JPS5717804A - Dimension measuring method - Google Patents
Dimension measuring methodInfo
- Publication number
- JPS5717804A JPS5717804A JP9255380A JP9255380A JPS5717804A JP S5717804 A JPS5717804 A JP S5717804A JP 9255380 A JP9255380 A JP 9255380A JP 9255380 A JP9255380 A JP 9255380A JP S5717804 A JPS5717804 A JP S5717804A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- circuit
- dimensions
- data
- small comparison
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
PURPOSE:To correctly measure the dimensions of materials to be measured by obtaining the starting and finishing signals of measurement as compared with the previously obtained data and the data of dimensions of diameter obtained from sensor digitally by shifting the material to be measured. CONSTITUTION:The material is taken a photograph by an image sensor by shifting the material to be measured in the direction of the shaft. Waveform shaped output in a threshold level setting circuit 12 is fed to a counting circuit 13, and output of the counting circuit 13 is stored in a memory circuit 14. Memory circuit 14 is connected to a large/small comparison circuit 15 and the large/small comparison circuit 15 compares the data obtained in this time and the data obtained in the previous scanning. Starting signal 16 and finishing signal 17 of measurement can be obtained by this large/small comparison circuit 15 and dimensions of the material to be measured can be measured by using the shifted distance of the material while obtaining the signals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9255380A JPS5717804A (en) | 1980-07-07 | 1980-07-07 | Dimension measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9255380A JPS5717804A (en) | 1980-07-07 | 1980-07-07 | Dimension measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5717804A true JPS5717804A (en) | 1982-01-29 |
Family
ID=14057586
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9255380A Pending JPS5717804A (en) | 1980-07-07 | 1980-07-07 | Dimension measuring method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5717804A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6362647A (en) * | 1986-08-29 | 1988-03-18 | Mitsubishi Electric Corp | Numeric controller |
USRE38025E1 (en) * | 1991-02-22 | 2003-03-11 | Cyberoptics Corporation | High precision component alignment sensor system |
US7746481B2 (en) | 2007-03-20 | 2010-06-29 | Cyberoptics Corporation | Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam |
US8068664B2 (en) | 2007-06-05 | 2011-11-29 | Cyberoptics Corporation | Component sensor for pick and place machine using improved shadow imaging |
-
1980
- 1980-07-07 JP JP9255380A patent/JPS5717804A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6362647A (en) * | 1986-08-29 | 1988-03-18 | Mitsubishi Electric Corp | Numeric controller |
USRE38025E1 (en) * | 1991-02-22 | 2003-03-11 | Cyberoptics Corporation | High precision component alignment sensor system |
US7746481B2 (en) | 2007-03-20 | 2010-06-29 | Cyberoptics Corporation | Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam |
US8068664B2 (en) | 2007-06-05 | 2011-11-29 | Cyberoptics Corporation | Component sensor for pick and place machine using improved shadow imaging |
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