JPS57160054A - Flaw detector - Google Patents

Flaw detector

Info

Publication number
JPS57160054A
JPS57160054A JP4483481A JP4483481A JPS57160054A JP S57160054 A JPS57160054 A JP S57160054A JP 4483481 A JP4483481 A JP 4483481A JP 4483481 A JP4483481 A JP 4483481A JP S57160054 A JPS57160054 A JP S57160054A
Authority
JP
Japan
Prior art keywords
defect
potential distribution
worked
inspected
change
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4483481A
Other languages
Japanese (ja)
Inventor
Tetsuya Hirota
Tatsuo Hiroshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP4483481A priority Critical patent/JPS57160054A/en
Publication of JPS57160054A publication Critical patent/JPS57160054A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PURPOSE:To detect flaw on the surface of a material to be inspected regardless of the condition of the surface and of whether the material is cold-worked or hot-worked by covering the surface with electric current to produce uniform electric potential distribution and measuring change in the potential distribution that develops with a defect on the surface. CONSTITUTION:The potential distribution between points A and B on a material surface has uniform gradient from VA to VB when there is no defect between them. If there is a defect in a material 1 to be inspected, the potential distribution between the points A and B shows a sharp variation at the defect. It becomes possible, therefore, to locate a defect with accuracy on a material to be inspected by detecting sudden change in the gradient of potential distribution and to detect a defect with accuracy regardless of whether it is cold-owrked or hot- worked and without much influence of the surface by investigating the extent of the change.
JP4483481A 1981-03-27 1981-03-27 Flaw detector Pending JPS57160054A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4483481A JPS57160054A (en) 1981-03-27 1981-03-27 Flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4483481A JPS57160054A (en) 1981-03-27 1981-03-27 Flaw detector

Publications (1)

Publication Number Publication Date
JPS57160054A true JPS57160054A (en) 1982-10-02

Family

ID=12702490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4483481A Pending JPS57160054A (en) 1981-03-27 1981-03-27 Flaw detector

Country Status (1)

Country Link
JP (1) JPS57160054A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60501475A (en) * 1983-05-31 1985-09-05 アメリカン テレフオン アンド テレグラフ カムパニ− Precision non-destructive testing of metals
WO1988002857A1 (en) * 1986-10-20 1988-04-21 Hitachi, Ltd. Surface defect inspection method and surface defect inspection apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55143426A (en) * 1979-04-26 1980-11-08 Hitachi Ltd Supervising method for life consumption of steam valve casing

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55143426A (en) * 1979-04-26 1980-11-08 Hitachi Ltd Supervising method for life consumption of steam valve casing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60501475A (en) * 1983-05-31 1985-09-05 アメリカン テレフオン アンド テレグラフ カムパニ− Precision non-destructive testing of metals
WO1988002857A1 (en) * 1986-10-20 1988-04-21 Hitachi, Ltd. Surface defect inspection method and surface defect inspection apparatus

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