JPS5766311A - Automatic testing device - Google Patents

Automatic testing device

Info

Publication number
JPS5766311A
JPS5766311A JP14055980A JP14055980A JPS5766311A JP S5766311 A JPS5766311 A JP S5766311A JP 14055980 A JP14055980 A JP 14055980A JP 14055980 A JP14055980 A JP 14055980A JP S5766311 A JPS5766311 A JP S5766311A
Authority
JP
Japan
Prior art keywords
display
temperature
display device
testing device
automatic testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14055980A
Other languages
Japanese (ja)
Inventor
Kosuke Nakajima
Akio Miyoshi
Masanobu Ando
Katsuhachi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14055980A priority Critical patent/JPS5766311A/en
Publication of JPS5766311A publication Critical patent/JPS5766311A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

PURPOSE:To enhance the efficiency of the temperature display testing by applying an electric signal corresponding to a test reference temprature and determining whether the display of a display device at this time lies within an allowable range or not. CONSTITUTION:A reference temperature signal output part 9 outputs the test reference temperature signal B to a control device in a temperature display device 1 based on a command from an operation control part 8. The display of said temperature display device 1 is sensed by a photoelectric converter 5, judgement is performed in the operation control part 8, and display is performed 10.
JP14055980A 1980-10-09 1980-10-09 Automatic testing device Pending JPS5766311A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14055980A JPS5766311A (en) 1980-10-09 1980-10-09 Automatic testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14055980A JPS5766311A (en) 1980-10-09 1980-10-09 Automatic testing device

Publications (1)

Publication Number Publication Date
JPS5766311A true JPS5766311A (en) 1982-04-22

Family

ID=15271490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14055980A Pending JPS5766311A (en) 1980-10-09 1980-10-09 Automatic testing device

Country Status (1)

Country Link
JP (1) JPS5766311A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5930030A (en) * 1982-08-12 1984-02-17 Omron Tateisi Electronics Co Electronic thermometer
JPS5948618A (en) * 1982-09-14 1984-03-19 Fujitsu Ltd Automatic testing system for light emitting parts
US7018093B2 (en) * 2001-07-11 2006-03-28 Samsung Electronics Co., Ltd. Apparatus and method for sensing defects in temperature sensors
CN103323048A (en) * 2013-05-28 2013-09-25 郑州精益达汽车零部件有限公司高新区分公司 Automobile instrument panel dynamic aging system under high temperature

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5930030A (en) * 1982-08-12 1984-02-17 Omron Tateisi Electronics Co Electronic thermometer
JPH0449056B2 (en) * 1982-08-12 1992-08-10 Omron Tateisi Electronics Co
JPS5948618A (en) * 1982-09-14 1984-03-19 Fujitsu Ltd Automatic testing system for light emitting parts
US7018093B2 (en) * 2001-07-11 2006-03-28 Samsung Electronics Co., Ltd. Apparatus and method for sensing defects in temperature sensors
CN103323048A (en) * 2013-05-28 2013-09-25 郑州精益达汽车零部件有限公司高新区分公司 Automobile instrument panel dynamic aging system under high temperature

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