JPS5543411A - Spectrophotometer - Google Patents

Spectrophotometer

Info

Publication number
JPS5543411A
JPS5543411A JP11591078A JP11591078A JPS5543411A JP S5543411 A JPS5543411 A JP S5543411A JP 11591078 A JP11591078 A JP 11591078A JP 11591078 A JP11591078 A JP 11591078A JP S5543411 A JPS5543411 A JP S5543411A
Authority
JP
Japan
Prior art keywords
wave length
error
lambda1
correction
lambda2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11591078A
Other languages
Japanese (ja)
Inventor
Yoshio Toyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11591078A priority Critical patent/JPS5543411A/en
Publication of JPS5543411A publication Critical patent/JPS5543411A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To amend the error in case the error in wave length and display constantly the correct wave length by providing a photometer having a wave length driving mechanism applying a rotating angle corresponding to the wave length to the rotating stand on which the light scattering member. CONSTITUTION:The light from the light source 6 is passes through the detector 7, the amplifier 8, 9 and made as a light measuring output. The diffraction grating 2 is mounted on the rotating stand 1 and is given a rotating angle by a sign bar mechanism. The photometer is set at the check mode, so that a filter 12 most suitable for the correction of the first wave length lambda1 namely the correction of the wave length lambda1 is selected and the energy peak of the wave length lambda1 is obtained to be memorized in the memory M2. The next wave length lambda2 is also corrected and at this time, the actual pulse number has error of f(lambda1)-f(lambda2) with respect to the pulse number equivalent to lambda1-lambda2 and it is memorized in the memory 14(M2). Said true wave length and the error value are operated 15 and memorized. The pulse of the pulse generator 17 is also transmitted to the error corrector 16 and in the correction formula, the wave length value in which the error in wave length computed from the equivalent error correction function is subtracted is indicated 18.
JP11591078A 1978-09-22 1978-09-22 Spectrophotometer Pending JPS5543411A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11591078A JPS5543411A (en) 1978-09-22 1978-09-22 Spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11591078A JPS5543411A (en) 1978-09-22 1978-09-22 Spectrophotometer

Publications (1)

Publication Number Publication Date
JPS5543411A true JPS5543411A (en) 1980-03-27

Family

ID=14674229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11591078A Pending JPS5543411A (en) 1978-09-22 1978-09-22 Spectrophotometer

Country Status (1)

Country Link
JP (1) JPS5543411A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176633A (en) * 1983-03-25 1984-10-06 Shimadzu Corp Grating spectrophotometer
JPS62180229A (en) * 1986-02-05 1987-08-07 Japan Spectroscopic Co Initialization device for wavelength or the like of spectroscope
JPS62226024A (en) * 1986-03-28 1987-10-05 Matsushita Electric Ind Co Ltd Spectroscope
JPH02201124A (en) * 1989-01-28 1990-08-09 Shimadzu Corp Spectrophotometer
WO1996026414A1 (en) * 1995-02-24 1996-08-29 Anritsu Corporation Device for detecting angle of rotation of diffraction grating
JP2018009857A (en) * 2016-07-13 2018-01-18 株式会社島津製作所 Wavelength calibration method and spectrophotometer using wavelength calibration method

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176633A (en) * 1983-03-25 1984-10-06 Shimadzu Corp Grating spectrophotometer
JPH0434088B2 (en) * 1983-03-25 1992-06-04 Shimadzu Corp
JPS62180229A (en) * 1986-02-05 1987-08-07 Japan Spectroscopic Co Initialization device for wavelength or the like of spectroscope
JPS62226024A (en) * 1986-03-28 1987-10-05 Matsushita Electric Ind Co Ltd Spectroscope
JPH02201124A (en) * 1989-01-28 1990-08-09 Shimadzu Corp Spectrophotometer
WO1996026414A1 (en) * 1995-02-24 1996-08-29 Anritsu Corporation Device for detecting angle of rotation of diffraction grating
US5828061A (en) * 1995-02-24 1998-10-27 Anritsu Corporation Apparatus for detecting a rotation angle of a diffraction grating
JP2018009857A (en) * 2016-07-13 2018-01-18 株式会社島津製作所 Wavelength calibration method and spectrophotometer using wavelength calibration method

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