JPS559170A - Surface flaw detector - Google Patents

Surface flaw detector

Info

Publication number
JPS559170A
JPS559170A JP8275478A JP8275478A JPS559170A JP S559170 A JPS559170 A JP S559170A JP 8275478 A JP8275478 A JP 8275478A JP 8275478 A JP8275478 A JP 8275478A JP S559170 A JPS559170 A JP S559170A
Authority
JP
Japan
Prior art keywords
light
wire
reflected
plating
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8275478A
Other languages
Japanese (ja)
Inventor
Shinya Kitami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Original Assignee
Fujikura Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd filed Critical Fujikura Ltd
Priority to JP8275478A priority Critical patent/JPS559170A/en
Publication of JPS559170A publication Critical patent/JPS559170A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To make it possible to detect flaws, projections as well as defects in enamel coating or plating, by arranging at least two sets of detectors consisting of a light projector and a light receiver at different places on a continuously travelling wire. CONSTITUTION:Light projector 2 and light receiver 3, which receives the light reflected from wire 1, are provided at the upper part of continuously travelling wire 1, such as enamel wire or plated wire; and similar light projector 2' and light receiver 3' are at the lower part of the passage. A signal processing circuit of the same structure containing of upper limit comparator 7 and lower limit comparator 8 is connected to the output side of light receiving elements 4 and 4' of light receivers 3 and 3'. By an abnormal increase of reflected light from wire 1, a defect in enamel coating or plating is detected, and by an abnormal decrease of reflected light, a flaw or projection is detected.
JP8275478A 1978-07-07 1978-07-07 Surface flaw detector Pending JPS559170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8275478A JPS559170A (en) 1978-07-07 1978-07-07 Surface flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8275478A JPS559170A (en) 1978-07-07 1978-07-07 Surface flaw detector

Publications (1)

Publication Number Publication Date
JPS559170A true JPS559170A (en) 1980-01-23

Family

ID=13783219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8275478A Pending JPS559170A (en) 1978-07-07 1978-07-07 Surface flaw detector

Country Status (1)

Country Link
JP (1) JPS559170A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57189046A (en) * 1981-05-15 1982-11-20 Mitsubishi Electric Corp Inspecting device for surface defect
JPS6027347U (en) * 1983-07-29 1985-02-23 タツタ電線株式会社 Appearance test device for striatum
US4542296A (en) * 1981-07-23 1985-09-17 Thomassen & Drijver-Verblifa N.V. Method of checking the coating of a metal surface and device for carrying out the same
JPS62186085U (en) * 1986-05-20 1987-11-26
JPH04142413A (en) * 1990-10-03 1992-05-15 Nkk Corp Measuring device for electrodeposited metal projection distribution and continuous measuring method
WO2006115007A1 (en) 2005-04-21 2006-11-02 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method
EP2023655A4 (en) * 2006-05-24 2010-07-28 Pioneer Corp Speaker device
EP2312300A1 (en) * 2008-07-16 2011-04-20 The Furukawa Electric Co., Ltd. Wire surface inspection device
JP2016102724A (en) * 2014-11-28 2016-06-02 日立金属株式会社 Appearance inspection method of flat enameled wire and visual inspection apparatus of flat enameled wire

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57189046A (en) * 1981-05-15 1982-11-20 Mitsubishi Electric Corp Inspecting device for surface defect
JPS6367849B2 (en) * 1981-05-15 1988-12-27 Mitsubishi Electric Corp
US4542296A (en) * 1981-07-23 1985-09-17 Thomassen & Drijver-Verblifa N.V. Method of checking the coating of a metal surface and device for carrying out the same
JPS6027347U (en) * 1983-07-29 1985-02-23 タツタ電線株式会社 Appearance test device for striatum
JPH0429401Y2 (en) * 1983-07-29 1992-07-16
JPS62186085U (en) * 1986-05-20 1987-11-26
JPH04142413A (en) * 1990-10-03 1992-05-15 Nkk Corp Measuring device for electrodeposited metal projection distribution and continuous measuring method
EP1879019A1 (en) * 2005-04-21 2008-01-16 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method
WO2006115007A1 (en) 2005-04-21 2006-11-02 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method
EP1879019A4 (en) * 2005-04-21 2011-12-07 Sumitomo Electric Industries Superconducting wire inspection device and inspection method
EP2461157A3 (en) * 2005-04-21 2017-03-22 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method
EP2023655A4 (en) * 2006-05-24 2010-07-28 Pioneer Corp Speaker device
JP4839370B2 (en) * 2006-05-24 2011-12-21 パイオニア株式会社 Speaker device
EP2312300A1 (en) * 2008-07-16 2011-04-20 The Furukawa Electric Co., Ltd. Wire surface inspection device
EP2312300A4 (en) * 2008-07-16 2011-08-17 Furukawa Electric Co Ltd Wire surface inspection device
JP2016102724A (en) * 2014-11-28 2016-06-02 日立金属株式会社 Appearance inspection method of flat enameled wire and visual inspection apparatus of flat enameled wire

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