JPS55142218A - Infrared detector - Google Patents

Infrared detector

Info

Publication number
JPS55142218A
JPS55142218A JP5127779A JP5127779A JPS55142218A JP S55142218 A JPS55142218 A JP S55142218A JP 5127779 A JP5127779 A JP 5127779A JP 5127779 A JP5127779 A JP 5127779A JP S55142218 A JPS55142218 A JP S55142218A
Authority
JP
Japan
Prior art keywords
filter
radiation
laser
cold aperture
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5127779A
Other languages
Japanese (ja)
Inventor
Kouji Shinohara
Ryuichi Ueda
Mitsuo Yoshikawa
Michiharu Ito
Hirokazu Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP5127779A priority Critical patent/JPS55142218A/en
Publication of JPS55142218A publication Critical patent/JPS55142218A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0801—Means for wavelength selection or discrimination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0801—Means for wavelength selection or discrimination
    • G01J5/0802—Optical filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0875—Windows; Arrangements for fastening thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To improve an S/N ratio through simple processing, by providing to the opening of a cold aperture with an optical filter which exhibits a prescribed transmission spectrum. CONSTITUTION:A cold aperture 7 is covered with a filter 10. Since this filter is made of germanium or the like provided with narrow band transmission characteristics, the central wavelength of the filter is made coincident with the oscillation wavelength of laser. Incident light is conducted to a detection element 1 through the narrow band pass filter so that only radiation of laser wavelength is transmitted although radiation of various wavelengths falling into visual angle is limited by the cold aperture 7. This results in blocking radiation of undesired wavelengths which act only as noises. The S/N ratio of the detection element which receives laser light substantially is thus greatly improved by simple processing.
JP5127779A 1979-04-24 1979-04-24 Infrared detector Pending JPS55142218A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5127779A JPS55142218A (en) 1979-04-24 1979-04-24 Infrared detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5127779A JPS55142218A (en) 1979-04-24 1979-04-24 Infrared detector

Publications (1)

Publication Number Publication Date
JPS55142218A true JPS55142218A (en) 1980-11-06

Family

ID=12882442

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5127779A Pending JPS55142218A (en) 1979-04-24 1979-04-24 Infrared detector

Country Status (1)

Country Link
JP (1) JPS55142218A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209397A (en) * 1984-04-03 1985-10-21 富士通株式会社 Radiational cooler
JPS62153531U (en) * 1986-03-24 1987-09-29
US5602394A (en) * 1993-04-19 1997-02-11 Surface Optics Corporation Imaging spectroradiometer

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209397A (en) * 1984-04-03 1985-10-21 富士通株式会社 Radiational cooler
JPH0228519B2 (en) * 1984-04-03 1990-06-25 Fujitsu Kk
JPS62153531U (en) * 1986-03-24 1987-09-29
US5602394A (en) * 1993-04-19 1997-02-11 Surface Optics Corporation Imaging spectroradiometer
US5821535A (en) * 1993-04-19 1998-10-13 Surface Optics Corp. Imaging spectroradiometer
US5949074A (en) * 1993-04-19 1999-09-07 Surface Optics Corporation Imaging spectroradiometer

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