JPS55144514A - Two-color radiation temperature measuring method - Google Patents
Two-color radiation temperature measuring methodInfo
- Publication number
- JPS55144514A JPS55144514A JP5323279A JP5323279A JPS55144514A JP S55144514 A JPS55144514 A JP S55144514A JP 5323279 A JP5323279 A JP 5323279A JP 5323279 A JP5323279 A JP 5323279A JP S55144514 A JPS55144514 A JP S55144514A
- Authority
- JP
- Japan
- Prior art keywords
- difference
- temperature
- value
- infrared rays
- measured object
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 title 1
- 238000006243 chemical reaction Methods 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Abstract
PURPOSE:To always accurately measure a temperature, by detecting infrared rays emitted from a measured object, separately in two different wavelength regions and by making it impossible to obtain a measurement result when a detected error is large. CONSTITUTION:Infrared rays of lambda1, lambda2 in wavelength, which are emitted from a measured object 3, are detected by sensors 1, 2. Detection signals P1, P2 divided by a value mu (0<=mu<=1) in calculation circuits 13, 14 to determine ratios P1/mu, P2/mu. The ratios are changed into temperature signals T1, T2 by conversion circuits 15, 16. The outputs of the conversion circuits are supplied to a difference detection circuit 17 which determines the difference DELTAT. This difference is applied to a discrimination circuit 18. The value mu is swept from 1 to 0 by a sweep circuit 12. As a result, a corresponding temperature signal value is indicated on a display unit 19 when the difference DELTAT is smaller than an allowable temperature difference DELTATs and negligible.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5323279A JPS55144514A (en) | 1979-04-28 | 1979-04-28 | Two-color radiation temperature measuring method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5323279A JPS55144514A (en) | 1979-04-28 | 1979-04-28 | Two-color radiation temperature measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55144514A true JPS55144514A (en) | 1980-11-11 |
Family
ID=12937060
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5323279A Pending JPS55144514A (en) | 1979-04-28 | 1979-04-28 | Two-color radiation temperature measuring method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55144514A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6682216B1 (en) * | 1999-12-16 | 2004-01-27 | The Regents Of The University Of California | Single-fiber multi-color pyrometry |
US6817758B2 (en) * | 2001-04-04 | 2004-11-16 | Noritake Co., Limited | Temperature distribution measuring method and apparatus |
-
1979
- 1979-04-28 JP JP5323279A patent/JPS55144514A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6682216B1 (en) * | 1999-12-16 | 2004-01-27 | The Regents Of The University Of California | Single-fiber multi-color pyrometry |
US6817758B2 (en) * | 2001-04-04 | 2004-11-16 | Noritake Co., Limited | Temperature distribution measuring method and apparatus |
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