JPS5512408A - Breakdown voltage testing method of insulator - Google Patents
Breakdown voltage testing method of insulatorInfo
- Publication number
- JPS5512408A JPS5512408A JP8402978A JP8402978A JPS5512408A JP S5512408 A JPS5512408 A JP S5512408A JP 8402978 A JP8402978 A JP 8402978A JP 8402978 A JP8402978 A JP 8402978A JP S5512408 A JPS5512408 A JP S5512408A
- Authority
- JP
- Japan
- Prior art keywords
- film
- breakdown voltage
- sio
- insulator
- stored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8402978A JPS6046665B2 (ja) | 1978-07-12 | 1978-07-12 | 絶縁物破壊電圧検査法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8402978A JPS6046665B2 (ja) | 1978-07-12 | 1978-07-12 | 絶縁物破壊電圧検査法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5512408A true JPS5512408A (en) | 1980-01-29 |
JPS6046665B2 JPS6046665B2 (ja) | 1985-10-17 |
Family
ID=13819107
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8402978A Expired JPS6046665B2 (ja) | 1978-07-12 | 1978-07-12 | 絶縁物破壊電圧検査法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6046665B2 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4296370A (en) * | 1979-10-11 | 1981-10-20 | Rca Corporation | Method of detecting a thin insulating film over a conductor |
US4812756A (en) * | 1987-08-26 | 1989-03-14 | International Business Machines Corporation | Contactless technique for semicondutor wafer testing |
US5354735A (en) * | 1992-07-30 | 1994-10-11 | Firmenich Sa | Use of a cyclopentadecenone as perfuming ingredient |
US5498974A (en) * | 1994-12-30 | 1996-03-12 | International Business Machines Corporation | Contactless corona-oxide-semiconductor Q-V mobile charge measurement method and apparatus |
JP2007263875A (ja) * | 2006-03-29 | 2007-10-11 | Ngk Insulators Ltd | プラズマ発生電極検査装置 |
-
1978
- 1978-07-12 JP JP8402978A patent/JPS6046665B2/ja not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4296370A (en) * | 1979-10-11 | 1981-10-20 | Rca Corporation | Method of detecting a thin insulating film over a conductor |
US4812756A (en) * | 1987-08-26 | 1989-03-14 | International Business Machines Corporation | Contactless technique for semicondutor wafer testing |
US5354735A (en) * | 1992-07-30 | 1994-10-11 | Firmenich Sa | Use of a cyclopentadecenone as perfuming ingredient |
US5498974A (en) * | 1994-12-30 | 1996-03-12 | International Business Machines Corporation | Contactless corona-oxide-semiconductor Q-V mobile charge measurement method and apparatus |
JP2007263875A (ja) * | 2006-03-29 | 2007-10-11 | Ngk Insulators Ltd | プラズマ発生電極検査装置 |
JP4699928B2 (ja) * | 2006-03-29 | 2011-06-15 | 日本碍子株式会社 | プラズマ発生電極検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS6046665B2 (ja) | 1985-10-17 |
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