JPS55166057A - Device for inspecting cmos integrated circuit - Google Patents
Device for inspecting cmos integrated circuitInfo
- Publication number
- JPS55166057A JPS55166057A JP7444379A JP7444379A JPS55166057A JP S55166057 A JPS55166057 A JP S55166057A JP 7444379 A JP7444379 A JP 7444379A JP 7444379 A JP7444379 A JP 7444379A JP S55166057 A JPS55166057 A JP S55166057A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- input
- output
- amplifier
- comparator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE: To easily indicate leakage current of a CMOS integrated circuit when the leakage current is increased by setting the output of a voltage comparator to be applied as one input of a logic circuit to "1" when the input from a voltage amplifier is higher than the reference voltage.
CONSTITUTION: The magnitude of a power supply current flowing when the voltage of a power supply 1 is applied to a CMOS integrated circuit 2 is detected at the voltage across a resistor 3. The voltage across the resistor 3 is applied to the input of the voltage amplifier 4, and the output of the amplifier 4 is applied to a voltage comparator 7 with reference voltage variable upon alternation of a battery 5 and a potentiometer 6. The output from the comparator 7 is inputted to a logic circuit 10 together with a pulse delayed through a variable delay unit 9 at the pulse generated from a pulse generator 8 triggered when the voltage across the resistor 3 exceeds predetermined value, and also applied to the ligic circuit 10, which multiplies them. Since the output from the comparator 7 becomes "1" when the input from the amplifier 4 is higher than the reference voltage, when the leakage current exceeds predetermined set value, the indicator circuit 11 indicates "1" to be thus detected.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7444379A JPS55166057A (en) | 1979-06-12 | 1979-06-12 | Device for inspecting cmos integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7444379A JPS55166057A (en) | 1979-06-12 | 1979-06-12 | Device for inspecting cmos integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55166057A true JPS55166057A (en) | 1980-12-24 |
Family
ID=13547374
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7444379A Pending JPS55166057A (en) | 1979-06-12 | 1979-06-12 | Device for inspecting cmos integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55166057A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992001943A1 (en) * | 1990-07-23 | 1992-02-06 | Seiko Epson Corporation | Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same |
-
1979
- 1979-06-12 JP JP7444379A patent/JPS55166057A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992001943A1 (en) * | 1990-07-23 | 1992-02-06 | Seiko Epson Corporation | Method of inspecting semiconductor device, apparatus for inspecting the same, and method of manufacturing the same |
US5321354A (en) * | 1990-07-23 | 1994-06-14 | Seiko Epson Corporation | Method for inspecting semiconductor devices |
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