JPS5626248A - Observing device for x-ray kossel diffraction pattern - Google Patents

Observing device for x-ray kossel diffraction pattern

Info

Publication number
JPS5626248A
JPS5626248A JP10246479A JP10246479A JPS5626248A JP S5626248 A JPS5626248 A JP S5626248A JP 10246479 A JP10246479 A JP 10246479A JP 10246479 A JP10246479 A JP 10246479A JP S5626248 A JPS5626248 A JP S5626248A
Authority
JP
Japan
Prior art keywords
memory
kossel
kossel pattern
ray
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10246479A
Other languages
Japanese (ja)
Inventor
Masao Iguchi
Hiroshi Shimizu
Hiroshi Shimanaka
Kazuo Koyanagi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Shimadzu Corp
Original Assignee
Shimadzu Corp
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Kawasaki Steel Corp filed Critical Shimadzu Corp
Priority to JP10246479A priority Critical patent/JPS5626248A/en
Publication of JPS5626248A publication Critical patent/JPS5626248A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To obtain immediately the result of observation of a Kossel pattern, by storing the electric signal of observation of the Kossel pattern into the memory to increase the image contrast and then giving a process to the signal read out of the memory. CONSTITUTION:Sample 4 forms a Kossel pattern on image screen 51 of X-ray image intensifier 5 by the impulse of the electron beam radiated from electronic gun 1. The output of intensifier 5 is converted into the digital signal via an A/D converter and then stored in image memory 6. Thus the contrast of the Kossel pattern is increased at memory 6. The storage of memory 6 is read by computer 7, and then, e.g., the curvature of the curve of the Kossel pattern is calculated. At the same time, the signal read out is converted into the analog signal. Then the Kossel pattern is displayed through display cathode-ray tube 8.
JP10246479A 1979-08-10 1979-08-10 Observing device for x-ray kossel diffraction pattern Pending JPS5626248A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10246479A JPS5626248A (en) 1979-08-10 1979-08-10 Observing device for x-ray kossel diffraction pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10246479A JPS5626248A (en) 1979-08-10 1979-08-10 Observing device for x-ray kossel diffraction pattern

Publications (1)

Publication Number Publication Date
JPS5626248A true JPS5626248A (en) 1981-03-13

Family

ID=14328170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10246479A Pending JPS5626248A (en) 1979-08-10 1979-08-10 Observing device for x-ray kossel diffraction pattern

Country Status (1)

Country Link
JP (1) JPS5626248A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60202124A (en) * 1984-02-27 1985-10-12 ゼネラル・エレクトリツク・カンパニイ Silicone rubber continuous manufacture
JPS62222149A (en) * 1986-03-25 1987-09-30 Hitachi Ltd Microregion crystal analyzer
JPH01166451A (en) * 1987-12-23 1989-06-30 Kawasaki Steel Corp Minute direction analyzer
JPH01166453A (en) * 1987-12-23 1989-06-30 Kawasaki Steel Corp Observation device for kossel image
JPH05170910A (en) * 1991-12-25 1993-07-09 Shin Etsu Chem Co Ltd Production of silicone oil
US6433122B1 (en) 1999-11-25 2002-08-13 Dow Corning Toray Silicone Co., Ltd. method for producing organopolysiloxane

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4882884A (en) * 1972-01-18 1973-11-06
JPS4883728A (en) * 1972-02-08 1973-11-08
JPS508634A (en) * 1973-06-01 1975-01-29
JPS5249993A (en) * 1975-10-20 1977-04-21 Matsushita Electric Ind Co Ltd Ferrite catalysts

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4882884A (en) * 1972-01-18 1973-11-06
JPS4883728A (en) * 1972-02-08 1973-11-08
JPS508634A (en) * 1973-06-01 1975-01-29
JPS5249993A (en) * 1975-10-20 1977-04-21 Matsushita Electric Ind Co Ltd Ferrite catalysts

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60202124A (en) * 1984-02-27 1985-10-12 ゼネラル・エレクトリツク・カンパニイ Silicone rubber continuous manufacture
JPH0319250B2 (en) * 1984-02-27 1991-03-14 Gen Electric
JPS62222149A (en) * 1986-03-25 1987-09-30 Hitachi Ltd Microregion crystal analyzer
JPH01166451A (en) * 1987-12-23 1989-06-30 Kawasaki Steel Corp Minute direction analyzer
JPH01166453A (en) * 1987-12-23 1989-06-30 Kawasaki Steel Corp Observation device for kossel image
JPH05170910A (en) * 1991-12-25 1993-07-09 Shin Etsu Chem Co Ltd Production of silicone oil
JP2579710B2 (en) * 1991-12-25 1997-02-12 信越化学工業株式会社 Silicone oil production method
US6433122B1 (en) 1999-11-25 2002-08-13 Dow Corning Toray Silicone Co., Ltd. method for producing organopolysiloxane

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