JPS5543411A - Spectrophotometer - Google Patents
SpectrophotometerInfo
- Publication number
- JPS5543411A JPS5543411A JP11591078A JP11591078A JPS5543411A JP S5543411 A JPS5543411 A JP S5543411A JP 11591078 A JP11591078 A JP 11591078A JP 11591078 A JP11591078 A JP 11591078A JP S5543411 A JPS5543411 A JP S5543411A
- Authority
- JP
- Japan
- Prior art keywords
- wave length
- error
- lambda1
- correction
- lambda2
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000149 argon plasma sintering Methods 0.000 abstract 1
- 230000006870 function Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/06—Scanning arrangements arrangements for order-selection
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To amend the error in case the error in wave length and display constantly the correct wave length by providing a photometer having a wave length driving mechanism applying a rotating angle corresponding to the wave length to the rotating stand on which the light scattering member. CONSTITUTION:The light from the light source 6 is passes through the detector 7, the amplifier 8, 9 and made as a light measuring output. The diffraction grating 2 is mounted on the rotating stand 1 and is given a rotating angle by a sign bar mechanism. The photometer is set at the check mode, so that a filter 12 most suitable for the correction of the first wave length lambda1 namely the correction of the wave length lambda1 is selected and the energy peak of the wave length lambda1 is obtained to be memorized in the memory M2. The next wave length lambda2 is also corrected and at this time, the actual pulse number has error of f(lambda1)-f(lambda2) with respect to the pulse number equivalent to lambda1-lambda2 and it is memorized in the memory 14(M2). Said true wave length and the error value are operated 15 and memorized. The pulse of the pulse generator 17 is also transmitted to the error corrector 16 and in the correction formula, the wave length value in which the error in wave length computed from the equivalent error correction function is subtracted is indicated 18.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11591078A JPS5543411A (en) | 1978-09-22 | 1978-09-22 | Spectrophotometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11591078A JPS5543411A (en) | 1978-09-22 | 1978-09-22 | Spectrophotometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5543411A true JPS5543411A (en) | 1980-03-27 |
Family
ID=14674229
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11591078A Pending JPS5543411A (en) | 1978-09-22 | 1978-09-22 | Spectrophotometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5543411A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59176633A (en) * | 1983-03-25 | 1984-10-06 | Shimadzu Corp | Grating spectrophotometer |
JPS62180229A (en) * | 1986-02-05 | 1987-08-07 | Japan Spectroscopic Co | Initialization device for wavelength or the like of spectroscope |
JPS62226024A (en) * | 1986-03-28 | 1987-10-05 | Matsushita Electric Ind Co Ltd | Spectroscope |
JPH02201124A (en) * | 1989-01-28 | 1990-08-09 | Shimadzu Corp | Spectrophotometer |
WO1996026414A1 (en) * | 1995-02-24 | 1996-08-29 | Anritsu Corporation | Device for detecting angle of rotation of diffraction grating |
JP2018009857A (en) * | 2016-07-13 | 2018-01-18 | 株式会社島津製作所 | Wavelength calibration method and spectrophotometer using wavelength calibration method |
-
1978
- 1978-09-22 JP JP11591078A patent/JPS5543411A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59176633A (en) * | 1983-03-25 | 1984-10-06 | Shimadzu Corp | Grating spectrophotometer |
JPH0434088B2 (en) * | 1983-03-25 | 1992-06-04 | Shimadzu Corp | |
JPS62180229A (en) * | 1986-02-05 | 1987-08-07 | Japan Spectroscopic Co | Initialization device for wavelength or the like of spectroscope |
JPS62226024A (en) * | 1986-03-28 | 1987-10-05 | Matsushita Electric Ind Co Ltd | Spectroscope |
JPH02201124A (en) * | 1989-01-28 | 1990-08-09 | Shimadzu Corp | Spectrophotometer |
WO1996026414A1 (en) * | 1995-02-24 | 1996-08-29 | Anritsu Corporation | Device for detecting angle of rotation of diffraction grating |
US5828061A (en) * | 1995-02-24 | 1998-10-27 | Anritsu Corporation | Apparatus for detecting a rotation angle of a diffraction grating |
JP2018009857A (en) * | 2016-07-13 | 2018-01-18 | 株式会社島津製作所 | Wavelength calibration method and spectrophotometer using wavelength calibration method |
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