JPS5552269A - Preparation of semiconductor device - Google Patents

Preparation of semiconductor device

Info

Publication number
JPS5552269A
JPS5552269A JP12555878A JP12555878A JPS5552269A JP S5552269 A JPS5552269 A JP S5552269A JP 12555878 A JP12555878 A JP 12555878A JP 12555878 A JP12555878 A JP 12555878A JP S5552269 A JPS5552269 A JP S5552269A
Authority
JP
Japan
Prior art keywords
silicon
diffusion layers
substrate
layers
gate electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12555878A
Other languages
Japanese (ja)
Inventor
Hideto Goto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP12555878A priority Critical patent/JPS5552269A/en
Publication of JPS5552269A publication Critical patent/JPS5552269A/en
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE: To reduce gate electrode lengths and further reduce the dimensions of connecting parts between diffusion layers and metal wiring by selectively oxidizing polycrystalline silicon to smooth the form of the steps of the plycrystalline silicon.
CONSTITUTION: A gate insulating film 103 is grown on the surface of a semiconductor substrate 101, and then openings 104∼106 are formed. Next, a polycrysalline silicon layer 107 and silicon nitride film layers 108∼111 are formed. Next, by heat-treating the silicon substrate 101 in a high temperature oxidizing atmosphere after N-type source and drain diffusion layers 112∼114 are formed, the polycrystalline layer 107 is changed into a silicon oxide layer, and further, a gate electrode 119 and conductor layers 120 and 121 which connect electrically with the source and the drain diffusion layers 112 and 113 are formed. At the same time, phosphor is diffused into the substrate 101 through the openins 104∼106 and diffusion layers 116∼ 118 of high impurity concentration are formed. Next, the substrate is heat-treated and then metal wirings 123 and 124 are formed.
COPYRIGHT: (C)1980,JPO&Japio
JP12555878A 1978-10-11 1978-10-11 Preparation of semiconductor device Pending JPS5552269A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12555878A JPS5552269A (en) 1978-10-11 1978-10-11 Preparation of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12555878A JPS5552269A (en) 1978-10-11 1978-10-11 Preparation of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5552269A true JPS5552269A (en) 1980-04-16

Family

ID=14913161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12555878A Pending JPS5552269A (en) 1978-10-11 1978-10-11 Preparation of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5552269A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5284981A (en) * 1976-01-06 1977-07-14 Mitsubishi Electric Corp Production of insulated gate type semiconductor device
JPS534480A (en) * 1976-07-02 1978-01-17 Nippon Telegr & Teleph Corp <Ntt> Production of semiconductor device having mis transistors
JPS5320776A (en) * 1976-08-10 1978-02-25 Mitsubishi Electric Corp Production of metal insulation film semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5284981A (en) * 1976-01-06 1977-07-14 Mitsubishi Electric Corp Production of insulated gate type semiconductor device
JPS534480A (en) * 1976-07-02 1978-01-17 Nippon Telegr & Teleph Corp <Ntt> Production of semiconductor device having mis transistors
JPS5320776A (en) * 1976-08-10 1978-02-25 Mitsubishi Electric Corp Production of metal insulation film semiconductor device

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