JPS5766344A - Inspecting method for mark on transparent plate - Google Patents
Inspecting method for mark on transparent plateInfo
- Publication number
- JPS5766344A JPS5766344A JP14264080A JP14264080A JPS5766344A JP S5766344 A JPS5766344 A JP S5766344A JP 14264080 A JP14264080 A JP 14264080A JP 14264080 A JP14264080 A JP 14264080A JP S5766344 A JPS5766344 A JP S5766344A
- Authority
- JP
- Japan
- Prior art keywords
- mark
- inspection
- comparator
- improvement
- visual field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9586—Windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9045—Inspection of ornamented or stippled container walls
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To perform a reliable inspection through improvement of an inspection precision and to improve a yield rate of a product, by a method wherein a mark inspection is automatically and mechanically performed using an electric means. CONSTITUTION:If a mark 2 on a glass plate 1 exists within a monitoring visual field, light from a light source 5 is scattered by the mark 2, and the image of the mark 2 is projected with a black ground 8 for a background through a penetration visual field 6 by means of a camera 3. The video signal is sent to a comparator 17 through a filter 15 and a differentiation circuit 16. Then, a timing circuit 23 counts the output signal of the comparator 17 at the specific range of the video signal by means of a counter for the storage. Through the comparison of the number of the pulses with a reference value at a CPU27, it is decided whether or not the mark is placed on a given spot. This achieves perfection of an inspection and the improvement of a yield rate of a product.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14264080A JPS5766344A (en) | 1980-10-13 | 1980-10-13 | Inspecting method for mark on transparent plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14264080A JPS5766344A (en) | 1980-10-13 | 1980-10-13 | Inspecting method for mark on transparent plate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5766344A true JPS5766344A (en) | 1982-04-22 |
Family
ID=15320047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14264080A Pending JPS5766344A (en) | 1980-10-13 | 1980-10-13 | Inspecting method for mark on transparent plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5766344A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308526A (en) * | 2012-03-16 | 2013-09-18 | 德国克朗斯公司 | Apparatus for use in the inspection of a container, inspection system and inspection method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5385610A (en) * | 1976-12-29 | 1978-07-28 | Toppan Printing Co Ltd | Printed matter inspector |
JPS53138388A (en) * | 1977-05-07 | 1978-12-02 | Fuji Electric Co Ltd | Inspecting apparatus of transparent object |
-
1980
- 1980-10-13 JP JP14264080A patent/JPS5766344A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5385610A (en) * | 1976-12-29 | 1978-07-28 | Toppan Printing Co Ltd | Printed matter inspector |
JPS53138388A (en) * | 1977-05-07 | 1978-12-02 | Fuji Electric Co Ltd | Inspecting apparatus of transparent object |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308526A (en) * | 2012-03-16 | 2013-09-18 | 德国克朗斯公司 | Apparatus for use in the inspection of a container, inspection system and inspection method |
EP2639573A3 (en) * | 2012-03-16 | 2013-11-06 | Krones AG | Apparatus for use in the inspection of a container, inspection system and inspection method |
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