JPS55166057A - Device for inspecting cmos integrated circuit - Google Patents

Device for inspecting cmos integrated circuit

Info

Publication number
JPS55166057A
JPS55166057A JP7444379A JP7444379A JPS55166057A JP S55166057 A JPS55166057 A JP S55166057A JP 7444379 A JP7444379 A JP 7444379A JP 7444379 A JP7444379 A JP 7444379A JP S55166057 A JPS55166057 A JP S55166057A
Authority
JP
Japan
Prior art keywords
voltage
input
output
amplifier
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7444379A
Other languages
Japanese (ja)
Inventor
Katsumi Terasaka
Yuzo Tsujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7444379A priority Critical patent/JPS55166057A/en
Publication of JPS55166057A publication Critical patent/JPS55166057A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To easily indicate leakage current of a CMOS integrated circuit when the leakage current is increased by setting the output of a voltage comparator to be applied as one input of a logic circuit to "1" when the input from a voltage amplifier is higher than the reference voltage.
CONSTITUTION: The magnitude of a power supply current flowing when the voltage of a power supply 1 is applied to a CMOS integrated circuit 2 is detected at the voltage across a resistor 3. The voltage across the resistor 3 is applied to the input of the voltage amplifier 4, and the output of the amplifier 4 is applied to a voltage comparator 7 with reference voltage variable upon alternation of a battery 5 and a potentiometer 6. The output from the comparator 7 is inputted to a logic circuit 10 together with a pulse delayed through a variable delay unit 9 at the pulse generated from a pulse generator 8 triggered when the voltage across the resistor 3 exceeds predetermined value, and also applied to the ligic circuit 10, which multiplies them. Since the output from the comparator 7 becomes "1" when the input from the amplifier 4 is higher than the reference voltage, when the leakage current exceeds predetermined set value, the indicator circuit 11 indicates "1" to be thus detected.
COPYRIGHT: (C)1980,JPO&Japio
JP7444379A 1979-06-12 1979-06-12 Device for inspecting cmos integrated circuit Pending JPS55166057A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7444379A JPS55166057A (en) 1979-06-12 1979-06-12 Device for inspecting cmos integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7444379A JPS55166057A (en) 1979-06-12 1979-06-12 Device for inspecting cmos integrated circuit

Publications (1)

Publication Number Publication Date
JPS55166057A true JPS55166057A (en) 1980-12-24

Family

ID=13547374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7444379A Pending JPS55166057A (en) 1979-06-12 1979-06-12 Device for inspecting cmos integrated circuit

Country Status (1)

Country Link
JP (1) JPS55166057A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992001943A1 (en) * 1990-07-23 1992-02-06 Seiko Epson Corporation Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992001943A1 (en) * 1990-07-23 1992-02-06 Seiko Epson Corporation Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same
US5321354A (en) * 1990-07-23 1994-06-14 Seiko Epson Corporation Method for inspecting semiconductor devices

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