JPS5737251A - Optical system of measuring device of grain density in suspension liquid - Google Patents

Optical system of measuring device of grain density in suspension liquid

Info

Publication number
JPS5737251A
JPS5737251A JP11297480A JP11297480A JPS5737251A JP S5737251 A JPS5737251 A JP S5737251A JP 11297480 A JP11297480 A JP 11297480A JP 11297480 A JP11297480 A JP 11297480A JP S5737251 A JPS5737251 A JP S5737251A
Authority
JP
Japan
Prior art keywords
mask
incident
cell
passes
scattered light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11297480A
Other languages
Japanese (ja)
Inventor
Keisho Amano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP11297480A priority Critical patent/JPS5737251A/en
Publication of JPS5737251A publication Critical patent/JPS5737251A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To improve sensitivity of detection, by installing an incident-side mask, which allows to pass only parallel laser luminous flux to irradiate a specimen cell, and an emission-side mask, which allows to pass only scattered light by suspended grain. CONSTITUTION:A thin(0.8mm.dia.) parallel luminous flux, emitted from an He-Ne laser 13, passes through an incident-side mask 9, havng a circular hole of the diameter several times of the beam diameter, and is incident in a spacimen cell 4. Nonparallel light (f) is eliminated by the mask 9. Sidewise scattered beam (d) from suspended particle in the cell 4 passes through a slitted mask 11a, a lens 15a, a mask 11a with circular hole, and is incident into a sidewise scattered light receiver 8b. Scattered light (e), (h), caused by contamination of the side faces 3 and 5 is removed by the mask 10a, 11a and the lens 15a. Laser beam 6 having passes through the cell 4 is received by a passed-light receiver 7. This arrangement improves detection sensitivity.
JP11297480A 1980-08-19 1980-08-19 Optical system of measuring device of grain density in suspension liquid Pending JPS5737251A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11297480A JPS5737251A (en) 1980-08-19 1980-08-19 Optical system of measuring device of grain density in suspension liquid

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11297480A JPS5737251A (en) 1980-08-19 1980-08-19 Optical system of measuring device of grain density in suspension liquid

Publications (1)

Publication Number Publication Date
JPS5737251A true JPS5737251A (en) 1982-03-01

Family

ID=14600216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11297480A Pending JPS5737251A (en) 1980-08-19 1980-08-19 Optical system of measuring device of grain density in suspension liquid

Country Status (1)

Country Link
JP (1) JPS5737251A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015500467A (en) * 2011-12-01 2015-01-05 ピー．エム．エル． − パーティクルズ モニタリング テクノロジーズリミテッド Detection scheme for particle size and concentration measurement
JP2020020706A (en) * 2018-08-02 2020-02-06 株式会社島津製作所 Light scattering detection device
US11237095B2 (en) 2019-04-25 2022-02-01 Particle Measuring Systems, Inc. Particle detection systems and methods for on-axis particle detection and/or differential detection
US11781965B2 (en) 2017-10-26 2023-10-10 Particle Measuring Systems, Inc. System and method for particles measurement
US11988593B2 (en) 2019-11-22 2024-05-21 Particle Measuring Systems, Inc. Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015500467A (en) * 2011-12-01 2015-01-05 ピー．エム．エル． − パーティクルズ モニタリング テクノロジーズリミテッド Detection scheme for particle size and concentration measurement
US10921229B2 (en) 2011-12-01 2021-02-16 Particle Measuring Systems, Inc. Detection scheme for particle size and concentration measurement
US11781965B2 (en) 2017-10-26 2023-10-10 Particle Measuring Systems, Inc. System and method for particles measurement
JP2020020706A (en) * 2018-08-02 2020-02-06 株式会社島津製作所 Light scattering detection device
US11237095B2 (en) 2019-04-25 2022-02-01 Particle Measuring Systems, Inc. Particle detection systems and methods for on-axis particle detection and/or differential detection
US11946852B2 (en) 2019-04-25 2024-04-02 Particle Measuring Systems, Inc. Particle detection systems and methods for on-axis particle detection and/or differential detection
US11988593B2 (en) 2019-11-22 2024-05-21 Particle Measuring Systems, Inc. Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions

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