JPS5746010B2 - - Google Patents
Info
- Publication number
- JPS5746010B2 JPS5746010B2 JP50100843A JP10084375A JPS5746010B2 JP S5746010 B2 JPS5746010 B2 JP S5746010B2 JP 50100843 A JP50100843 A JP 50100843A JP 10084375 A JP10084375 A JP 10084375A JP S5746010 B2 JPS5746010 B2 JP S5746010B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50100843A JPS5223960A (en) | 1975-08-19 | 1975-08-19 | Process for measuring piezo-electric thickness resonator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50100843A JPS5223960A (en) | 1975-08-19 | 1975-08-19 | Process for measuring piezo-electric thickness resonator |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5223960A JPS5223960A (en) | 1977-02-23 |
| JPS5746010B2 true JPS5746010B2 (zh) | 1982-09-30 |
Family
ID=14284590
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50100843A Granted JPS5223960A (en) | 1975-08-19 | 1975-08-19 | Process for measuring piezo-electric thickness resonator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5223960A (zh) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60188618U (ja) * | 1984-05-28 | 1985-12-13 | 井上エムテ−ピ−株式会社 | 自動車用ダクト |
| CN105675120A (zh) * | 2016-04-26 | 2016-06-15 | 中国电子科技集团公司第二十六研究所 | 晶片频率测试装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105910530A (zh) * | 2016-04-26 | 2016-08-31 | 中国电子科技集团公司第二十六研究所 | 晶片平行度测试方法 |
-
1975
- 1975-08-19 JP JP50100843A patent/JPS5223960A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60188618U (ja) * | 1984-05-28 | 1985-12-13 | 井上エムテ−ピ−株式会社 | 自動車用ダクト |
| CN105675120A (zh) * | 2016-04-26 | 2016-06-15 | 中国电子科技集团公司第二十六研究所 | 晶片频率测试装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5223960A (en) | 1977-02-23 |