JPS576344A - Method for removing noise in immune nephelometric analyzing apparatus - Google Patents

Method for removing noise in immune nephelometric analyzing apparatus

Info

Publication number
JPS576344A
JPS576344A JP7966780A JP7966780A JPS576344A JP S576344 A JPS576344 A JP S576344A JP 7966780 A JP7966780 A JP 7966780A JP 7966780 A JP7966780 A JP 7966780A JP S576344 A JPS576344 A JP S576344A
Authority
JP
Japan
Prior art keywords
circuit
inputted
scattered light
antibody reaction
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7966780A
Other languages
Japanese (ja)
Inventor
Takehide Matsuda
Hiroyuki Okuda
Mamoru Maekawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jokoh Co Ltd
Original Assignee
Jokoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jokoh Co Ltd filed Critical Jokoh Co Ltd
Priority to JP7966780A priority Critical patent/JPS576344A/en
Publication of JPS576344A publication Critical patent/JPS576344A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)

Abstract

PURPOSE:To detect true antigen antibody reaction by eliminating the production of the noises produced by dusts or bubbles which are irrespective of antigen antibody reaction or the clouding and the like of mixed solns. per se. CONSTITUTION:The quantity of scattered light by the antigen antibody reaction in reagent mixed soln. is detected with an photoelectron multiplier 1, and the output of the multiplier 1 is inputted to a primary waveform shaping circuit 5 via a preamplifier 2, a multiplexer 3 and an amplifier 4, whereby the spikes of the detected waveforms are waveform shaped vertically oppositely. The output of the circuit 5 is inputted via a filter 6 to an automatic base correcting circuit 7, by which the ground level is subtracted successively from the quantity of the scattered light, and thereafter, it is inputted to a computer 13 via a peak holding circut 8, a secondary waveform shaping circuit 9, a filter 10, a differentiating circuit 11, and an A/D converter 12. Thereby, noises are thoroughly removed, and the true maximum change rate of the quantity of the scattered light is detected.
JP7966780A 1980-06-13 1980-06-13 Method for removing noise in immune nephelometric analyzing apparatus Pending JPS576344A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7966780A JPS576344A (en) 1980-06-13 1980-06-13 Method for removing noise in immune nephelometric analyzing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7966780A JPS576344A (en) 1980-06-13 1980-06-13 Method for removing noise in immune nephelometric analyzing apparatus

Publications (1)

Publication Number Publication Date
JPS576344A true JPS576344A (en) 1982-01-13

Family

ID=13696517

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7966780A Pending JPS576344A (en) 1980-06-13 1980-06-13 Method for removing noise in immune nephelometric analyzing apparatus

Country Status (1)

Country Link
JP (1) JPS576344A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS595523A (en) * 1982-06-30 1984-01-12 松下電工株式会社 Photoelectric switch unit
JPS63253863A (en) * 1987-04-10 1988-10-20 Nippon Chemicon Corp Dc-dc converter
JPS63253864A (en) * 1987-04-10 1988-10-20 Nippon Chemicon Corp Dc-dc converter
US4798664A (en) * 1985-12-25 1989-01-17 Terumo Kabushiki Kaisha Ion sensor
US4816118A (en) * 1986-01-24 1989-03-28 Terumo Corporation Ion-sensitive FET sensor
US5139626A (en) * 1985-10-02 1992-08-18 Terumo Corporation Ion concentration measurement method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5313492A (en) * 1976-06-02 1978-02-07 Beckman Instruments Inc Process and method for immunity nephelometry
JPS5440680A (en) * 1977-09-07 1979-03-30 Hitachi Ltd Nephelometer
JPS5446829A (en) * 1977-09-21 1979-04-13 Hitachi Ltd Nephelometry

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5313492A (en) * 1976-06-02 1978-02-07 Beckman Instruments Inc Process and method for immunity nephelometry
JPS5440680A (en) * 1977-09-07 1979-03-30 Hitachi Ltd Nephelometer
JPS5446829A (en) * 1977-09-21 1979-04-13 Hitachi Ltd Nephelometry

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS595523A (en) * 1982-06-30 1984-01-12 松下電工株式会社 Photoelectric switch unit
US5139626A (en) * 1985-10-02 1992-08-18 Terumo Corporation Ion concentration measurement method
US4798664A (en) * 1985-12-25 1989-01-17 Terumo Kabushiki Kaisha Ion sensor
US4816118A (en) * 1986-01-24 1989-03-28 Terumo Corporation Ion-sensitive FET sensor
JPS63253863A (en) * 1987-04-10 1988-10-20 Nippon Chemicon Corp Dc-dc converter
JPS63253864A (en) * 1987-04-10 1988-10-20 Nippon Chemicon Corp Dc-dc converter

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