JPS56168141A - Stress measuring device - Google Patents

Stress measuring device

Info

Publication number
JPS56168141A
JPS56168141A JP7169180A JP7169180A JPS56168141A JP S56168141 A JPS56168141 A JP S56168141A JP 7169180 A JP7169180 A JP 7169180A JP 7169180 A JP7169180 A JP 7169180A JP S56168141 A JPS56168141 A JP S56168141A
Authority
JP
Japan
Prior art keywords
signal
temp
sample
scanning
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7169180A
Other languages
Japanese (ja)
Other versions
JPS6140932B2 (en
Inventor
Akihisa Masuki
Mamoru Irizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP7169180A priority Critical patent/JPS56168141A/en
Publication of JPS56168141A publication Critical patent/JPS56168141A/en
Publication of JPS6140932B2 publication Critical patent/JPS6140932B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/248—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet using infrared

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To obtain precision stress distribution images in a short time by determining the temp. changes based on load changes, mounting a single strain detecting element to a sample to be examined, and performing the correction based on the detected signal. CONSTITUTION:An exciter 1 applies aquare wave load to a sample 4 at prescribed periods, and based on the signal 29 synchronized to the load application, an infrared ray camera 28 makes scanning of one image plane. At this time, the temp. signal Z1 obtained in accordance with the scanning is stored into a memory 35, and the temp. signal Z2 is sent to a substractor 33. A control circuit 36 sends the signal Z1 to the circuit 33 in synchronization with one image plane scanning, and obtains a differential signal, thereby obtaining the distribution image corresponding to stresses on a CRT45. In this case, a strain detecting element 21 is mounted in the sample 4 in the visual field of a camera 28, and the correct stress value in the place of installation is detected by the element 21 and a detecting circuit 22, and a correction coefft. is obtained as the ratio of the detected signal B and the signal A corresponding to the stress obtained by using a camera 28. The measured values of other sections are corrected by this coefft.
JP7169180A 1980-05-29 1980-05-29 Stress measuring device Granted JPS56168141A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7169180A JPS56168141A (en) 1980-05-29 1980-05-29 Stress measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7169180A JPS56168141A (en) 1980-05-29 1980-05-29 Stress measuring device

Publications (2)

Publication Number Publication Date
JPS56168141A true JPS56168141A (en) 1981-12-24
JPS6140932B2 JPS6140932B2 (en) 1986-09-11

Family

ID=13467818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7169180A Granted JPS56168141A (en) 1980-05-29 1980-05-29 Stress measuring device

Country Status (1)

Country Link
JP (1) JPS56168141A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006029963A (en) * 2004-07-15 2006-02-02 Takahide Sakagami Method and device for measuring degree of thermal influence by plastic deformation
JPWO2015140945A1 (en) * 2014-03-19 2017-04-06 株式会社日立製作所 Fatigue testing equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006029963A (en) * 2004-07-15 2006-02-02 Takahide Sakagami Method and device for measuring degree of thermal influence by plastic deformation
JP4610955B2 (en) * 2004-07-15 2011-01-12 ▲隆▼英 阪上 Method and apparatus for measuring thermal influence due to plastic deformation
JPWO2015140945A1 (en) * 2014-03-19 2017-04-06 株式会社日立製作所 Fatigue testing equipment

Also Published As

Publication number Publication date
JPS6140932B2 (en) 1986-09-11

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