JPS571763B2 - - Google Patents
Info
- Publication number
- JPS571763B2 JPS571763B2 JP10959876A JP10959876A JPS571763B2 JP S571763 B2 JPS571763 B2 JP S571763B2 JP 10959876 A JP10959876 A JP 10959876A JP 10959876 A JP10959876 A JP 10959876A JP S571763 B2 JPS571763 B2 JP S571763B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10959876A JPS5335568A (en) | 1976-09-13 | 1976-09-13 | Measuring method of tool abrasion by light reflection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10959876A JPS5335568A (en) | 1976-09-13 | 1976-09-13 | Measuring method of tool abrasion by light reflection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5335568A JPS5335568A (en) | 1978-04-03 |
| JPS571763B2 true JPS571763B2 (de) | 1982-01-12 |
Family
ID=14514322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10959876A Granted JPS5335568A (en) | 1976-09-13 | 1976-09-13 | Measuring method of tool abrasion by light reflection |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5335568A (de) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6022650A (ja) * | 1984-06-13 | 1985-02-05 | Matsushita Electric Ind Co Ltd | 光学デイスク検査装置 |
| JPH0641911B2 (ja) * | 1989-03-14 | 1994-06-01 | 新技術事業団 | 光断層像画像化装置 |
| JPH0676964B2 (ja) * | 1989-09-26 | 1994-09-28 | 新技術事業団 | 高解像受光系及び該受光系を用いた光断層像画像化装置 |
| JPH0621868B2 (ja) * | 1989-09-26 | 1994-03-23 | 新技術事業団 | ヘテロダイン検波結像系及び該結像系を用いた光断層像画像化装置 |
| KR20070053319A (ko) | 2004-09-08 | 2007-05-23 | 레니쇼우 피엘씨 | 검출 장치 및 방법 |
| GB0625387D0 (en) | 2006-12-21 | 2007-01-31 | Renishaw Plc | Object detector and method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5149779A (ja) * | 1974-10-28 | 1976-04-30 | Canon Kk | Butsutairyobuketsukankensahoho |
-
1976
- 1976-09-13 JP JP10959876A patent/JPS5335568A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5149779A (ja) * | 1974-10-28 | 1976-04-30 | Canon Kk | Butsutairyobuketsukankensahoho |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5335568A (en) | 1978-04-03 |