JPS57179629A - Apparatus for measuring focused spot diameter - Google Patents

Apparatus for measuring focused spot diameter

Info

Publication number
JPS57179629A
JPS57179629A JP6461081A JP6461081A JPS57179629A JP S57179629 A JPS57179629 A JP S57179629A JP 6461081 A JP6461081 A JP 6461081A JP 6461081 A JP6461081 A JP 6461081A JP S57179629 A JPS57179629 A JP S57179629A
Authority
JP
Japan
Prior art keywords
shielding
display
matter
vibrates
spot diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6461081A
Other languages
Japanese (ja)
Inventor
Seio Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP6461081A priority Critical patent/JPS57179629A/en
Publication of JPS57179629A publication Critical patent/JPS57179629A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To measure a focused spot diameter with low errors and a simplified working by indicating a two-dimensional waveform according to the photoelectrically converted output of a non-shielded light and the output of a contactless displacement meter obtained by a high speed vibration of an optical path shielding means employing an electrostrictive element. CONSTITUTION:When a sine wave voltage from an oscillator 17 is applied on an electrostrictive element 14, the element 14 vibrates with a part contacting a support 15 as node and the center thereof as loop. Therefore, a shielding matter 30 bonded on the center of the element 14 in one direction thereof by way of a support base 13 vibrates in an X axis. When the shielding matter 30 is placed near the focus of a laser beam 1 focused with a condenser 2, light enters light detector 8 as different quantity of eclipse according to the movement of the shielding matter 30. After the photoelectric conversion, the incidence signal is amplified 9 and input into the Y terminal of a waveform display 20. On the other hand, the movement of the shielding matter 30 is detected with a probe 18 and inputted into the X terminal of the display 20 through a main body 19. Therefore, the display 20 indicates a two-dimensional waveform 21.
JP6461081A 1981-04-28 1981-04-28 Apparatus for measuring focused spot diameter Pending JPS57179629A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6461081A JPS57179629A (en) 1981-04-28 1981-04-28 Apparatus for measuring focused spot diameter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6461081A JPS57179629A (en) 1981-04-28 1981-04-28 Apparatus for measuring focused spot diameter

Publications (1)

Publication Number Publication Date
JPS57179629A true JPS57179629A (en) 1982-11-05

Family

ID=13263197

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6461081A Pending JPS57179629A (en) 1981-04-28 1981-04-28 Apparatus for measuring focused spot diameter

Country Status (1)

Country Link
JP (1) JPS57179629A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139043A (en) * 1982-02-15 1983-08-18 Sony Corp Measuring device for condensing performance of lens
EP0184802A2 (en) * 1984-12-10 1986-06-18 CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. Method of and aparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam
US4917489A (en) * 1988-05-19 1990-04-17 Pioneer Electronic Corporation Device for measuring size of light spot
JPH0439259U (en) * 1990-07-31 1992-04-02
JP2012118061A (en) * 2010-12-02 2012-06-21 Xtreme Technologies Gmbh Method for measuring spatial decomposition of parameter on beam cross section of high-energy radiation light of high intensity

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139043A (en) * 1982-02-15 1983-08-18 Sony Corp Measuring device for condensing performance of lens
EP0184802A2 (en) * 1984-12-10 1986-06-18 CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. Method of and aparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam
US4917489A (en) * 1988-05-19 1990-04-17 Pioneer Electronic Corporation Device for measuring size of light spot
JPH0439259U (en) * 1990-07-31 1992-04-02
JP2012118061A (en) * 2010-12-02 2012-06-21 Xtreme Technologies Gmbh Method for measuring spatial decomposition of parameter on beam cross section of high-energy radiation light of high intensity

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