JPS5669843A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5669843A
JPS5669843A JP14523579A JP14523579A JPS5669843A JP S5669843 A JPS5669843 A JP S5669843A JP 14523579 A JP14523579 A JP 14523579A JP 14523579 A JP14523579 A JP 14523579A JP S5669843 A JPS5669843 A JP S5669843A
Authority
JP
Japan
Prior art keywords
layer
window
deposited
electrode wiring
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14523579A
Other languages
Japanese (ja)
Inventor
Ryoji Abe
Chuichi Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14523579A priority Critical patent/JPS5669843A/en
Publication of JPS5669843A publication Critical patent/JPS5669843A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To flatten the surface of the electrode wiring layer, by forming an insulation layer having an electrode contacting window on a semiconductor substrate, depositing a metal layer on all the surface, performing ion etching with the substrate being rotated, and remaining the metal layer only in the window. CONSTITUTION:The first insulating film 2 is deposited on the semiconductor substrate 1, the electrode contacting window is provided, and the first metal electrode wiring layer 3 is deposited on all the surface including said window. Then, the ion beam is irradiated from the oblique direction with the substrate 1 being rotated, and the layer 3 is etched. The layer 3 is remained only in the part of the contact window, and the other part of the layer 3 is removed. Then, the second insulating film 4 is deposited on all the surface, a resist mask 5 having an opening hole is provided on the region corresponding to the layer 3, and an electrode contacting window 4A is provided by etching. Thereafter the second metal electrode wiring layer 6 is deposited on all the surface, the same etching is performed, the layer 6 is remained only on the layer 3, the third electrode wiring 7 is formed, so that it is contacted with the layer 6, extended over the film 4, and contacted with the layer 3 via the layer 6.
JP14523579A 1979-11-09 1979-11-09 Manufacture of semiconductor device Pending JPS5669843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14523579A JPS5669843A (en) 1979-11-09 1979-11-09 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14523579A JPS5669843A (en) 1979-11-09 1979-11-09 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5669843A true JPS5669843A (en) 1981-06-11

Family

ID=15380453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14523579A Pending JPS5669843A (en) 1979-11-09 1979-11-09 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5669843A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5717148A (en) * 1980-07-04 1982-01-28 Sony Corp Manufacture of semiconductor device
JPS5882536A (en) * 1981-11-10 1983-05-18 Fujitsu Ltd Preparation of semiconductor device
US4592802A (en) * 1984-04-13 1986-06-03 Societe Pour L'etude et la Fabrication des Circuits Integres Speciaux E.F.C.I.S. Method of fabrication of aluminum contacts through a thick insulating layer in an integrated circuit
JPH01225122A (en) * 1988-03-04 1989-09-08 Toshiba Corp Manufacture of semiconductor device
JPH0774146A (en) * 1990-02-09 1995-03-17 Applied Materials Inc Improved flattening method of integrated circuit structure using low-melting point inorganic material
US6350676B1 (en) 1991-11-22 2002-02-26 Sgs-Thomson Microelectronics, S.R.L. Method of forming high-stability metallic contacts in an integrated circuit with one or more metallized layers

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5717148A (en) * 1980-07-04 1982-01-28 Sony Corp Manufacture of semiconductor device
JPS5882536A (en) * 1981-11-10 1983-05-18 Fujitsu Ltd Preparation of semiconductor device
JPH0118582B2 (en) * 1981-11-10 1989-04-06 Fujitsu Ltd
US4592802A (en) * 1984-04-13 1986-06-03 Societe Pour L'etude et la Fabrication des Circuits Integres Speciaux E.F.C.I.S. Method of fabrication of aluminum contacts through a thick insulating layer in an integrated circuit
JPH01225122A (en) * 1988-03-04 1989-09-08 Toshiba Corp Manufacture of semiconductor device
JPH0774146A (en) * 1990-02-09 1995-03-17 Applied Materials Inc Improved flattening method of integrated circuit structure using low-melting point inorganic material
US6350676B1 (en) 1991-11-22 2002-02-26 Sgs-Thomson Microelectronics, S.R.L. Method of forming high-stability metallic contacts in an integrated circuit with one or more metallized layers

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