JPS5625648B2 - - Google Patents

Info

Publication number
JPS5625648B2
JPS5625648B2 JP4100073A JP4100073A JPS5625648B2 JP S5625648 B2 JPS5625648 B2 JP S5625648B2 JP 4100073 A JP4100073 A JP 4100073A JP 4100073 A JP4100073 A JP 4100073A JP S5625648 B2 JPS5625648 B2 JP S5625648B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4100073A
Other versions
JPS49129530A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4100073A priority Critical patent/JPS5625648B2/ja
Priority to US05/459,219 priority patent/US3937950A/en
Priority to FR7412644A priority patent/FR2225760B1/fr
Priority to DE19742417854 priority patent/DE2417854C3/de
Publication of JPS49129530A publication Critical patent/JPS49129530A/ja
Publication of JPS5625648B2 publication Critical patent/JPS5625648B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Automatic Focus Adjustment (AREA)
  • Focusing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP4100073A 1973-04-11 1973-04-11 Expired JPS5625648B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11
US05/459,219 US3937950A (en) 1973-04-11 1974-04-08 Focus defecting system
FR7412644A FR2225760B1 (ja) 1973-04-11 1974-04-10
DE19742417854 DE2417854C3 (de) 1973-04-11 1974-04-11 Automatische Scharfeinstelleinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4100073A JPS5625648B2 (ja) 1973-04-11 1973-04-11

Publications (2)

Publication Number Publication Date
JPS49129530A JPS49129530A (ja) 1974-12-11
JPS5625648B2 true JPS5625648B2 (ja) 1981-06-13

Family

ID=12596130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4100073A Expired JPS5625648B2 (ja) 1973-04-11 1973-04-11

Country Status (3)

Country Link
US (1) US3937950A (ja)
JP (1) JPS5625648B2 (ja)
FR (1) FR2225760B1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62187959U (ja) * 1986-05-22 1987-11-30
JPH0519264Y2 (ja) * 1986-05-21 1993-05-20

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2406045C2 (de) * 1974-02-08 1983-03-17 Canon Inc., Tokyo Anordnung, bestehend aus wenigstens zwei fotoelektrischen Wandlerelementen
DE2410681A1 (de) * 1974-03-06 1975-09-11 Agfa Gevaert Ag Automatische fokussiervorrichtung
JPS5811602B2 (ja) * 1977-10-26 1983-03-03 敏彦 滑川 自動焦点調節装置
US4309603A (en) * 1979-10-17 1982-01-05 Honeywell Inc. Auto focus system
CA2354614C (en) * 2001-07-30 2002-12-10 Silvano Pregara Autofocus sensor
KR101839641B1 (ko) 2011-02-15 2018-03-16 바스프 에스이 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
WO2014097181A1 (en) 2012-12-19 2014-06-26 Basf Se Detector for optically detecting at least one object
CN103217856B (zh) * 2013-05-10 2016-07-06 厦门力鼎光电技术有限公司 一种监控镜头的调焦机构
EP3008757B1 (en) 2013-06-13 2024-05-15 Basf Se Optical detector and method for manufacturing the same
AU2014280332B2 (en) 2013-06-13 2017-09-07 Basf Se Detector for optically detecting at least one object
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
WO2015024871A1 (en) 2013-08-19 2015-02-26 Basf Se Optical detector
CN105637382B (zh) 2013-08-19 2017-08-25 巴斯夫欧洲公司 用于确定至少一种物体的位置的检测器
US11041718B2 (en) 2014-07-08 2021-06-22 Basf Se Detector for determining a position of at least one object
US10094927B2 (en) 2014-09-29 2018-10-09 Basf Se Detector for optically determining a position of at least one object
CN107003785B (zh) 2014-12-09 2020-09-22 巴斯夫欧洲公司 光学检测器
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
JP6877418B2 (ja) 2015-07-17 2021-05-26 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物を光学的に検出するための検出器
US10412283B2 (en) 2015-09-14 2019-09-10 Trinamix Gmbh Dual aperture 3D camera and method using differing aperture areas
EP3491675B1 (en) 2016-07-29 2022-11-16 trinamiX GmbH Optical sensor and detector for optical detection
CN109891265B (zh) 2016-10-25 2023-12-01 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
US10890491B2 (en) 2016-10-25 2021-01-12 Trinamix Gmbh Optical detector for an optical detection
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
KR102623150B1 (ko) 2017-04-20 2024-01-11 트리나미엑스 게엠베하 광 검출기
JP7237024B2 (ja) 2017-06-26 2023-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体の位置を決定するための検出器

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2879405A (en) * 1953-06-29 1959-03-24 Rca Corp Semi-conductor photo-electric devices
US3222531A (en) * 1962-06-26 1965-12-07 Honeywell Inc Solid state junction photopotentiometer
US3193686A (en) * 1963-05-07 1965-07-06 Western Electric Co Photosensitive detectors and methods utilizing photosensitive detectors for positioning articles
DE1913399C3 (de) * 1969-03-17 1974-08-22 Siemens Ag, 1000 Berlin Und 8000 Muenchen Anordnung zur kontinuierlichen Messung von Verschiebungen oder Verformungen mit Hilfe von Laserstrahlen
JPS5618928B2 (ja) * 1971-12-29 1981-05-02

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0519264Y2 (ja) * 1986-05-21 1993-05-20
JPS62187959U (ja) * 1986-05-22 1987-11-30

Also Published As

Publication number Publication date
US3937950A (en) 1976-02-10
DE2417854A1 (de) 1974-10-24
DE2417854B2 (de) 1977-06-08
JPS49129530A (ja) 1974-12-11
FR2225760B1 (ja) 1976-10-08
FR2225760A1 (ja) 1974-11-08

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