JPS5572808A - Measuring method of radiation thickness gauge - Google Patents
Measuring method of radiation thickness gaugeInfo
- Publication number
- JPS5572808A JPS5572808A JP14655378A JP14655378A JPS5572808A JP S5572808 A JPS5572808 A JP S5572808A JP 14655378 A JP14655378 A JP 14655378A JP 14655378 A JP14655378 A JP 14655378A JP S5572808 A JPS5572808 A JP S5572808A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- equation
- arithmetic
- counting
- measurements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE: To improve instrumentation precision by making linear the relation between a counting rate output and thickness by logarithmic processing after correcting, obtained by measurements of a thickness-zero state and measured body, by using a fixed equation.
CONSTITUTION: Counting rates IO' and IO at the time of measurements of a thickness-zero state and measured body are inputted to correcting arithmetic part 18 of processing circuit 8, where they are corrected by arithmetic based upon equation (I) to obtain real counting rates IO and I so that the thickness-counting rate characteristic will be an exponential function, and logarithm conversion parts 19 and 20 provide logarithm conversion to obtain the linear relation between the thickness and counting rates. Next, subtraction part 21 carries out difference arithmetic as to the parenthesis part on the right side of equation (II) and multiplication part 24 calculates thickness (t) based on equation (II) with high precision according to known constants such as absorption coefficient (μ). Here, multiplication part 24 also makes corrections of density according to a measured temperature.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14655378A JPS5572808A (en) | 1978-11-29 | 1978-11-29 | Measuring method of radiation thickness gauge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14655378A JPS5572808A (en) | 1978-11-29 | 1978-11-29 | Measuring method of radiation thickness gauge |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5572808A true JPS5572808A (en) | 1980-06-02 |
Family
ID=15410257
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14655378A Pending JPS5572808A (en) | 1978-11-29 | 1978-11-29 | Measuring method of radiation thickness gauge |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5572808A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105486252A (en) * | 2014-09-19 | 2016-04-13 | 鞍钢股份有限公司 | Aluminum-zinc-plated layer thickness measurement compensation method |
-
1978
- 1978-11-29 JP JP14655378A patent/JPS5572808A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105486252A (en) * | 2014-09-19 | 2016-04-13 | 鞍钢股份有限公司 | Aluminum-zinc-plated layer thickness measurement compensation method |
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