JPS5647169A - Electron beam deflector - Google Patents

Electron beam deflector

Info

Publication number
JPS5647169A
JPS5647169A JP12335679A JP12335679A JPS5647169A JP S5647169 A JPS5647169 A JP S5647169A JP 12335679 A JP12335679 A JP 12335679A JP 12335679 A JP12335679 A JP 12335679A JP S5647169 A JPS5647169 A JP S5647169A
Authority
JP
Japan
Prior art keywords
deflecting
coil
signal
scanning
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12335679A
Other languages
Japanese (ja)
Inventor
Naoki Date
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP12335679A priority Critical patent/JPS5647169A/en
Publication of JPS5647169A publication Critical patent/JPS5647169A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/16Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by deflecting electron beam in cathode-ray tube, e.g. scanning corrections
    • H04N3/22Circuits for controlling dimensions, shape or centering of picture on screen

Abstract

PURPOSE:To make it possible to display an accurate image while maintaining constant deflecting-coil current, by adjusting the variation width of a deflecting signal voltage applied to the deflecting coil of a cathode-ray tube in combination with an adjustment of the frequency of a scanning deflecting signal. CONSTITUTION:Circuit 1, generating a scanning signal of a desired frequency with a control signal from frequency control circuit 4, inputs a scanning signal to the electron-beam deflecting electric power source of the electron microscope via terminal P and also inputs the scanning signal to deflecting coil 3 of the cathode-ray tube for displaying a sample scanning image of the electron microscope via other terminal Q. Deflecting coil 3 is provided with resistance groups R51-R5n and R31- R3n which can selectively be connected and when the frequency of the scanning signal is changed over, those resistances can selectively be connected. Even when the voltage applied to coil 3 varies, the current is kept constant through those resistances.
JP12335679A 1979-09-26 1979-09-26 Electron beam deflector Pending JPS5647169A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12335679A JPS5647169A (en) 1979-09-26 1979-09-26 Electron beam deflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12335679A JPS5647169A (en) 1979-09-26 1979-09-26 Electron beam deflector

Publications (1)

Publication Number Publication Date
JPS5647169A true JPS5647169A (en) 1981-04-28

Family

ID=14858544

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12335679A Pending JPS5647169A (en) 1979-09-26 1979-09-26 Electron beam deflector

Country Status (1)

Country Link
JP (1) JPS5647169A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57205951A (en) * 1981-06-10 1982-12-17 Jeol Ltd Multiplying-factor controlling device for scanning electron microscope or the like
JPS5986142A (en) * 1982-11-05 1984-05-18 Jeol Ltd Electron beam deflection circuit
JPS60100348A (en) * 1983-11-05 1985-06-04 Jeol Ltd Deflecting device for charged particle beam
US5475897A (en) * 1992-12-11 1995-12-19 Mitsubishi Steel Mfg. Co., Ltd. Car door hinge

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52147013A (en) * 1976-06-01 1977-12-07 Victor Co Of Japan Ltd Oscillating frequency and voltage switching circuit in picture tube deflecting circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52147013A (en) * 1976-06-01 1977-12-07 Victor Co Of Japan Ltd Oscillating frequency and voltage switching circuit in picture tube deflecting circuit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57205951A (en) * 1981-06-10 1982-12-17 Jeol Ltd Multiplying-factor controlling device for scanning electron microscope or the like
JPS5986142A (en) * 1982-11-05 1984-05-18 Jeol Ltd Electron beam deflection circuit
JPS60100348A (en) * 1983-11-05 1985-06-04 Jeol Ltd Deflecting device for charged particle beam
US5475897A (en) * 1992-12-11 1995-12-19 Mitsubishi Steel Mfg. Co., Ltd. Car door hinge

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