JPS5780570A - Measuring device for surface potential - Google Patents

Measuring device for surface potential

Info

Publication number
JPS5780570A
JPS5780570A JP55157478A JP15747880A JPS5780570A JP S5780570 A JPS5780570 A JP S5780570A JP 55157478 A JP55157478 A JP 55157478A JP 15747880 A JP15747880 A JP 15747880A JP S5780570 A JPS5780570 A JP S5780570A
Authority
JP
Japan
Prior art keywords
shutter
electrode
voltage
detecting element
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55157478A
Other languages
Japanese (ja)
Inventor
Kazumasa Yamamoto
Teruo Kobayashi
Noriaki Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP55157478A priority Critical patent/JPS5780570A/en
Publication of JPS5780570A publication Critical patent/JPS5780570A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Control Or Security For Electrophotography (AREA)

Abstract

PURPOSE:To measure potential of a specimen in electrostatic copying machines accurately in non-contacting state, by a method wherein mechanism to interrupt incident electric flux and an electrode with direct connection of FET are constituted. CONSTITUTION:An electrode 17 enclosed in stepped part of an insulator 14 is connected to gate of FET16 enclosed in a cylindrical cap 11 provided with an electric flux entering hole 13. Using a detecting element 21 in such constitution, potential of a measuring specimen 18 in application of voltage from DC power source 19 is measured. A substrate 20 having the detecting element 21 thereon is provided with an electromagnet 22 and a shutter 23, and the shutter 23 is moved in reciprocation by the electromagnet 22 and front part of the hole 13 is opened or closed. Line of electric force extending from the measuring specimen 18 to the electrode 17 in the detecting element 21 is interrupted by the shutter 23, thereby voltage is induced between drain and source of the FET16 and by utilizing this voltage the surface potential of the measuring specimen 18 is measured at non-contacting state.
JP55157478A 1980-11-07 1980-11-07 Measuring device for surface potential Pending JPS5780570A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55157478A JPS5780570A (en) 1980-11-07 1980-11-07 Measuring device for surface potential

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55157478A JPS5780570A (en) 1980-11-07 1980-11-07 Measuring device for surface potential

Publications (1)

Publication Number Publication Date
JPS5780570A true JPS5780570A (en) 1982-05-20

Family

ID=15650550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55157478A Pending JPS5780570A (en) 1980-11-07 1980-11-07 Measuring device for surface potential

Country Status (1)

Country Link
JP (1) JPS5780570A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6055274A (en) * 1983-09-06 1985-03-30 Tdk Corp Surface potential sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6055274A (en) * 1983-09-06 1985-03-30 Tdk Corp Surface potential sensor
JPH0339594B2 (en) * 1983-09-06 1991-06-14 Tdk Electronics Co Ltd

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