JPS55141949U - - Google Patents
Info
- Publication number
- JPS55141949U JPS55141949U JP3991379U JP3991379U JPS55141949U JP S55141949 U JPS55141949 U JP S55141949U JP 3991379 U JP3991379 U JP 3991379U JP 3991379 U JP3991379 U JP 3991379U JP S55141949 U JPS55141949 U JP S55141949U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3991379U JPS55141949U (ja) | 1979-03-29 | 1979-03-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3991379U JPS55141949U (ja) | 1979-03-29 | 1979-03-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55141949U true JPS55141949U (ja) | 1980-10-11 |
Family
ID=28907631
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3991379U Pending JPS55141949U (ja) | 1979-03-29 | 1979-03-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55141949U (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022031629A (ja) * | 2020-07-31 | 2022-02-22 | シトロニックス テクノロジー コーポレーション | チップのテストパッド構造 |
-
1979
- 1979-03-29 JP JP3991379U patent/JPS55141949U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022031629A (ja) * | 2020-07-31 | 2022-02-22 | シトロニックス テクノロジー コーポレーション | チップのテストパッド構造 |
| US11694983B2 (en) | 2020-07-31 | 2023-07-04 | Sitronix Technology Corporation | Test pad structure of chip |