JPS57179629A - Apparatus for measuring focused spot diameter - Google Patents
Apparatus for measuring focused spot diameterInfo
- Publication number
- JPS57179629A JPS57179629A JP6461081A JP6461081A JPS57179629A JP S57179629 A JPS57179629 A JP S57179629A JP 6461081 A JP6461081 A JP 6461081A JP 6461081 A JP6461081 A JP 6461081A JP S57179629 A JPS57179629 A JP S57179629A
- Authority
- JP
- Japan
- Prior art keywords
- shielding
- display
- matter
- vibrates
- spot diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000006073 displacement reaction Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000000523 sample Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Measurement Of Radiation (AREA)
Abstract
PURPOSE:To measure a focused spot diameter with low errors and a simplified working by indicating a two-dimensional waveform according to the photoelectrically converted output of a non-shielded light and the output of a contactless displacement meter obtained by a high speed vibration of an optical path shielding means employing an electrostrictive element. CONSTITUTION:When a sine wave voltage from an oscillator 17 is applied on an electrostrictive element 14, the element 14 vibrates with a part contacting a support 15 as node and the center thereof as loop. Therefore, a shielding matter 30 bonded on the center of the element 14 in one direction thereof by way of a support base 13 vibrates in an X axis. When the shielding matter 30 is placed near the focus of a laser beam 1 focused with a condenser 2, light enters light detector 8 as different quantity of eclipse according to the movement of the shielding matter 30. After the photoelectric conversion, the incidence signal is amplified 9 and input into the Y terminal of a waveform display 20. On the other hand, the movement of the shielding matter 30 is detected with a probe 18 and inputted into the X terminal of the display 20 through a main body 19. Therefore, the display 20 indicates a two-dimensional waveform 21.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6461081A JPS57179629A (en) | 1981-04-28 | 1981-04-28 | Apparatus for measuring focused spot diameter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6461081A JPS57179629A (en) | 1981-04-28 | 1981-04-28 | Apparatus for measuring focused spot diameter |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57179629A true JPS57179629A (en) | 1982-11-05 |
Family
ID=13263197
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6461081A Pending JPS57179629A (en) | 1981-04-28 | 1981-04-28 | Apparatus for measuring focused spot diameter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57179629A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58139043A (en) * | 1982-02-15 | 1983-08-18 | Sony Corp | Measuring device for condensing performance of lens |
EP0184802A2 (en) * | 1984-12-10 | 1986-06-18 | CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. | Method of and aparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam |
US4917489A (en) * | 1988-05-19 | 1990-04-17 | Pioneer Electronic Corporation | Device for measuring size of light spot |
JPH0439259U (en) * | 1990-07-31 | 1992-04-02 | ||
JP2012118061A (en) * | 2010-12-02 | 2012-06-21 | Xtreme Technologies Gmbh | Method for measuring spatial decomposition of parameter on beam cross section of high-energy radiation light of high intensity |
-
1981
- 1981-04-28 JP JP6461081A patent/JPS57179629A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58139043A (en) * | 1982-02-15 | 1983-08-18 | Sony Corp | Measuring device for condensing performance of lens |
EP0184802A2 (en) * | 1984-12-10 | 1986-06-18 | CSELT Centro Studi e Laboratori Telecomunicazioni S.p.A. | Method of and aparatus for measuring the transverse moments of the electromagnetic field associated with an optical beam |
US4917489A (en) * | 1988-05-19 | 1990-04-17 | Pioneer Electronic Corporation | Device for measuring size of light spot |
JPH0439259U (en) * | 1990-07-31 | 1992-04-02 | ||
JP2012118061A (en) * | 2010-12-02 | 2012-06-21 | Xtreme Technologies Gmbh | Method for measuring spatial decomposition of parameter on beam cross section of high-energy radiation light of high intensity |
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