JPS5570757A - Logical test unit for integrated circuit - Google Patents
Logical test unit for integrated circuitInfo
- Publication number
- JPS5570757A JPS5570757A JP14355778A JP14355778A JPS5570757A JP S5570757 A JPS5570757 A JP S5570757A JP 14355778 A JP14355778 A JP 14355778A JP 14355778 A JP14355778 A JP 14355778A JP S5570757 A JPS5570757 A JP S5570757A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- cpu1
- circuit
- skew
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Dc Digital Transmission (AREA)
Abstract
PURPOSE: To automatically perform skew correction for test signal based on the data, by comparing the test signal fed to the tested IC with the reference signal and calculating and storing the data for required correction for skew correction with CPU.
CONSTITUTION: After the test signal d delivered from the pattern generator in CPU1 is received at the line receiver circuit 14, it is converted into the negative polarity signal e at the pulse polarity conversion circuit 20 and inputted to the leading skew correction circuit 9 and trailing skew correction circuit 10. Further, the reference pulse from the reference pulse forming circuit 19 is compared with the designated reference signal v with the reference pulse designation signal w from CPU1 to discriminate the skew and the skew discrimination designation signal n is fed to CPU1. Thus, the test signal k is fed at the tested ICg and after the logic operation, the output signal p is delivered. Afther this signal p is confirmed for the specified level at the receive pulse discrimination circuit 16, and it is transferred to CPU1 as the discriminated output signal r. This signal is compared with the expected pattern signal at CPU1 to discriminate the propriety of the tested IC8.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14355778A JPS5570757A (en) | 1978-11-22 | 1978-11-22 | Logical test unit for integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14355778A JPS5570757A (en) | 1978-11-22 | 1978-11-22 | Logical test unit for integrated circuit |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63028669A Division JPS63302380A (en) | 1988-02-12 | 1988-02-12 | Logical test apparatus for integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5570757A true JPS5570757A (en) | 1980-05-28 |
JPS6222103B2 JPS6222103B2 (en) | 1987-05-15 |
Family
ID=15341502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14355778A Granted JPS5570757A (en) | 1978-11-22 | 1978-11-22 | Logical test unit for integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5570757A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57111472A (en) * | 1980-12-29 | 1982-07-10 | Advantest Corp | Logical-circuit testing device |
JPS60193356A (en) * | 1984-03-14 | 1985-10-01 | Mitsubishi Electric Corp | Timing compensator for semiconductor inspecting device |
JPS61286768A (en) * | 1985-06-13 | 1986-12-17 | Hitachi Ltd | Test apparatus |
JPS63302380A (en) * | 1988-02-12 | 1988-12-09 | Hitachi Ltd | Logical test apparatus for integrated circuit |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02299908A (en) * | 1989-05-15 | 1990-12-12 | Bridgestone Corp | Pneumatic tire provided with directional tread |
-
1978
- 1978-11-22 JP JP14355778A patent/JPS5570757A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57111472A (en) * | 1980-12-29 | 1982-07-10 | Advantest Corp | Logical-circuit testing device |
JPS60193356A (en) * | 1984-03-14 | 1985-10-01 | Mitsubishi Electric Corp | Timing compensator for semiconductor inspecting device |
JPS61286768A (en) * | 1985-06-13 | 1986-12-17 | Hitachi Ltd | Test apparatus |
JPS63302380A (en) * | 1988-02-12 | 1988-12-09 | Hitachi Ltd | Logical test apparatus for integrated circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS6222103B2 (en) | 1987-05-15 |
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