JPS5713343A - Manufacture of glass bead specimen for fluorescent x-ray analysis - Google Patents
Manufacture of glass bead specimen for fluorescent x-ray analysisInfo
- Publication number
- JPS5713343A JPS5713343A JP8780780A JP8780780A JPS5713343A JP S5713343 A JPS5713343 A JP S5713343A JP 8780780 A JP8780780 A JP 8780780A JP 8780780 A JP8780780 A JP 8780780A JP S5713343 A JPS5713343 A JP S5713343A
- Authority
- JP
- Japan
- Prior art keywords
- melting
- specimen
- manufacture
- conducted
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To manufacture a specimen durable against long-term preservation and capable of fixing even light elements such as sulfur by providing a method wherein the melting is effected in two separate stages using sodium borate and lithium borate by amounts greater than respective predetermined amounts as the melting agents. CONSTITUTION:A mixture is formed by adding at least two weight parts of sodium borate to one weight part of inorganic powder as the anaylsis specimen. Then, a firtst stage of melting is conducted for 3-7min at firtst stage of melting is conducted for 3-7min at temperatures 850-950 deg.C. Subsequently, after adding at least two weight parts of lithium borate, the second stage of melting is conducted for 7- 15min at 950-1,050 deg.C. The total amount of sodium borate and lithium borate is 8-15wt%.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8780780A JPS5713343A (en) | 1980-06-30 | 1980-06-30 | Manufacture of glass bead specimen for fluorescent x-ray analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8780780A JPS5713343A (en) | 1980-06-30 | 1980-06-30 | Manufacture of glass bead specimen for fluorescent x-ray analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5713343A true JPS5713343A (en) | 1982-01-23 |
Family
ID=13925241
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8780780A Pending JPS5713343A (en) | 1980-06-30 | 1980-06-30 | Manufacture of glass bead specimen for fluorescent x-ray analysis |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5713343A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0306276A2 (en) * | 1987-08-31 | 1989-03-08 | Ngk Insulators, Ltd. | Method and apparatus for vitrifying and analysing powdery and granular materials |
JPH02218947A (en) * | 1989-02-20 | 1990-08-31 | Ngk Insulators Ltd | Standard sample for analyzing element |
CN104237277A (en) * | 2014-08-29 | 2014-12-24 | 无锡英普林纳米科技有限公司 | Method for analyzing minor elements in geological sample by utilizing X-fluorescent spectrum |
CN104267054A (en) * | 2014-08-29 | 2015-01-07 | 无锡英普林纳米科技有限公司 | Method for analyzing main elements in geological sample by utilizing X-fluorescence spectrum |
-
1980
- 1980-06-30 JP JP8780780A patent/JPS5713343A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0306276A2 (en) * | 1987-08-31 | 1989-03-08 | Ngk Insulators, Ltd. | Method and apparatus for vitrifying and analysing powdery and granular materials |
JPH02218947A (en) * | 1989-02-20 | 1990-08-31 | Ngk Insulators Ltd | Standard sample for analyzing element |
CN104237277A (en) * | 2014-08-29 | 2014-12-24 | 无锡英普林纳米科技有限公司 | Method for analyzing minor elements in geological sample by utilizing X-fluorescent spectrum |
CN104267054A (en) * | 2014-08-29 | 2015-01-07 | 无锡英普林纳米科技有限公司 | Method for analyzing main elements in geological sample by utilizing X-fluorescence spectrum |
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