JPS5576449A - Fault diagnosis method for signal converter circuit - Google Patents

Fault diagnosis method for signal converter circuit

Info

Publication number
JPS5576449A
JPS5576449A JP14794678A JP14794678A JPS5576449A JP S5576449 A JPS5576449 A JP S5576449A JP 14794678 A JP14794678 A JP 14794678A JP 14794678 A JP14794678 A JP 14794678A JP S5576449 A JPS5576449 A JP S5576449A
Authority
JP
Japan
Prior art keywords
voltage
fault diagnosis
signal
converter circuit
signal converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14794678A
Other languages
Japanese (ja)
Other versions
JPS5855533B2 (en
Inventor
Shuichi Senda
Yoshiyuki Futahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53147946A priority Critical patent/JPS5855533B2/en
Publication of JPS5576449A publication Critical patent/JPS5576449A/en
Publication of JPS5855533B2 publication Critical patent/JPS5855533B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To secure the fault diagnosis for the signal converter circuit through a simple method by varying the reference voltage of the comparator circuit and then securing the same state when the pseudo input signal is applied equivalently.
CONSTITUTION: Voltage veriable setting circuit 100 consists of switch elements 17 and 18, inverter 21 plus resistors R5 and R8, and then varies reference voltage ES of comparator circuits 1aW1n via pseudo input set signal 19 sent from the computer. In other words, the two active states of the external contact are taken into the input terminal of one side of comparators 1aW1n in the form of the scale of the voltage signal, and reference voltage ES set to the middle of the two voltage signals is applied to the input terminal of the other side. Then voltage ES is changed to the voltage level different from the steady state, and the output of the comparator at that time is compared with the data set previously to carry out the fault diagnosis. Thus the state identical to that obtained by applying the pseudo input signal equivalently is secured, ensuring the fault diagnosis for the signal converter circuit through a simple method.
COPYRIGHT: (C)1980,JPO&Japio
JP53147946A 1978-12-01 1978-12-01 Failure diagnosis method for signal conversion circuit Expired JPS5855533B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53147946A JPS5855533B2 (en) 1978-12-01 1978-12-01 Failure diagnosis method for signal conversion circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53147946A JPS5855533B2 (en) 1978-12-01 1978-12-01 Failure diagnosis method for signal conversion circuit

Publications (2)

Publication Number Publication Date
JPS5576449A true JPS5576449A (en) 1980-06-09
JPS5855533B2 JPS5855533B2 (en) 1983-12-10

Family

ID=15441632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53147946A Expired JPS5855533B2 (en) 1978-12-01 1978-12-01 Failure diagnosis method for signal conversion circuit

Country Status (1)

Country Link
JP (1) JPS5855533B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115574854A (en) * 2022-12-05 2023-01-06 泉州昆泰芯微电子科技有限公司 Fault diagnosis circuit device, fault diagnosis method, computer, storage medium, and program

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115574854A (en) * 2022-12-05 2023-01-06 泉州昆泰芯微电子科技有限公司 Fault diagnosis circuit device, fault diagnosis method, computer, storage medium, and program
CN115574854B (en) * 2022-12-05 2023-04-11 泉州昆泰芯微电子科技有限公司 Fault diagnosis circuit device, fault diagnosis method, computer, storage medium, and program

Also Published As

Publication number Publication date
JPS5855533B2 (en) 1983-12-10

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