JPS551582A - Electric wire bundle testing apparatus - Google Patents

Electric wire bundle testing apparatus

Info

Publication number
JPS551582A
JPS551582A JP7522278A JP7522278A JPS551582A JP S551582 A JPS551582 A JP S551582A JP 7522278 A JP7522278 A JP 7522278A JP 7522278 A JP7522278 A JP 7522278A JP S551582 A JPS551582 A JP S551582A
Authority
JP
Japan
Prior art keywords
laying
gate
test
display
constitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7522278A
Other languages
Japanese (ja)
Inventor
Nobuyuki Moriyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RICHO KEIKI KK
Ricoh Keiki Co Ltd
Original Assignee
RICHO KEIKI KK
Ricoh Keiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RICHO KEIKI KK, Ricoh Keiki Co Ltd filed Critical RICHO KEIKI KK
Priority to JP7522278A priority Critical patent/JPS551582A/en
Publication of JPS551582A publication Critical patent/JPS551582A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To accurately test and display the bundled wires under production in the order of laying with a simple constitution by controlling the closing of a gate for display signal of the conductor being tested of the next stage by the signal displaying the good condition of the conductor being tested.
CONSTITUTION: When the strobe signal STB 1 at the turning ON of power source, the pulse for conduction test applied from a pulse generator through laying terminals 1A, 1B and the burst signal QIN are applied to an AND gate AND1, a flip-flop FF1 is set by the output of the gate AND1 in which AND conditions have been established, and the conduction of laying is accomplished with well display by the set output of the FF1. The set output of the FF1 is applied as the burst signal QIN to the AND gate AND2 of the next laying terminals 2A, 2B. In the similar manner, insulation test is also accomplished and the test display of the next laying does not take place unless the test results are good or after the repair of laying in case of defective, thus the testing of the bundled wires under production may be accurately and rapidly performed by the circuits of the simple gate constitution.
COPYRIGHT: (C)1980,JPO&Japio
JP7522278A 1978-06-21 1978-06-21 Electric wire bundle testing apparatus Pending JPS551582A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7522278A JPS551582A (en) 1978-06-21 1978-06-21 Electric wire bundle testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7522278A JPS551582A (en) 1978-06-21 1978-06-21 Electric wire bundle testing apparatus

Publications (1)

Publication Number Publication Date
JPS551582A true JPS551582A (en) 1980-01-08

Family

ID=13569973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7522278A Pending JPS551582A (en) 1978-06-21 1978-06-21 Electric wire bundle testing apparatus

Country Status (1)

Country Link
JP (1) JPS551582A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614976A (en) * 1984-06-19 1986-01-10 Yokogawa Hewlett Packard Ltd Continuity testing device
JPS61202171A (en) * 1985-03-06 1986-09-06 Fujitsu Ltd Multiterminal short-circuiting checker
CN104391218A (en) * 2014-12-12 2015-03-04 重庆和平自动化工程股份有限公司 Wire harness detection circuit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS614976A (en) * 1984-06-19 1986-01-10 Yokogawa Hewlett Packard Ltd Continuity testing device
JPH0585870B2 (en) * 1984-06-19 1993-12-09 Hewlett Packard Yokogawa
JPS61202171A (en) * 1985-03-06 1986-09-06 Fujitsu Ltd Multiterminal short-circuiting checker
CN104391218A (en) * 2014-12-12 2015-03-04 重庆和平自动化工程股份有限公司 Wire harness detection circuit

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