JPS5784349A - Eddy current type flaw detection system - Google Patents
Eddy current type flaw detection systemInfo
- Publication number
- JPS5784349A JPS5784349A JP15961680A JP15961680A JPS5784349A JP S5784349 A JPS5784349 A JP S5784349A JP 15961680 A JP15961680 A JP 15961680A JP 15961680 A JP15961680 A JP 15961680A JP S5784349 A JPS5784349 A JP S5784349A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- detection
- processing section
- signal processing
- phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE:To improve S/N with a broader dynamic range of a flaw signal by removing an offset signal proper to a detector section in the course to a signal processing section employing a feed back signal from a phase discrimination output before the flaw detecting operation. CONSTITUTION:A detection mechanism 2 is excited based on an AC signal of an oscillator 1 and a detection signal is outputted to a detection coil of the detection mechanism 2. The detection signal is transmitted to a signal processing section 4 provided in an aromatic balance circuit passing through an amplifier 3. The amplitude signal the same in the phase component as the outpt of an oscillator 1 is discriminated with a phase detector section 42 of a signal processing section 4 and that in the phase component shifted by 90 deg. with a 90 deg. phase detector section 43. These signals are fed back to an adder 5 provided between the detection mechanism 2 and the amplifier 3 and the signal (coil residual signal) proper to the detection coil is removed from input signals to the signal processing section 4.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15961680A JPS5784349A (en) | 1980-11-14 | 1980-11-14 | Eddy current type flaw detection system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15961680A JPS5784349A (en) | 1980-11-14 | 1980-11-14 | Eddy current type flaw detection system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5784349A true JPS5784349A (en) | 1982-05-26 |
Family
ID=15697602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15961680A Pending JPS5784349A (en) | 1980-11-14 | 1980-11-14 | Eddy current type flaw detection system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5784349A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0135204A2 (en) * | 1983-06-15 | 1985-03-27 | CISE- Centro Informazioni Studi Esperienze S.p.A. | Measuring device for surface and subsurface defects in metal bodies above the Curie temperature |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53122477A (en) * | 1977-03-31 | 1978-10-25 | Shimadzu Corp | End control system of auto balance circuit in eddy current flaw detector |
-
1980
- 1980-11-14 JP JP15961680A patent/JPS5784349A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53122477A (en) * | 1977-03-31 | 1978-10-25 | Shimadzu Corp | End control system of auto balance circuit in eddy current flaw detector |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0135204A2 (en) * | 1983-06-15 | 1985-03-27 | CISE- Centro Informazioni Studi Esperienze S.p.A. | Measuring device for surface and subsurface defects in metal bodies above the Curie temperature |
EP0135204A3 (en) * | 1983-06-15 | 1988-09-21 | CISE- Centro Informazioni Studi Esperienze S.p.A. | Measuring device for surface and subsurface defects in metal bodies above the curie temperature |
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