JPS55124076A - Self-checking method of testing apparatus - Google Patents

Self-checking method of testing apparatus

Info

Publication number
JPS55124076A
JPS55124076A JP3259379A JP3259379A JPS55124076A JP S55124076 A JPS55124076 A JP S55124076A JP 3259379 A JP3259379 A JP 3259379A JP 3259379 A JP3259379 A JP 3259379A JP S55124076 A JPS55124076 A JP S55124076A
Authority
JP
Japan
Prior art keywords
outputs
measuring instruments
testing apparatus
signal generator
command
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3259379A
Other languages
Japanese (ja)
Other versions
JPH0130113B2 (en
Inventor
Motoyoshi Yoshimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3259379A priority Critical patent/JPS55124076A/en
Publication of JPS55124076A publication Critical patent/JPS55124076A/en
Publication of JPH0130113B2 publication Critical patent/JPH0130113B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To enable the testing apparatus constituted by an equivalent signal generator and two measuring instruments to be readily and automatically checked by giving a command to the equivalent signal generator and comparing the outputs of the two measuring instruments with each other or the outputs of the respective measuring instruments and the command given.
CONSTITUTION: In the testing apparatus constituted by an equivalent signal generator 1 and two measurig instruments 4a, 4b which measure the output of this generator, a computer 2 is programmed as follows for the outputs Ma, Mb of the respective measuring instruments. If the outputs Ma and Mb are the same, it is decided that the measuring instruments 4a, 4b are both normal. If the outputs Ma, Mb differ but if one of the outputs coincides with the command c of the computer 2, then it is decided that one measuring instrument is normal. If at least one of the outputs Ma, Mb coincides with the command c of the computer 2, it is judged that the equivalent signal generator 1 is normal.
COPYRIGHT: (C)1980,JPO&Japio
JP3259379A 1979-03-19 1979-03-19 Self-checking method of testing apparatus Granted JPS55124076A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3259379A JPS55124076A (en) 1979-03-19 1979-03-19 Self-checking method of testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3259379A JPS55124076A (en) 1979-03-19 1979-03-19 Self-checking method of testing apparatus

Publications (2)

Publication Number Publication Date
JPS55124076A true JPS55124076A (en) 1980-09-24
JPH0130113B2 JPH0130113B2 (en) 1989-06-16

Family

ID=12363149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3259379A Granted JPS55124076A (en) 1979-03-19 1979-03-19 Self-checking method of testing apparatus

Country Status (1)

Country Link
JP (1) JPS55124076A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62108165A (en) * 1985-11-06 1987-05-19 Hitachi Electronics Eng Co Ltd Ic inspecting system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62108165A (en) * 1985-11-06 1987-05-19 Hitachi Electronics Eng Co Ltd Ic inspecting system

Also Published As

Publication number Publication date
JPH0130113B2 (en) 1989-06-16

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