JPS5766344A - Inspecting method for mark on transparent plate - Google Patents

Inspecting method for mark on transparent plate

Info

Publication number
JPS5766344A
JPS5766344A JP14264080A JP14264080A JPS5766344A JP S5766344 A JPS5766344 A JP S5766344A JP 14264080 A JP14264080 A JP 14264080A JP 14264080 A JP14264080 A JP 14264080A JP S5766344 A JPS5766344 A JP S5766344A
Authority
JP
Japan
Prior art keywords
mark
inspection
comparator
improvement
visual field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14264080A
Other languages
Japanese (ja)
Inventor
Katsumi Kokubu
Masaharu Okafuji
Osayoshi Ichinose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sheet Glass Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Priority to JP14264080A priority Critical patent/JPS5766344A/en
Publication of JPS5766344A publication Critical patent/JPS5766344A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9045—Inspection of ornamented or stippled container walls

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To perform a reliable inspection through improvement of an inspection precision and to improve a yield rate of a product, by a method wherein a mark inspection is automatically and mechanically performed using an electric means. CONSTITUTION:If a mark 2 on a glass plate 1 exists within a monitoring visual field, light from a light source 5 is scattered by the mark 2, and the image of the mark 2 is projected with a black ground 8 for a background through a penetration visual field 6 by means of a camera 3. The video signal is sent to a comparator 17 through a filter 15 and a differentiation circuit 16. Then, a timing circuit 23 counts the output signal of the comparator 17 at the specific range of the video signal by means of a counter for the storage. Through the comparison of the number of the pulses with a reference value at a CPU27, it is decided whether or not the mark is placed on a given spot. This achieves perfection of an inspection and the improvement of a yield rate of a product.
JP14264080A 1980-10-13 1980-10-13 Inspecting method for mark on transparent plate Pending JPS5766344A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14264080A JPS5766344A (en) 1980-10-13 1980-10-13 Inspecting method for mark on transparent plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14264080A JPS5766344A (en) 1980-10-13 1980-10-13 Inspecting method for mark on transparent plate

Publications (1)

Publication Number Publication Date
JPS5766344A true JPS5766344A (en) 1982-04-22

Family

ID=15320047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14264080A Pending JPS5766344A (en) 1980-10-13 1980-10-13 Inspecting method for mark on transparent plate

Country Status (1)

Country Link
JP (1) JPS5766344A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308526A (en) * 2012-03-16 2013-09-18 德国克朗斯公司 Apparatus for use in the inspection of a container, inspection system and inspection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5385610A (en) * 1976-12-29 1978-07-28 Toppan Printing Co Ltd Printed matter inspector
JPS53138388A (en) * 1977-05-07 1978-12-02 Fuji Electric Co Ltd Inspecting apparatus of transparent object

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5385610A (en) * 1976-12-29 1978-07-28 Toppan Printing Co Ltd Printed matter inspector
JPS53138388A (en) * 1977-05-07 1978-12-02 Fuji Electric Co Ltd Inspecting apparatus of transparent object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308526A (en) * 2012-03-16 2013-09-18 德国克朗斯公司 Apparatus for use in the inspection of a container, inspection system and inspection method
EP2639573A3 (en) * 2012-03-16 2013-11-06 Krones AG Apparatus for use in the inspection of a container, inspection system and inspection method

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