JPS5730903A - Device for processing irregular lattice image analysis - Google Patents

Device for processing irregular lattice image analysis

Info

Publication number
JPS5730903A
JPS5730903A JP10757680A JP10757680A JPS5730903A JP S5730903 A JPS5730903 A JP S5730903A JP 10757680 A JP10757680 A JP 10757680A JP 10757680 A JP10757680 A JP 10757680A JP S5730903 A JPS5730903 A JP S5730903A
Authority
JP
Japan
Prior art keywords
lattice
signal
sensing part
processor
deformed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10757680A
Other languages
Japanese (ja)
Other versions
JPH0427482B2 (en
Inventor
Masanori Idesawa
Toyohiko Yatagai
Masane Suzuki
Kiyoshi Suzuki
Hideharu Oshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
RIKEN Institute of Physical and Chemical Research
Original Assignee
RIKEN Institute of Physical and Chemical Research
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN Institute of Physical and Chemical Research, Fuji Photo Optical Co Ltd filed Critical RIKEN Institute of Physical and Chemical Research
Priority to JP10757680A priority Critical patent/JPS5730903A/en
Publication of JPS5730903A publication Critical patent/JPS5730903A/en
Publication of JPH0427482B2 publication Critical patent/JPH0427482B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To obtain data of the tri-dimensional shape of a surface of a body by automatically reading various data including concave and convex informations of the surface of the body to be measured from basic input data of a deformed lattice and performing processing operation. CONSTITUTION:The image of a lattice G is projected on the surface of the body to be measured by a projecting lens L1. The lattice image is brought to a sensing part 1 via an imagery lens L2. The signal from the sensing part 1 is brightness distribution signal in one line on the deformed lattice surface and include position information on said line. The signal from the sensing part 1 is inputted to a processor 4 via a compensating part 3. The processor 4 has a function for temporarily storing the inputted digital brightness signal caused by the deformed lattice. A suitable part of the stored information is retrieved and processed, and the processed data is displayed on a CRT6.
JP10757680A 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis Granted JPS5730903A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10757680A JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10757680A JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Publications (2)

Publication Number Publication Date
JPS5730903A true JPS5730903A (en) 1982-02-19
JPH0427482B2 JPH0427482B2 (en) 1992-05-12

Family

ID=14462667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10757680A Granted JPS5730903A (en) 1980-08-04 1980-08-04 Device for processing irregular lattice image analysis

Country Status (1)

Country Link
JP (1) JPS5730903A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166807A (en) * 1983-03-14 1984-09-20 Yamatake Honeywell Co Ltd Method and device for confirming shape
JPS61231139A (en) * 1985-04-06 1986-10-15 Nippon Steel Corp Heat resistant ferritic steel of high strength

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4721345A (en) * 1971-03-13 1972-10-03
JPS52116263A (en) * 1976-03-25 1977-09-29 Rikagaku Kenkyusho Method of indicating and processing threeedimensional information on objects

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4721345A (en) * 1971-03-13 1972-10-03
JPS52116263A (en) * 1976-03-25 1977-09-29 Rikagaku Kenkyusho Method of indicating and processing threeedimensional information on objects

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59166807A (en) * 1983-03-14 1984-09-20 Yamatake Honeywell Co Ltd Method and device for confirming shape
JPH0242165B2 (en) * 1983-03-14 1990-09-20
JPS61231139A (en) * 1985-04-06 1986-10-15 Nippon Steel Corp Heat resistant ferritic steel of high strength
JPH0365428B2 (en) * 1985-04-06 1991-10-11

Also Published As

Publication number Publication date
JPH0427482B2 (en) 1992-05-12

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