JPS5760446A - Voltage margin testing method - Google Patents
Voltage margin testing methodInfo
- Publication number
- JPS5760446A JPS5760446A JP55136239A JP13623980A JPS5760446A JP S5760446 A JPS5760446 A JP S5760446A JP 55136239 A JP55136239 A JP 55136239A JP 13623980 A JP13623980 A JP 13623980A JP S5760446 A JPS5760446 A JP S5760446A
- Authority
- JP
- Japan
- Prior art keywords
- test
- test program
- voltage
- tested
- processing equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Sources (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE:To execute a continuous voltage margin test automatically, by supplying a normal applied voltage value corresponding to a test program, to an information processing equipment to be tested, in case of a voltage margine test of the information processing equipment. CONSTITUTION:Prior to a test, a classification of a test program to be tested, an execution sequence, and an applied voltage setting information of every test program are set to a processor 7 from a console display device 6. In accordance with the test procedure, the processor 7 reads out a test program from a file device 8, stores it in a memory device of an information processing equipment 1 to be tested 1, sets electric power supply devices 9, 10 to voltage of a normal value, referring to the applied voltage setting information corresponding to the test program, and after that, executes the test program, automatically continuous it in order in accordance with the test procedure, and executes a voltage margin test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55136239A JPS5760446A (en) | 1980-09-30 | 1980-09-30 | Voltage margin testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55136239A JPS5760446A (en) | 1980-09-30 | 1980-09-30 | Voltage margin testing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5760446A true JPS5760446A (en) | 1982-04-12 |
Family
ID=15170528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55136239A Pending JPS5760446A (en) | 1980-09-30 | 1980-09-30 | Voltage margin testing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5760446A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8150089B2 (en) | 2005-12-28 | 2012-04-03 | Sony Corporation | Wireless microphone and apparatus for fixing transmitter of the wireless microphone |
-
1980
- 1980-09-30 JP JP55136239A patent/JPS5760446A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8150089B2 (en) | 2005-12-28 | 2012-04-03 | Sony Corporation | Wireless microphone and apparatus for fixing transmitter of the wireless microphone |
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