JPS5572808A - Measuring method of radiation thickness gauge - Google Patents

Measuring method of radiation thickness gauge

Info

Publication number
JPS5572808A
JPS5572808A JP14655378A JP14655378A JPS5572808A JP S5572808 A JPS5572808 A JP S5572808A JP 14655378 A JP14655378 A JP 14655378A JP 14655378 A JP14655378 A JP 14655378A JP S5572808 A JPS5572808 A JP S5572808A
Authority
JP
Japan
Prior art keywords
thickness
equation
arithmetic
counting
measurements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14655378A
Other languages
Japanese (ja)
Inventor
Shoichi Horiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14655378A priority Critical patent/JPS5572808A/en
Publication of JPS5572808A publication Critical patent/JPS5572808A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE: To improve instrumentation precision by making linear the relation between a counting rate output and thickness by logarithmic processing after correcting, obtained by measurements of a thickness-zero state and measured body, by using a fixed equation.
CONSTITUTION: Counting rates IO' and IO at the time of measurements of a thickness-zero state and measured body are inputted to correcting arithmetic part 18 of processing circuit 8, where they are corrected by arithmetic based upon equation (I) to obtain real counting rates IO and I so that the thickness-counting rate characteristic will be an exponential function, and logarithm conversion parts 19 and 20 provide logarithm conversion to obtain the linear relation between the thickness and counting rates. Next, subtraction part 21 carries out difference arithmetic as to the parenthesis part on the right side of equation (II) and multiplication part 24 calculates thickness (t) based on equation (II) with high precision according to known constants such as absorption coefficient (μ). Here, multiplication part 24 also makes corrections of density according to a measured temperature.
COPYRIGHT: (C)1980,JPO&Japio
JP14655378A 1978-11-29 1978-11-29 Measuring method of radiation thickness gauge Pending JPS5572808A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14655378A JPS5572808A (en) 1978-11-29 1978-11-29 Measuring method of radiation thickness gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14655378A JPS5572808A (en) 1978-11-29 1978-11-29 Measuring method of radiation thickness gauge

Publications (1)

Publication Number Publication Date
JPS5572808A true JPS5572808A (en) 1980-06-02

Family

ID=15410257

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14655378A Pending JPS5572808A (en) 1978-11-29 1978-11-29 Measuring method of radiation thickness gauge

Country Status (1)

Country Link
JP (1) JPS5572808A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105486252A (en) * 2014-09-19 2016-04-13 鞍钢股份有限公司 Aluminum-zinc-plated layer thickness measurement compensation method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105486252A (en) * 2014-09-19 2016-04-13 鞍钢股份有限公司 Aluminum-zinc-plated layer thickness measurement compensation method

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