JPS5517451A - Wavelength position determining method for x-ray spectral unit - Google Patents

Wavelength position determining method for x-ray spectral unit

Info

Publication number
JPS5517451A
JPS5517451A JP9041378A JP9041378A JPS5517451A JP S5517451 A JPS5517451 A JP S5517451A JP 9041378 A JP9041378 A JP 9041378A JP 9041378 A JP9041378 A JP 9041378A JP S5517451 A JPS5517451 A JP S5517451A
Authority
JP
Japan
Prior art keywords
ray
processor
wavelength
wavelength position
printer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9041378A
Other languages
Japanese (ja)
Inventor
Koichi Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9041378A priority Critical patent/JPS5517451A/en
Publication of JPS5517451A publication Critical patent/JPS5517451A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To increase the accuracy of wavelength position determination, by determining the wavelength of the peak position of the X-ray spectrum through the processing of the X-ray strength signal. CONSTITUTION:The processor 29 including the memory section of count value is connected among the scaler timer unit 22, recorder 24 and the stop motor power supply 27, and the printer 28 is connected to the processor 29. Further, the electron ray 3 emitted from the electron gun is emitted on the test piece 7, the X-rays produced are detected with the X-ray detector 13 via the spectral element 10 and X-ray slit 12, unnecessary background is eliminated with the peak analyzer 12, and after the X-ray strength changed each instance is measured at the rate meter 23, it is recorded on the pen recorder 24. The output of the peak analyzer 21 is integrated in time at the scaler timer unit 22, the output is inputted to the processor 29 to be printed out on the printer 28. When the counter is finished, the operation of the step motor 26 is controlled via the step motor power supply 27 to start the next counting, the sum of X-ray strength is taken to the specified measuring channel to suitable number of splits, and the center of the region at maximum for the total is taken as the normal wavelength position.
JP9041378A 1978-07-26 1978-07-26 Wavelength position determining method for x-ray spectral unit Pending JPS5517451A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9041378A JPS5517451A (en) 1978-07-26 1978-07-26 Wavelength position determining method for x-ray spectral unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9041378A JPS5517451A (en) 1978-07-26 1978-07-26 Wavelength position determining method for x-ray spectral unit

Publications (1)

Publication Number Publication Date
JPS5517451A true JPS5517451A (en) 1980-02-06

Family

ID=13997895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9041378A Pending JPS5517451A (en) 1978-07-26 1978-07-26 Wavelength position determining method for x-ray spectral unit

Country Status (1)

Country Link
JP (1) JPS5517451A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017126631A1 (en) 2016-12-07 2018-06-07 Toyota Jidosha Kabushiki Kaisha Solid-state fluoride ion battery

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017126631A1 (en) 2016-12-07 2018-06-07 Toyota Jidosha Kabushiki Kaisha Solid-state fluoride ion battery

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