JPS5737251A - Optical system of measuring device of grain density in suspension liquid - Google Patents
Optical system of measuring device of grain density in suspension liquidInfo
- Publication number
- JPS5737251A JPS5737251A JP11297480A JP11297480A JPS5737251A JP S5737251 A JPS5737251 A JP S5737251A JP 11297480 A JP11297480 A JP 11297480A JP 11297480 A JP11297480 A JP 11297480A JP S5737251 A JPS5737251 A JP S5737251A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- incident
- cell
- passes
- scattered light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To improve sensitivity of detection, by installing an incident-side mask, which allows to pass only parallel laser luminous flux to irradiate a specimen cell, and an emission-side mask, which allows to pass only scattered light by suspended grain. CONSTITUTION:A thin(0.8mm.dia.) parallel luminous flux, emitted from an He-Ne laser 13, passes through an incident-side mask 9, havng a circular hole of the diameter several times of the beam diameter, and is incident in a spacimen cell 4. Nonparallel light (f) is eliminated by the mask 9. Sidewise scattered beam (d) from suspended particle in the cell 4 passes through a slitted mask 11a, a lens 15a, a mask 11a with circular hole, and is incident into a sidewise scattered light receiver 8b. Scattered light (e), (h), caused by contamination of the side faces 3 and 5 is removed by the mask 10a, 11a and the lens 15a. Laser beam 6 having passes through the cell 4 is received by a passed-light receiver 7. This arrangement improves detection sensitivity.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11297480A JPS5737251A (en) | 1980-08-19 | 1980-08-19 | Optical system of measuring device of grain density in suspension liquid |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11297480A JPS5737251A (en) | 1980-08-19 | 1980-08-19 | Optical system of measuring device of grain density in suspension liquid |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5737251A true JPS5737251A (en) | 1982-03-01 |
Family
ID=14600216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11297480A Pending JPS5737251A (en) | 1980-08-19 | 1980-08-19 | Optical system of measuring device of grain density in suspension liquid |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5737251A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015500467A (en) * | 2011-12-01 | 2015-01-05 | ピー.エム.エル. − パーティクルズ モニタリング テクノロジーズリミテッド | Detection scheme for particle size and concentration measurement |
JP2020020706A (en) * | 2018-08-02 | 2020-02-06 | 株式会社島津製作所 | Light scattering detection device |
US11237095B2 (en) | 2019-04-25 | 2022-02-01 | Particle Measuring Systems, Inc. | Particle detection systems and methods for on-axis particle detection and/or differential detection |
US11781965B2 (en) | 2017-10-26 | 2023-10-10 | Particle Measuring Systems, Inc. | System and method for particles measurement |
US11988593B2 (en) | 2019-11-22 | 2024-05-21 | Particle Measuring Systems, Inc. | Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions |
-
1980
- 1980-08-19 JP JP11297480A patent/JPS5737251A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015500467A (en) * | 2011-12-01 | 2015-01-05 | ピー.エム.エル. − パーティクルズ モニタリング テクノロジーズリミテッド | Detection scheme for particle size and concentration measurement |
US10921229B2 (en) | 2011-12-01 | 2021-02-16 | Particle Measuring Systems, Inc. | Detection scheme for particle size and concentration measurement |
US11781965B2 (en) | 2017-10-26 | 2023-10-10 | Particle Measuring Systems, Inc. | System and method for particles measurement |
JP2020020706A (en) * | 2018-08-02 | 2020-02-06 | 株式会社島津製作所 | Light scattering detection device |
US11237095B2 (en) | 2019-04-25 | 2022-02-01 | Particle Measuring Systems, Inc. | Particle detection systems and methods for on-axis particle detection and/or differential detection |
US11946852B2 (en) | 2019-04-25 | 2024-04-02 | Particle Measuring Systems, Inc. | Particle detection systems and methods for on-axis particle detection and/or differential detection |
US11988593B2 (en) | 2019-11-22 | 2024-05-21 | Particle Measuring Systems, Inc. | Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions |
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