JPS562516A - Signal processing method of mtf measuring instrument - Google Patents

Signal processing method of mtf measuring instrument

Info

Publication number
JPS562516A
JPS562516A JP7856979A JP7856979A JPS562516A JP S562516 A JPS562516 A JP S562516A JP 7856979 A JP7856979 A JP 7856979A JP 7856979 A JP7856979 A JP 7856979A JP S562516 A JPS562516 A JP S562516A
Authority
JP
Japan
Prior art keywords
level
white
black
mtf
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7856979A
Other languages
Japanese (ja)
Inventor
Yoshiaki Kamimoto
Nobuo Sakuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP7856979A priority Critical patent/JPS562516A/en
Publication of JPS562516A publication Critical patent/JPS562516A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE:To make it possible to perform MTF calculation of high precision by regarding as the maximum and minimum values of white and black level regions the mean values of signals, obtained as many as a fixed number, from the fixed number on signals of the white and black level regions. CONSTITUTION:A time series of signals from CCD, classified by a threshold level into white-level and black-level regions, is digitized by A/D converter 28 and then stored in RAM30 via input-output port 29. On the basis of the value of RAM30, micro CPU31 performs digital calculation to find mean value (a) of a signal of a few maximum bits of the white level region and mean value (b) of a few approximate minimum bits of the black level region. From the right equation, MTF is calculated, which is carried out by micro CPU31. Here, (a) and (b) stand for the white level and black level of a needed chart, and A and B are a white level and black level close to a zero space frequency. Then, (a), (b), A and B are detected as many as several bits and respective mean values are substituted in the right equation, so that the calculation precision of MTF will further improve.
JP7856979A 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument Pending JPS562516A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7856979A JPS562516A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7856979A JPS562516A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Publications (1)

Publication Number Publication Date
JPS562516A true JPS562516A (en) 1981-01-12

Family

ID=13665518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7856979A Pending JPS562516A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Country Status (1)

Country Link
JP (1) JPS562516A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215528A (en) * 1982-06-10 1983-12-15 Ricoh Co Ltd Focusing display
JPS58215526A (en) * 1982-06-10 1983-12-15 Ricoh Co Ltd Focusing display
US10540795B2 (en) 2015-03-11 2020-01-21 Fujifilm Corporation Image combination apparatus, image combination method, image combination program, and recording medium storing image combination program

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215528A (en) * 1982-06-10 1983-12-15 Ricoh Co Ltd Focusing display
JPS58215526A (en) * 1982-06-10 1983-12-15 Ricoh Co Ltd Focusing display
JPH0368334B2 (en) * 1982-06-10 1991-10-28 Ricoh Kk
US10540795B2 (en) 2015-03-11 2020-01-21 Fujifilm Corporation Image combination apparatus, image combination method, image combination program, and recording medium storing image combination program

Similar Documents

Publication Publication Date Title
JPS5579448A (en) Color separation simulation system
ES2038774T3 (en) NUMERICAL EVALUATION PROCEDURE OF THE FREQUENCY AND OF THE SIGNALS PHASE AND DEVICES FOR CARRYING OUT SUCH A PROCEDURE.
SU1281180A3 (en) Device for eddy current check of article
GB1439035A (en) Method and apparatus for detecting the presence of signal - components of pre-determined frequency in a multi-frequency signal
JPS562516A (en) Signal processing method of mtf measuring instrument
DE69012446D1 (en) Low frequency AC signal detector for a telephone line.
ATE243877T1 (en) APPARATUS AND METHOD FOR DETERMINING A CODING BLOCK GRID OF A DECODED SIGNAL
JPS562524A (en) Signal processing method of mtf measuring instrument
JPS562518A (en) Signal processing method of mtf measuring instrument
JPS562517A (en) Signal processing method of mtf measuring instrument
JPS5569039A (en) Processing systen for flaw detection signal
SU552580A1 (en) Device for measuring signal parameters
JPS5569041A (en) Processing system for digital flaw detection signal
JPS63200074A (en) Frequency analyzing method
JPS556688A (en) Binary level decision circuit
KR100600699B1 (en) The device of operating the square root which is used in the hardware
SU1644184A2 (en) Device for image recognition
JPS5569040A (en) Processing system for flaw detection signal
JPS55164330A (en) Signal deciding circuit in instrumentation control unit
SU1686467A1 (en) Device for filtering of object images
SU1576867A1 (en) Adaptive spectroanalyzer
SU1654757A1 (en) Method and device for determine squall
JPS55121108A (en) Dynamic error correcting method for analog signal
JPS5587901A (en) Measuring system for trolley wire slide face width
JPS5698795A (en) High-speed sample holding and comparing circuit