JPS572567A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS572567A
JPS572567A JP7644880A JP7644880A JPS572567A JP S572567 A JPS572567 A JP S572567A JP 7644880 A JP7644880 A JP 7644880A JP 7644880 A JP7644880 A JP 7644880A JP S572567 A JPS572567 A JP S572567A
Authority
JP
Japan
Prior art keywords
region
polycrystalline silicon
semiconductor device
electrode
base region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7644880A
Other languages
Japanese (ja)
Inventor
Yoichi Emura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7644880A priority Critical patent/JPS572567A/en
Publication of JPS572567A publication Critical patent/JPS572567A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Bipolar Transistors (AREA)

Abstract

PURPOSE:To improve the reliability of a semiconductor device by forming an equipotential electrode with polycrystalline silicon, thereby preventing the increase in the surface leakage current caused by corrosion and improper shortcircuit. CONSTITUTION:A reversely conductive type base region 12 is formed on a semiconductor substrate, and an emitter region 11 is formed in a base region 12. A contacting regin 14 is formed at an interval around the base region 12, and equipotential electrode 19 of the same conductive type polycrystalline silicon connected to the region 14 is formed. Emitter, base and collector electrodes 16, 17, 18 are formed of aluminum or gold. When the equipotential electrode 19 of polycrystalline silicon is thus formed, the electrode will not corrode even when a bias is applied at a high temperature and a high moisture, the increase in the surface leakage current and the improper shortcircuit can be suppressed, and the reliability of the silicon junction type semiconductor device can be improved.
JP7644880A 1980-06-06 1980-06-06 Semiconductor device Pending JPS572567A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7644880A JPS572567A (en) 1980-06-06 1980-06-06 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7644880A JPS572567A (en) 1980-06-06 1980-06-06 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS572567A true JPS572567A (en) 1982-01-07

Family

ID=13605430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7644880A Pending JPS572567A (en) 1980-06-06 1980-06-06 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS572567A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064481A (en) * 1983-09-19 1985-04-13 Hitachi Ltd Semiconductor device
DE4203399A1 (en) * 1991-02-08 1992-08-13 Toyoda Automatic Loom Works SEMICONDUCTOR MODULE AND METHOD FOR THE PRODUCTION THEREOF
CN105572449A (en) * 2015-12-09 2016-05-11 中国电子科技集团公司第四十一研究所 Integrated circuit for suppressing high impedance input end current leakage

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5079278A (en) * 1973-11-09 1975-06-27
JPS5129879A (en) * 1974-09-06 1976-03-13 Hitachi Ltd HANDOTAISOCHINOSEIZOHOHO

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5079278A (en) * 1973-11-09 1975-06-27
JPS5129879A (en) * 1974-09-06 1976-03-13 Hitachi Ltd HANDOTAISOCHINOSEIZOHOHO

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064481A (en) * 1983-09-19 1985-04-13 Hitachi Ltd Semiconductor device
JPH0516196B2 (en) * 1983-09-19 1993-03-03 Hitachi Ltd
DE4203399A1 (en) * 1991-02-08 1992-08-13 Toyoda Automatic Loom Works SEMICONDUCTOR MODULE AND METHOD FOR THE PRODUCTION THEREOF
DE4203399C2 (en) * 1991-02-08 1996-07-18 Toyoda Automatic Loom Works Semiconductor device and method for its production
CN105572449A (en) * 2015-12-09 2016-05-11 中国电子科技集团公司第四十一研究所 Integrated circuit for suppressing high impedance input end current leakage

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