JPS561452A - Bending and fatigue testing device for specimen by scanning electron microscope, etc. - Google Patents

Bending and fatigue testing device for specimen by scanning electron microscope, etc.

Info

Publication number
JPS561452A
JPS561452A JP7647179A JP7647179A JPS561452A JP S561452 A JPS561452 A JP S561452A JP 7647179 A JP7647179 A JP 7647179A JP 7647179 A JP7647179 A JP 7647179A JP S561452 A JPS561452 A JP S561452A
Authority
JP
Japan
Prior art keywords
specimen
bending stress
testing device
bending
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7647179A
Other languages
Japanese (ja)
Inventor
Yoichi Shibuki
Kazunari Nakanishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP7647179A priority Critical patent/JPS561452A/en
Publication of JPS561452A publication Critical patent/JPS561452A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To permit the observation of the fatigue condition of a specimen by a method in which a driving bar is reciprocally moved to apply a repeated bending stress to a specimen and then electron rays are scanned. CONSTITUTION:The test specimen 3 is laid and fixed between the specimen supporters 5a and 5b and then a testing device is established in the test room 1. Then, when positive and negative voltages are repeatedly applied to the motor 13 from the power source 15, the driving bar 8 is reciprocally moved from side to side to apply a repeated bending stress to the specimen 3. After applying the bending stress desired times to the specimen, the surface of the specimen 3 is scanned by the electron rays EB in order to observe the fatigue condition of the specimen 3 due to the repeated bending stress applied.
JP7647179A 1979-06-18 1979-06-18 Bending and fatigue testing device for specimen by scanning electron microscope, etc. Pending JPS561452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7647179A JPS561452A (en) 1979-06-18 1979-06-18 Bending and fatigue testing device for specimen by scanning electron microscope, etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7647179A JPS561452A (en) 1979-06-18 1979-06-18 Bending and fatigue testing device for specimen by scanning electron microscope, etc.

Publications (1)

Publication Number Publication Date
JPS561452A true JPS561452A (en) 1981-01-09

Family

ID=13606081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7647179A Pending JPS561452A (en) 1979-06-18 1979-06-18 Bending and fatigue testing device for specimen by scanning electron microscope, etc.

Country Status (1)

Country Link
JP (1) JPS561452A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137547U (en) * 1983-03-04 1984-09-13 株式会社アマダ bending test equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5014270A (en) * 1973-06-06 1975-02-14
JPS5267567A (en) * 1975-12-03 1977-06-04 Hitachi Ltd Test piece processing device of electronic microscope

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5014270A (en) * 1973-06-06 1975-02-14
JPS5267567A (en) * 1975-12-03 1977-06-04 Hitachi Ltd Test piece processing device of electronic microscope

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137547U (en) * 1983-03-04 1984-09-13 株式会社アマダ bending test equipment
JPS6336260Y2 (en) * 1983-03-04 1988-09-27

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