JPS5515657B2 - - Google Patents
Info
- Publication number
- JPS5515657B2 JPS5515657B2 JP15381576A JP15381576A JPS5515657B2 JP S5515657 B2 JPS5515657 B2 JP S5515657B2 JP 15381576 A JP15381576 A JP 15381576A JP 15381576 A JP15381576 A JP 15381576A JP S5515657 B2 JPS5515657 B2 JP S5515657B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15381576A JPS5377582A (en) | 1976-12-20 | 1976-12-20 | Leght emission analyzing method |
US06/163,163 US4326801A (en) | 1976-12-20 | 1980-06-26 | Method for emission spectrochemical analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15381576A JPS5377582A (en) | 1976-12-20 | 1976-12-20 | Leght emission analyzing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5377582A JPS5377582A (en) | 1978-07-10 |
JPS5515657B2 true JPS5515657B2 (no) | 1980-04-25 |
Family
ID=15570696
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15381576A Granted JPS5377582A (en) | 1976-12-20 | 1976-12-20 | Leght emission analyzing method |
Country Status (2)
Country | Link |
---|---|
US (1) | US4326801A (no) |
JP (1) | JPS5377582A (no) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3244164A1 (de) * | 1982-11-29 | 1984-05-30 | A.R.L. Applied Research Laboratories S.A., 1024 Eclubens | Verfahren zur bestimmung von elementen in metallen mit optischer emissions-spektralanalyse |
DE3304842C2 (de) * | 1983-02-09 | 1986-09-04 | Mannesmann AG, 4000 Düsseldorf | Anwendung der Funkenanregung zur spektrometrischen Bestimmung der Anteile einer chemischen Verbindung |
FR2581192B1 (fr) * | 1985-04-25 | 1988-10-07 | Siderurgie Fse Inst Rech | Procede de determination par spectrometrie d'emission optique de la teneur d'un acier en un element, tel que l'aluminium, dissous et precipite. |
JP2522216B2 (ja) * | 1991-02-28 | 1996-08-07 | 株式会社島津製作所 | 発光分光分析方法 |
JPH0750033B2 (ja) * | 1991-03-22 | 1995-05-31 | 株式会社島津製作所 | 発光分光分析方法 |
DE19753348A1 (de) * | 1997-12-03 | 1999-06-10 | Spectro Analytical Instr Gmbh | Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen |
EP1035410A4 (en) * | 1998-04-28 | 2001-08-22 | Kawasaki Steel Co | METHOD FOR ANALYZING OXYGEN AND OXIDES IN METALLIC SUBSTANCES |
WO2002071036A1 (en) * | 2001-03-06 | 2002-09-12 | Nsk Ltd. | Method for measuring particle size of inclusion in metal by emission spectrum intensity of element constituting inclusion in metal, and method for forming particle size distribution of inclusion in metal, and apparatus for executing that method |
JP5998801B2 (ja) * | 2012-09-27 | 2016-09-28 | Jfeスチール株式会社 | 鉄鋼中のアルミナ定量分析方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3876306A (en) * | 1971-07-30 | 1975-04-08 | Nippon Steel Corp | Method of state-differentiating analysis of specified elements in metals and composition adjustment thereof |
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1976
- 1976-12-20 JP JP15381576A patent/JPS5377582A/ja active Granted
-
1980
- 1980-06-26 US US06/163,163 patent/US4326801A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4326801A (en) | 1982-04-27 |
JPS5377582A (en) | 1978-07-10 |