JPS57187609A - Measuring device for decrease in wall thickness - Google Patents
Measuring device for decrease in wall thicknessInfo
- Publication number
- JPS57187609A JPS57187609A JP7200881A JP7200881A JPS57187609A JP S57187609 A JPS57187609 A JP S57187609A JP 7200881 A JP7200881 A JP 7200881A JP 7200881 A JP7200881 A JP 7200881A JP S57187609 A JPS57187609 A JP S57187609A
- Authority
- JP
- Japan
- Prior art keywords
- wave
- time
- wall thickness
- sending
- waves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Abstract
PURPOSE:To reduce scanning by a wave sending and receiving device and detect minimum wall thickness and its position in a short time by sending a surface wave to an object to be measured and making its frequency gradually larger and detecting the time for the wave to reach a wave receiving device through a reduced wall thickness portion or the time for the reflected wave to reach the wave receiving device. CONSTITUTION:Continuous sine waves from an oscillator 10 become pulse-type sine waves at a gate circuit 11 by means of a trigger pulse generated in a micro-processor (MP) 9, and they are applied to a wave sending and receiving unit 3 via an amplifier 12. The surface waves are received by a receiver 5, and its signal is input to a counter 19 through an amplifier 17 and a pulse shaper 18, and the clock pulse from a pulse generator 13 is counted. The value of the counting for the time (tau) from oscillation of the surface waves to the time of receiving them is stored in the MP9. When it falls within a specified value by changing the frequency (f), the thickness of a part 2 where wall thickness is reduced is calculated. The waves reflected from the part 2 are detected at the waqve sending and receiving unit 3 and from the going and returning time of surface waves detected in the same way the position of the part 2 is detected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7200881A JPS57187609A (en) | 1981-05-13 | 1981-05-13 | Measuring device for decrease in wall thickness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7200881A JPS57187609A (en) | 1981-05-13 | 1981-05-13 | Measuring device for decrease in wall thickness |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57187609A true JPS57187609A (en) | 1982-11-18 |
JPS6316685B2 JPS6316685B2 (en) | 1988-04-11 |
Family
ID=13476949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7200881A Granted JPS57187609A (en) | 1981-05-13 | 1981-05-13 | Measuring device for decrease in wall thickness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57187609A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005905A (en) * | 2000-06-23 | 2002-01-09 | Idemitsu Eng Co Ltd | Inspection method of thinning wall or the like by surface wave and inspection device therefor |
EP1959229A1 (en) * | 2007-02-19 | 2008-08-20 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Ultrasonic surface monitoring |
JP2018205185A (en) * | 2017-06-06 | 2018-12-27 | 日立Geニュークリア・エナジー株式会社 | Ultrasonic inspection method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2501007C2 (en) * | 2008-07-22 | 2013-12-10 | Недерландсе Органистати Вор Тугепаст-Натюрветенсхаппелейк Ондерзук Тно | Corrosion monitoring |
-
1981
- 1981-05-13 JP JP7200881A patent/JPS57187609A/en active Granted
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005905A (en) * | 2000-06-23 | 2002-01-09 | Idemitsu Eng Co Ltd | Inspection method of thinning wall or the like by surface wave and inspection device therefor |
EP1959229A1 (en) * | 2007-02-19 | 2008-08-20 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Ultrasonic surface monitoring |
WO2008103036A1 (en) | 2007-02-19 | 2008-08-28 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Ultrasonic surface monitoring |
JP2010519509A (en) * | 2007-02-19 | 2010-06-03 | ネーデルランデ オルガニサチエ ヴォール トエゲパスト−ナツールウェテンスハペリエク オンデルゾエク ティーエヌオー | Ultrasonic surface monitoring method |
US8583407B2 (en) | 2007-02-19 | 2013-11-12 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Ultrasonic surface monitoring |
JP2018205185A (en) * | 2017-06-06 | 2018-12-27 | 日立Geニュークリア・エナジー株式会社 | Ultrasonic inspection method |
Also Published As
Publication number | Publication date |
---|---|
JPS6316685B2 (en) | 1988-04-11 |
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