JPS5517417A - Ultrasonic wave unit - Google Patents
Ultrasonic wave unitInfo
- Publication number
- JPS5517417A JPS5517417A JP8997978A JP8997978A JPS5517417A JP S5517417 A JPS5517417 A JP S5517417A JP 8997978 A JP8997978 A JP 8997978A JP 8997978 A JP8997978 A JP 8997978A JP S5517417 A JPS5517417 A JP S5517417A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- probe
- conversion
- output signal
- ultrasonic waves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/02—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems using reflection of acoustic waves
- G01S15/06—Systems determining the position data of a target
- G01S15/42—Simultaneous measurement of distance and other co-ordinates
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Acoustics & Sound (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Physics & Mathematics (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
PURPOSE:To increase the azimuth resolution over a wide range, by displaying the output signal of the memory circuit with D/A conversion. CONSTITUTION:The unit consists of the probe 1 transmitting and receiving the ultrasonic waves, probe drive circuit 2 driving the oscillator of the probe, converging point control circuit 3 arbitrarily converging the ultrasonic waves within a distance from the probe by controlling the circuit 2, gate circuit 5 sequentially passing through only the reflection waves around the converging point of the ultrasonic waves converged at the circuit 3, memory circuit 8 which sequentially writes in the output signal of the circuit 5 with A/D conversion and starts readout after the writein for one picture's share is finished, and display section 11 displaying the output signal of the circuit 8 with D/A conversion 10. Thus, the azimuth resolution can be increased over a wide range in excellent manner.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8997978A JPS5517417A (en) | 1978-07-25 | 1978-07-25 | Ultrasonic wave unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8997978A JPS5517417A (en) | 1978-07-25 | 1978-07-25 | Ultrasonic wave unit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5517417A true JPS5517417A (en) | 1980-02-06 |
JPS621725B2 JPS621725B2 (en) | 1987-01-14 |
Family
ID=13985777
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8997978A Granted JPS5517417A (en) | 1978-07-25 | 1978-07-25 | Ultrasonic wave unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5517417A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57192861A (en) * | 1981-05-25 | 1982-11-27 | Mitsubishi Electric Corp | Ultrasonic flaw inspector |
JPS57196150A (en) * | 1981-05-28 | 1982-12-02 | Mitsubishi Electric Corp | Ultrasonic flaw detector |
JPS57200880A (en) * | 1981-06-01 | 1982-12-09 | Stanford Res Inst Int | Ultrasonic picture treating method and device through ultrasonic beam focusing and scan |
JPH0816700B2 (en) * | 1985-03-22 | 1996-02-21 | エス・ア−ル・アイ・インタ−ナシヨナル | Method and apparatus for ultrasound reflection transmission contrast |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52109966A (en) * | 1976-03-12 | 1977-09-14 | Oki Electric Ind Co Ltd | Receiving beam former |
JPS54115789U (en) * | 1978-02-03 | 1979-08-14 |
-
1978
- 1978-07-25 JP JP8997978A patent/JPS5517417A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52109966A (en) * | 1976-03-12 | 1977-09-14 | Oki Electric Ind Co Ltd | Receiving beam former |
JPS54115789U (en) * | 1978-02-03 | 1979-08-14 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57192861A (en) * | 1981-05-25 | 1982-11-27 | Mitsubishi Electric Corp | Ultrasonic flaw inspector |
JPS57196150A (en) * | 1981-05-28 | 1982-12-02 | Mitsubishi Electric Corp | Ultrasonic flaw detector |
JPS57200880A (en) * | 1981-06-01 | 1982-12-09 | Stanford Res Inst Int | Ultrasonic picture treating method and device through ultrasonic beam focusing and scan |
JPH0147754B2 (en) * | 1981-06-01 | 1989-10-16 | Stanford Res Inst Int | |
JPH0816700B2 (en) * | 1985-03-22 | 1996-02-21 | エス・ア−ル・アイ・インタ−ナシヨナル | Method and apparatus for ultrasound reflection transmission contrast |
Also Published As
Publication number | Publication date |
---|---|
JPS621725B2 (en) | 1987-01-14 |
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