JPS55117901A - Measuring method for parallel degree of plane plate surface and reverse face - Google Patents

Measuring method for parallel degree of plane plate surface and reverse face

Info

Publication number
JPS55117901A
JPS55117901A JP2588279A JP2588279A JPS55117901A JP S55117901 A JPS55117901 A JP S55117901A JP 2588279 A JP2588279 A JP 2588279A JP 2588279 A JP2588279 A JP 2588279A JP S55117901 A JPS55117901 A JP S55117901A
Authority
JP
Japan
Prior art keywords
reverse face
face
parallel degree
measuring method
plate surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2588279A
Other languages
Japanese (ja)
Inventor
Fumio Takemoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP2588279A priority Critical patent/JPS55117901A/en
Publication of JPS55117901A publication Critical patent/JPS55117901A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To cause reflection lights from the surface and the reverse face to interfere each other to make it possible to measure the parallel degree of the surface and the reverse face even for a plate which has such a face roughness that the laser light is scattered by the irradiation face, by performing measurement after coating a transparent thin film on the measured surface.
CONSTITUTION: A photo resistor, etc., are coated on the surface and the reverse face of a measured face, for example, glass plate 12, which is lapped with the grain of the number 2000, by a spinner and is dried, and transparent thin film 13 is coated. After that, laser light 2 is irradiated to observe interference stripes between the reflection light from the surface and the reflection light from the reverse face, thus measuring the parallel degree of the surface and the reverse face.
COPYRIGHT: (C)1980,JPO&Japio
JP2588279A 1979-03-06 1979-03-06 Measuring method for parallel degree of plane plate surface and reverse face Pending JPS55117901A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2588279A JPS55117901A (en) 1979-03-06 1979-03-06 Measuring method for parallel degree of plane plate surface and reverse face

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2588279A JPS55117901A (en) 1979-03-06 1979-03-06 Measuring method for parallel degree of plane plate surface and reverse face

Publications (1)

Publication Number Publication Date
JPS55117901A true JPS55117901A (en) 1980-09-10

Family

ID=12178143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2588279A Pending JPS55117901A (en) 1979-03-06 1979-03-06 Measuring method for parallel degree of plane plate surface and reverse face

Country Status (1)

Country Link
JP (1) JPS55117901A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107727009A (en) * 2017-11-06 2018-02-23 深圳精创视觉科技有限公司 Hand-set lid glass quality detection means

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107727009A (en) * 2017-11-06 2018-02-23 深圳精创视觉科技有限公司 Hand-set lid glass quality detection means
CN107727009B (en) * 2017-11-06 2023-11-24 深圳精创视觉科技有限公司 Quality detection device for mobile phone cover plate glass

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