therefore,
Even if there is no condensation, the operation of the two sets of optical systems will be unbalanced.
+, the disadvantage that differential output occurs is rare.
本発明は上記に鑑みなされたものであり、光反射体表面
による反射光の光軸からはずれた位置に光検出器を配置
し、結露によって生ずる散乱光のみを検知するようにし
たものである。本発明は、従来の光学式露点検出装置の
如く２組の光学系における蛍光量の変化ｔ（差分）倉と
らえるのでなく、結露によって生ずる散乱光の発生ｉｆ
とらえるため、光学系は１組でよく、光源の光量変動や
検出器の受光感度の経時変化にもあまり関係なく、露点
を明確に検知することができる。The present invention has been made in view of the above, and a photodetector is arranged at a position offset from the optical axis of the light reflected by the surface of the light reflector, so that only the scattered light caused by dew condensation is detected. The present invention does not detect the change (t) (difference) in the amount of fluorescence between two sets of optical systems as in the conventional optical dew point detection device, but instead detects the generation of scattered light caused by dew condensation.
In order to detect the dew point, only one set of optical systems is required, and the dew point can be clearly detected without being affected by changes in the light intensity of the light source or changes over time in the light receiving sensitivity of the detector.
以下、添付図により従来装置と対比して本発明の詳細な
説明する。Hereinafter, the present invention will be described in detail with reference to the accompanying drawings in comparison with a conventional device.
第１図は従来の光学式露点検出装置の一例を示す系統図
である。被測定気体を入れるケース１内に、金属鏡など
の光反射体４．５を配電し、一方の光反射体４のみサー
モモジュールなどの温度調節装［２で電子冷却し、測温
体３で光反射体４の表向の温度を測定する７発光ダイオ
ードやランプなどの光源６．７からの光をそれぞれ光反
射体４．５に投射し、各反射光をホトダイオードやホト
トランジスタなどの光検出器８．９でそれぞれ受光し、
各受光ｆｔ比較増幅器１０で比較増幅し出力する。被測
定気体をケース１内に導入した状態で光反射体４を徐々
に冷却すると、光反射体表面に結露が生じ反射光量が減
少し、光検出器８．９の受光量のバランスがくずれ、比
較増幅器１ｏに出力が生じる。そのときの光反射体４の
温度を測温体３で測定して露点としている。FIG. 1 is a system diagram showing an example of a conventional optical dew point detection device. A light reflector 4.5 such as a metal mirror is electrically distributed in the case 1 containing the gas to be measured, and only one of the light reflectors 4 is cooled electronically by a temperature control device such as a thermo module [2, and the temperature measuring element 3 is 7 Measuring the temperature of the surface of the light reflector 4 Light from a light source 6.7 such as a light emitting diode or a lamp is projected onto the light reflector 4.5, and each reflected light is detected by a photodiode or phototransistor. The light is received by the instruments 8 and 9, respectively.
Each light receiving ft comparison amplifier 10 compares and amplifies the received light and outputs it. When the light reflector 4 is gradually cooled while the gas to be measured is introduced into the case 1, dew condensation occurs on the surface of the light reflector, the amount of reflected light decreases, and the balance of the amount of light received by the photodetector 8.9 is lost. An output is produced in the comparator amplifier 1o. The temperature of the light reflector 4 at that time is measured by the temperature measuring element 3 and determined as the dew point.
第２図は本発明の光学式露点検出装置コの一例金示す系
統図でらる。被測定気体を入ねるケース２１内に配置し
た金）ＩＡ鏡などの光反射体２４の表面に、遮光カバー
２５を配した発光ダイオード、ラングなどの光源２６か
らの光を斜めに投射する。FIG. 2 is a system diagram showing an example of the optical dew point detection device of the present invention. Light from a light source 26 such as a light emitting diode or a rung with a light-shielding cover 25 arranged is projected obliquely onto the surface of a light reflector 24 such as a gold (IA) mirror placed in a case 21 containing a gas to be measured.
そして光反射体表面での反射光の光軸からけずれた位置
、すなわち、光反射体表面の垂直軸上にあり且つ反射光
が入射しない位置に、集束レンズ２７を配−し、又光反
射体表面での儂が集束レンズ２７によって投影される位
置にホトダイオード、ホトトランジスタなどの光検出器
２８を配置する。A focusing lens 27 is arranged at a position offset from the optical axis of the reflected light on the surface of the light reflector, that is, at a position that is on the vertical axis of the surface of the light reflector and where the reflected light does not enter. A photodetector 28 such as a photodiode or a phototransistor is placed at a position on the body surface where the image of me is projected by a focusing lens 27.
集束レンズ２７と光検出器２８には遮光カバーを設けて
もよい。ケース２１はその内壁面に無反射塗装を施し壁
面での反射が生じないようにすることが望ましい。A light-shielding cover may be provided on the focusing lens 27 and the photodetector 28. It is desirable that the inner wall surface of the case 21 be coated with a non-reflective coating to prevent reflection from occurring on the wall surface.
いま、被測定気体をケース２１内に導入した状態で、サ
ーモモジュールなどの温度調節装置ｆ２２によって光反
射体２４を徐々に電子冷却し、光反射体表面に結露が生
じると、光源２６からの光は結露によって散乱される。Now, with the gas to be measured introduced into the case 21, the light reflector 24 is gradually electronically cooled by a temperature control device f22 such as a thermo module, and when dew condensation occurs on the surface of the light reflector, light from the light source 26 is is scattered by condensation.
この散乱光を集束レンズ２７を通して光検出器２８で受
光し、増Ｉ＠器２０で増幅することにより、結露したこ
とを極めて明確に検知することができる。そのときの光
反射体の温度全測温体２３で測定することにより被測定
気体の露点が求められる。By receiving this scattered light by the photodetector 28 through the focusing lens 27 and amplifying it by the I/M intensifier 20, it is possible to detect condensation very clearly. By measuring the temperature of the light reflector at that time with the temperature measuring element 23, the dew point of the gas to be measured is determined.
上述したように、本発明は光反射体表面での散乱光の発
生量を検知する方式であるので、従来装置の如く２組の
光学系を配置して出力バランスをとる必要もなく、１組
の光学系で極めて明確に露点を検知することができ、そ
の効果は極めて大きい。As mentioned above, since the present invention is a method of detecting the amount of scattered light generated on the surface of a light reflector, there is no need to balance the output by arranging two sets of optical systems as in conventional devices. The dew point can be detected very clearly with this optical system, and the effect is extremely large.
第１図は従来の光学式露点検出装置の一例を示す系統図
、第２図は本発明の露点検出装置の一例を示す系統図で
おる。
図中の符号：
１．２１・・・ケース、８．９．２８・・・光検出器、
２．２２・・・温度調節装置、１０・・・比較増幅器、
３．２３・・・測温体、２０・・・増幅器、４．５．２
４・・・光反射体、２５・・・遮光カバー、６．７．２
６・・・光源、２７・・・集束レンズ
特許出願人：理化学研究所
東京光電子工業株式会社
第１図FIG. 1 is a system diagram showing an example of a conventional optical dew point detection device, and FIG. 2 is a system diagram showing an example of the dew point detection device of the present invention. Codes in the diagram: 1.21...Case, 8.9.28...Photodetector,
2.22... Temperature control device, 10... Comparison amplifier,
3.23...Thermometer, 20...Amplifier, 4.5.2
4... Light reflector, 25... Light shielding cover, 6.7.2
6... Light source, 27... Focusing lens Patent applicant: RIKEN Tokyo Optoelectronics Industry Co., Ltd. Figure 1
Claims (2)
包囲空間内に配置した光反射体、この光反射体に光を投
射する装置、及び前記の光反射体の温度降下による光反
射体表面の結露によって散乱された光を受けて′シ気信
号を発生する感知装置を備えたことを特徴とする露点検
出装−〇(1) A light reflector placed in an enclosed space containing the gas whose 3111 points are to be measured, a device for projecting light onto this light reflector, and dew condensation on the surface of the light reflector due to a drop in temperature of the light reflector. A dew point detection device characterized by comprising a sensing device that receives light scattered by a dew point and generates an air signal.
知装置が集束レンズと光検出器とを含み、前記の集束レ
ンズが前記の幌面体の像を前記の光検出器に投影するよ
うに配置されている特許請求の範囲第１項に記載の露点
検出装置。(2) the light reflector is a specular body, and the sensing device includes a focusing lens and a photodetector, the focusing lens projects an image of the hood onto the photodetector; The dew point detection device according to claim 1, which is arranged as follows.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21192581A JPS58113839A (en) | 1981-12-28 | 1981-12-28 | Detector for dew point |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21192581A JPS58113839A (en) | 1981-12-28 | 1981-12-28 | Detector for dew point |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58113839A true JPS58113839A (en) | 1983-07-06 |
Family
ID=16613936
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21192581A Pending JPS58113839A (en) | 1981-12-28 | 1981-12-28 | Detector for dew point |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58113839A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288142A (en) * | 1985-06-10 | 1986-12-18 | シエル・インタ−ナシヨネイル・リサ−チ・マ−チヤツピイ・ベ−・ウイ | Detector for condensable component in gas flow |
| JPS6310448U (en) * | 1986-07-07 | 1988-01-23 | ||
| JPS6314053U (en) * | 1986-07-07 | 1988-01-29 | ||
| US5052818A (en) * | 1987-06-11 | 1991-10-01 | Junichi Nishizawa | Method of and apparatus for measuring very low water content in gas |
| JPH09138205A (en) * | 1995-11-15 | 1997-05-27 | Agency Of Ind Science & Technol | Detection method for flaw of material by infrared thermography |
| GB2417565A (en) * | 2004-08-19 | 2006-03-01 | Michell Instr Ltd | Apparatus for measuring the dew point of a gas sample. |
| JP2007192715A (en) * | 2006-01-20 | 2007-08-02 | Yamatake Corp | Mirror surface cooling-type dew-point hygrometer |
| JP2012177553A (en) * | 2011-02-25 | 2012-09-13 | Hioki Ee Corp | Mirror surface cooling dew point recorder |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3112648A (en) * | 1961-12-11 | 1963-12-03 | George A Dulk | Peltier dew point hygrometer |
-
1981
- 1981-12-28 JP JP21192581A patent/JPS58113839A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3112648A (en) * | 1961-12-11 | 1963-12-03 | George A Dulk | Peltier dew point hygrometer |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61288142A (en) * | 1985-06-10 | 1986-12-18 | シエル・インタ−ナシヨネイル・リサ−チ・マ−チヤツピイ・ベ−・ウイ | Detector for condensable component in gas flow |
| JPS6310448U (en) * | 1986-07-07 | 1988-01-23 | ||
| JPS6314053U (en) * | 1986-07-07 | 1988-01-29 | ||
| JPH0517647Y2 (en) * | 1986-07-07 | 1993-05-12 | ||
| US5052818A (en) * | 1987-06-11 | 1991-10-01 | Junichi Nishizawa | Method of and apparatus for measuring very low water content in gas |
| JPH09138205A (en) * | 1995-11-15 | 1997-05-27 | Agency Of Ind Science & Technol | Detection method for flaw of material by infrared thermography |
| GB2417565A (en) * | 2004-08-19 | 2006-03-01 | Michell Instr Ltd | Apparatus for measuring the dew point of a gas sample. |
| GB2417565B (en) * | 2004-08-19 | 2007-01-03 | Michell Instr Ltd | Apparatus and method for measuring a condensable component of a gas sample |
| JP2007192715A (en) * | 2006-01-20 | 2007-08-02 | Yamatake Corp | Mirror surface cooling-type dew-point hygrometer |
| JP4504318B2 (en) * | 2006-01-20 | 2010-07-14 | 株式会社山武 | Mirror surface dew point meter |
| JP2012177553A (en) * | 2011-02-25 | 2012-09-13 | Hioki Ee Corp | Mirror surface cooling dew point recorder |
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