JPS5522853A - Manufacturing method of semiconductor device - Google Patents

Manufacturing method of semiconductor device

Info

Publication number
JPS5522853A
JPS5522853A JP9582578A JP9582578A JPS5522853A JP S5522853 A JPS5522853 A JP S5522853A JP 9582578 A JP9582578 A JP 9582578A JP 9582578 A JP9582578 A JP 9582578A JP S5522853 A JPS5522853 A JP S5522853A
Authority
JP
Japan
Prior art keywords
metal layer
electrode
film
resist film
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9582578A
Other languages
Japanese (ja)
Inventor
Akimichi Hojo
Masao Mochizuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP9582578A priority Critical patent/JPS5522853A/en
Publication of JPS5522853A publication Critical patent/JPS5522853A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To form a desirable shape of an electrode on a solder crystal with an well regeneration rate by performing an alloy processing while leaving a resist film.
CONSTITUTION: A resist film 12 is coated onto a region except an electrode region on the surface of a semiconductor crystal 11. Successively, an electrode metal layer 13 is formed on the film 12. Next, an alloy film 14 is formed in the boundary between the semiconductor crystal 11 and electrode metal layer 13 by a heat treatment under such a condition. Successively, the metal layer 13 except the portions alloyed is removed with the resist film 12. According to such a process, because the metal layer 13 on the film 12 is not contacted directly with a semiconductor, it has no reaction with the semiconductor, and its strain in the heat treatment processing is restricted less and a local contraction of the metal layer is also restricted less, therefore, it is possible to protect the electrode to be transformed from a predetermined shape. If an insulation film is formed between the resist film 12 and crystal 11, the local contraction of the electrode metal is not caused, and the resist film and the metal layer provided thereon can be more easy removed for a more convenience.
COPYRIGHT: (C)1980,JPO&Japio
JP9582578A 1978-08-08 1978-08-08 Manufacturing method of semiconductor device Pending JPS5522853A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9582578A JPS5522853A (en) 1978-08-08 1978-08-08 Manufacturing method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9582578A JPS5522853A (en) 1978-08-08 1978-08-08 Manufacturing method of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5522853A true JPS5522853A (en) 1980-02-18

Family

ID=14148173

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9582578A Pending JPS5522853A (en) 1978-08-08 1978-08-08 Manufacturing method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5522853A (en)

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