JPS55124076A - Self-checking method of testing apparatus - Google Patents
Self-checking method of testing apparatusInfo
- Publication number
- JPS55124076A JPS55124076A JP3259379A JP3259379A JPS55124076A JP S55124076 A JPS55124076 A JP S55124076A JP 3259379 A JP3259379 A JP 3259379A JP 3259379 A JP3259379 A JP 3259379A JP S55124076 A JPS55124076 A JP S55124076A
- Authority
- JP
- Japan
- Prior art keywords
- outputs
- measuring instruments
- testing apparatus
- signal generator
- command
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE: To enable the testing apparatus constituted by an equivalent signal generator and two measuring instruments to be readily and automatically checked by giving a command to the equivalent signal generator and comparing the outputs of the two measuring instruments with each other or the outputs of the respective measuring instruments and the command given.
CONSTITUTION: In the testing apparatus constituted by an equivalent signal generator 1 and two measurig instruments 4a, 4b which measure the output of this generator, a computer 2 is programmed as follows for the outputs Ma, Mb of the respective measuring instruments. If the outputs Ma and Mb are the same, it is decided that the measuring instruments 4a, 4b are both normal. If the outputs Ma, Mb differ but if one of the outputs coincides with the command c of the computer 2, then it is decided that one measuring instrument is normal. If at least one of the outputs Ma, Mb coincides with the command c of the computer 2, it is judged that the equivalent signal generator 1 is normal.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3259379A JPS55124076A (en) | 1979-03-19 | 1979-03-19 | Self-checking method of testing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3259379A JPS55124076A (en) | 1979-03-19 | 1979-03-19 | Self-checking method of testing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55124076A true JPS55124076A (en) | 1980-09-24 |
JPH0130113B2 JPH0130113B2 (en) | 1989-06-16 |
Family
ID=12363149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3259379A Granted JPS55124076A (en) | 1979-03-19 | 1979-03-19 | Self-checking method of testing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55124076A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62108165A (en) * | 1985-11-06 | 1987-05-19 | Hitachi Electronics Eng Co Ltd | Ic inspecting system |
-
1979
- 1979-03-19 JP JP3259379A patent/JPS55124076A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62108165A (en) * | 1985-11-06 | 1987-05-19 | Hitachi Electronics Eng Co Ltd | Ic inspecting system |
Also Published As
Publication number | Publication date |
---|---|
JPH0130113B2 (en) | 1989-06-16 |
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