JPS58102173A - Leakage current measuring circuit for capacitor - Google Patents
Leakage current measuring circuit for capacitorInfo
- Publication number
- JPS58102173A JPS58102173A JP56201226A JP20122681A JPS58102173A JP S58102173 A JPS58102173 A JP S58102173A JP 56201226 A JP56201226 A JP 56201226A JP 20122681 A JP20122681 A JP 20122681A JP S58102173 A JPS58102173 A JP S58102173A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- probe
- leakage current
- circuit
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
【発明の詳細な説明】
（１） 発明の技術分野
本脅明は電解コンダンサ等の漏洩電流を一定する一路に
関する。DETAILED DESCRIPTION OF THE INVENTION (1) Technical Field of the Invention The present invention relates to a method for stabilizing leakage current in electrolytic capacitors and the like.
（２）技術の背景
電解コンダンサの骨性試験の一つに漏洩電流の調定試験
がある。１１１１１は従来の電層コンデンナの漏洩電流
調定方法の説明図、第２図はその固定−路図例を示す０
Ｊ１１＃ｊＡは電解コンダン？２の片側のリード３がリ
ードフレームｌに共通Ｋｌｌ続されている状態を示すも
ので、電解コンデンサ意はリード７嬉２図は第１ＩＩに
示す状態における電堺コンデンナの漏洩電流調定方法例
を示すもので、測定用電ＩＩＥが共通のり＝ド７レーム
ＩＫｍ！絖され、−：Ｉ／ｆ７ｔ２ｔ）４ｈｊ５０リー
ドＮＣプローブ７を轟てる。(2) Background of the technology One of the bone tests for electrolytic capacitors is a leakage current adjustment test. 11111 is an explanatory diagram of a conventional method for adjusting leakage current of an electrolytic layer capacitor, and Fig. 2 shows an example of its fixing-route diagram.0 J11#jA is an electrolytic capacitor? Figure 2 shows an example of how to adjust the leakage current of an electric Sakai capacitor in the state shown in II. As shown, the measurement voltage IIE is common glue = de 7 frame IKm! It is connected, -:I/f7t2t)4hj50 lead NC probe 7 is roared.
６は電流電圧変換回路であり、漏洩電流の大きさに比例
して出力電圧が襞化し、この電圧の大きさによりコンデ
ンサＯＩＩ洩電流に対する真否を判定する。Reference numeral 6 denotes a current-voltage conversion circuit, whose output voltage is folded in proportion to the magnitude of the leakage current, and the magnitude of this voltage is used to determine whether the leakage current of the capacitor OII is true or not.
なお被測定コンダンサには本ｓｗｊｕｇｍが接続される
曽に予め一定電圧が印加され充電されえ状−になってい
る。Note that the capacitor to be measured is charged by applying a constant voltage in advance to the terminal to which the SWJUG is connected.
（３） 従来技術と問題点
ところで菖２図に示す測定回路で漏洩電流を測定する場
合に、一定回路のプローブとＩ１１１１測定コンダンナ
ードは確１１に接続されている事が必要である。万一コ
ンデンサのリードとグローブとの接続がされてない場合
、ｉ九は接触していてもリード線にプラスチックのかす
が付着していたシ、金属の酸化等があると確実な電気的
接続が得られず正確な漏洩電流の測定ができない。(3) Prior art and problems When measuring leakage current using the measurement circuit shown in Figure 2, it is necessary that the probe of the fixed circuit and the I1111 measurement conductor be connected exactly 11. In the unlikely event that the capacitor lead and the glove are not connected, even if they are in contact, there may be plastic debris attached to the lead wire, oxidation of the metal, etc., and a reliable electrical connection will not be possible. leakage current cannot be measured accurately.
このため本来不良（ＩＩ洩電流が大きい）とすべきコン
デンサが嵐品と判定される可能性がある
（４） 発明の目的
本発１ｉｊ１０目的紘以上説明し九従来のコンデンサの
漏洩電流測定回路の問題点を解決するものである。For this reason, there is a possibility that a capacitor that should originally be considered defective (large II leakage current) may be determined to be a defective product. It is a solution to a problem.
（５） 発明の構成
そして仁の発明の目的は、コンデンサのリードに゛測定
用プローブを接触させて、腋コンデンナの漏洩電流を測
定するコンデンサの漏洩電流調定において、前記測定用
プローブの−に接触チェック用プローブを設け、該リー
ドを介して測定用プローブと接触チェック用プローブ間
の導通を試験する接触チェック回路を設けえ事を特徴と
するコンデンサの漏洩電＃ｌ測定回路によ）達成される
。(5) The structure of the invention and the object of the present invention are to adjust the leakage current of a capacitor by contacting the lead of the capacitor with a measuring probe to measure the leakage current of an armpit condenser. Achieved by a capacitor leakage current measurement circuit characterized in that a contact check probe is provided and a contact check circuit is provided to test continuity between the measurement probe and the contact check probe via the lead. Ru.
（６） 発明の実施例 次に図面によシ本発明の詳細をＩｌｌ−する。(6) Examples of the invention Next, details of the present invention will be explained with reference to the drawings.
第３図は本発明め第１の実施例による―洩電＃ｌ＃ｌ定
方法説明図、第４図はそｏｍ＊−路間を示す。FIG. 3 is an explanatory diagram of a leakage current #l #l determination method according to the first embodiment of the present invention, and FIG. 4 shows a som*-path.
第３図および第４図に示すように固定電源Ｅを電解コン
デンサ２の共通端子側つま如リードフレーム１に接続す
る。被試験コンデンサ２のリード５に測定用プローブ７
と接触チェック用プローブ８を接続し、電流電圧変換−
路６によ〉漏洩電流を一定し、その出力曽果を判定−路
１１へ入力する。次Ｋｌｌ定用プローブ１と接触チェッ
ク用プローブ８を切換回路９により切換え、接触チェッ
ク回路ｌＯへ引き込む。ここで測定用プローブ７→リー
ド５→接触チエツタ用グローブ８の経路の導通チェック
を行なって結果を判定回路１１へ入力する。As shown in FIGS. 3 and 4, a fixed power source E is connected to the lead frame 1 on the common terminal side of the electrolytic capacitor 2. Measuring probe 7 is connected to lead 5 of capacitor under test 2.
Connect the contact check probe 8 to the current-voltage conversion
The leakage current is kept constant through path 6, and its output result is input to decision path 11. Next, the Kll determination probe 1 and the contact check probe 8 are switched by the switching circuit 9 and drawn into the contact check circuit IO. Here, a continuity check is performed on the path from the measurement probe 7 to the lead 5 to the contact checker glove 8, and the result is input to the determination circuit 11.
判定回路１１は電流電圧変換回路６からの出力と接触チ
ェック回路１０からの出力により；ンデンサの良否を判
定する。つま）判定回路１１では電流電圧変換回路から
の出力が１良′とさとされ九時は轟該コンデンサを嵐品
としない。The determination circuit 11 determines the quality of the capacitor based on the output from the current-voltage conversion circuit 6 and the output from the contact check circuit 10. Finally, the determination circuit 11 determines that the output from the current-voltage conversion circuit is 1 good, and at 9 o'clock, the capacitor is not judged to be a good product.
！ｌ５ｆＩｉ１は本発明ＩＤＭ２の実施例による漏洩電
Ｒ固定方法説明図、ｔｓａ図はその測定回路図を示す。! l5fIi1 is an explanatory diagram of a leakage current R fixing method according to an embodiment of the IDM2 of the present invention, and tsa is a measurement circuit diagram thereof.
ｊＩ２の実施例は例えば第５図に示すように２本のリー
ド、線を有する電解コンデンサ１４０漏洩電流を一定す
る場合である。An example of jI2 is, for example, a case where the leakage current of an electrolytic capacitor 140 having two leads and wires is kept constant as shown in FIG.
電解コンデンサ１４のリード１５に対して測定用プロー
ブ４と接触チェック用プローブ１７を接続し、リード１
６に対して測定用プローブ７と接触チェック用プローブ
８を接続して、第１０実施例と同様に電流電圧変換回路
６によ如漏洩電流を一定し、結果を判定回路１１へ入力
する。Connect the measurement probe 4 and the contact check probe 17 to the lead 15 of the electrolytic capacitor 14, and
A measurement probe 7 and a contact check probe 8 are connected to the probe 6, the leakage current is made constant by the current-voltage conversion circuit 6 as in the tenth embodiment, and the result is input to the determination circuit 11.
次に切換回路１２を動作させ測定用プローブ４、接触チ
ェック用グローブ１７お本び測定用プローブ７、接触チ
ェック用グローブ龜をそれぞれ接触チェック回路１３へ
引込む。Next, the switching circuit 12 is operated to draw the measuring probe 4, the contact checking glove 17, the measuring probe 7, and the contact checking glove head into the contact checking circuit 13, respectively.
接触チェック回路１３では測定用プローブ４→リード１
５→接触チェック用プローブ１７の経路および測定用グ
ローブ７→リード１６→接触チェック用プローブ８の経
路の導通チェックを行って、この結果を判定回路１１へ
入力する。In the contact check circuit 13, measurement probe 4 → lead 1
Continuity checks are performed on the path of 5→contact check probe 17 and the path of measurement glove 7→lead 16→contact check probe 8, and the results are input to the determination circuit 11.
判定回路１［は電流電圧変換回路６からの出力と接触チ
ェック回路１３からの出力によって被媚定コンデンサの
良否を判定する。The determination circuit 1 determines whether the capacitor to be captivated is good or not based on the output from the current-voltage conversion circuit 6 and the output from the contact check circuit 13.
つま〕判定回路１１でれ電流−圧変換關路６からの出力
と接触チェック回路１３からの出力が共に１良“と出力
された場合のみコンデンサを１良“と判定する。In other words, only when the output from the current-voltage conversion link 6 and the output from the contact check circuit 13 are both 1-good, the judgment circuit 11 judges the capacitor to be 1-good.
（η 発明の効果
以上説明したように本発明によれば、電解コンデンサの
漏洩電流一定試験において、被橢定コンデンサのリード
とプローブが接触していない場合とか、リードと接触し
ていてもリードの酸化、よごれがある場合に誤って良品
と判定することがなくなり、コンデンサの漏洩電流調定
試験の信Ｗ４度を向上することができる。(η Effects of the Invention As explained above, according to the present invention, in a constant leakage current test of an electrolytic capacitor, the lead of the deformed capacitor and the probe are not in contact with each other, or even if the lead is in contact with the lead, the This eliminates the possibility of erroneously determining that the capacitor is non-defective when there is oxidation or dirt, and improves the reliability of the capacitor leakage current adjustment test.
第１図は電解コンデンサの片側のリードがフレームに共
通に接続されている説明図、第２図は電解コンデンサの
漏洩電流調定回路図例、ＪＩ３図社本実明の第１の実施
例による漏洩電流調定試験説ｌ１図、第４図はそＯ調定
回路図、第５図は本発明のＪＩＩ２の実施例による漏洩
電流測定方法説明図、第６図はその測定回路図を示す。
図において１ｔｉ７レーム、２．１４は電解コンデンサ
、３，５，１５．１６はリード、４．７は測定用プロー
ブ、８，１７ｉｊ接触チエツク用プローブ、９．１２は
切換回路、６社電流電圧変換回路、１０．１３ｉｌｔ線
触チエツクＨ路、１１は判定−路を示す。
茅１ 躬
茅２目
ス
芽３ｉ１Ｅ１
１Ｆ４ 躬
ｌρ
′！Ｊ５ 回
警６ 切Fig. 1 is an explanatory diagram in which the leads on one side of the electrolytic capacitor are commonly connected to the frame, Fig. 2 is an example of a leakage current adjustment circuit diagram of an electrolytic capacitor, according to the first embodiment of JI3 Zusha Honjimei. Leakage current adjustment test theory Fig. 11 and Fig. 4 are O adjustment circuit diagrams, Fig. 5 is an explanatory diagram of a leakage current measurement method according to the JII2 embodiment of the present invention, and Fig. 6 is a measurement circuit diagram. In the figure, 1ti7 frame, 2.14 is an electrolytic capacitor, 3, 5, 15.16 are leads, 4.7 is a measurement probe, 8, 17ij is a contact check probe, 9.12 is a switching circuit, and 6 companies current voltage conversion Circuit, 10.13ilt line touch check H path, 11 shows judgment path. Moga 1 Mocha 2 eyes Subud 3i1E1 1F4 Kojilρ ′! J5 round guard 6 cut
Claims (1)
コンデンサ０ＩＩＩ洩電流を一定するコンダンサの一洩
電＃ｌ固定において、前記測定用プローブＯ倫に接触チ
ェック用プローブを設け、該Ｊ−ドを介して測定用グｐ
−プと接触チェツタ用グローブ間の導通な試験する接触
チェック回路を設けえ事を特徴とするコンダン１０漏洩
電流測定A measuring probe is brought into contact with the capacitor glue to fix the leakage current of the scissors capacitor 0III.When the leakage current #l of the capacitor is fixed, a contact check probe is provided on the measuring probe O, and the J-do is fixed. for measurement via
-Conductor 10 leakage current measurement characterized by being equipped with a contact check circuit for testing continuity between the glove and the contact checker glove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56201226A JPS58102173A (en) | 1981-12-14 | 1981-12-14 | Leakage current measuring circuit for capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56201226A JPS58102173A (en) | 1981-12-14 | 1981-12-14 | Leakage current measuring circuit for capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58102173A true JPS58102173A (en) | 1983-06-17 |
Family
ID=16437419
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56201226A Pending JPS58102173A (en) | 1981-12-14 | 1981-12-14 | Leakage current measuring circuit for capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58102173A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1978370A1 (en) * | 2007-04-05 | 2008-10-08 | General Electric Company | Processing tantalum capacitors on assembled PWAs to yield low failure rate |
| WO2008147694A1 (en) * | 2007-05-24 | 2008-12-04 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
| US8054085B2 (en) | 2008-03-31 | 2011-11-08 | Electro Scientific Industries, Inc. | Programmable gain trans-impedance amplifier overload recovery circuit |
| FR2995084A1 (en) * | 2012-08-31 | 2014-03-07 | Avx Corp | SCREENING METHOD FOR ELECTROLYTIC CAPACITORS |
| JP2016114612A (en) * | 2016-01-26 | 2016-06-23 | 日置電機株式会社 | Capacitor inspection method |
| US11448680B2 (en) | 2020-03-31 | 2022-09-20 | KYOCERA AVX Components Corporation | Screening method for electrolytic capacitors that maintains individual capacitor unit identity |
-
1981
- 1981-12-14 JP JP56201226A patent/JPS58102173A/en active Pending
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1978370A1 (en) * | 2007-04-05 | 2008-10-08 | General Electric Company | Processing tantalum capacitors on assembled PWAs to yield low failure rate |
| US7609072B2 (en) | 2007-04-05 | 2009-10-27 | General Electric Company | Processing tantalum capacitors on assembled PWAs to yield low failure rate |
| WO2008147694A1 (en) * | 2007-05-24 | 2008-12-04 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
| US7940058B2 (en) | 2007-05-24 | 2011-05-10 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
| US8054085B2 (en) | 2008-03-31 | 2011-11-08 | Electro Scientific Industries, Inc. | Programmable gain trans-impedance amplifier overload recovery circuit |
| US8686739B2 (en) | 2008-03-31 | 2014-04-01 | Electro Scientific Industries, Inc. | Programmable gain trans-impedance amplifier overload recovery circuit |
| FR2995084A1 (en) * | 2012-08-31 | 2014-03-07 | Avx Corp | SCREENING METHOD FOR ELECTROLYTIC CAPACITORS |
| FR3069328A1 (en) * | 2012-08-31 | 2019-01-25 | Avx Corporation | SCREENING METHOD FOR ELECTROLYTIC CAPACITORS |
| US10591527B2 (en) | 2012-08-31 | 2020-03-17 | Avx Corporation | Screening method for electrolytic capacitors |
| JP2016114612A (en) * | 2016-01-26 | 2016-06-23 | 日置電機株式会社 | Capacitor inspection method |
| US11448680B2 (en) | 2020-03-31 | 2022-09-20 | KYOCERA AVX Components Corporation | Screening method for electrolytic capacitors that maintains individual capacitor unit identity |
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