JPS5511693A - Pulse cycle generator - Google Patents
Pulse cycle generatorInfo
- Publication number
- JPS5511693A JPS5511693A JP8157879A JP8157879A JPS5511693A JP S5511693 A JPS5511693 A JP S5511693A JP 8157879 A JP8157879 A JP 8157879A JP 8157879 A JP8157879 A JP 8157879A JP S5511693 A JPS5511693 A JP S5511693A
- Authority
- JP
- Japan
- Prior art keywords
- pulse cycle
- cycle generator
- generator
- pulse
- cycle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/78—Generating a single train of pulses having a predetermined pattern, e.g. a predetermined number
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2746743A DE2746743C2 (en) | 1977-10-18 | 1977-10-18 | Method and arrangement for the computer-controlled generation of pulse intervals |
DE2829709A DE2829709C2 (en) | 1978-07-06 | 1978-07-06 | Method and arrangement for generating pulse cycles immediately following one another in time |
DE2829709.8 | 1978-07-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5511693A true JPS5511693A (en) | 1980-01-26 |
JPS6042422B2 JPS6042422B2 (en) | 1985-09-21 |
Family
ID=25772918
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53117544A Expired JPS6042421B2 (en) | 1977-10-18 | 1978-09-26 | Pulse train generator |
JP54081578A Expired JPS6042422B2 (en) | 1977-10-18 | 1979-06-29 | Pulse cycle generator |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53117544A Expired JPS6042421B2 (en) | 1977-10-18 | 1978-09-26 | Pulse train generator |
Country Status (2)
Country | Link |
---|---|
JP (2) | JPS6042421B2 (en) |
FR (1) | FR2406912A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5715527A (en) * | 1980-06-25 | 1982-01-26 | Ibm | Method of generating pulse |
JPS61172431A (en) * | 1985-01-28 | 1986-08-04 | Fujisoku:Kk | Sampling signal generating circuit |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63145529U (en) * | 1987-03-17 | 1988-09-26 |
-
1978
- 1978-09-26 JP JP53117544A patent/JPS6042421B2/en not_active Expired
- 1978-10-09 FR FR7829353A patent/FR2406912A1/en active Granted
-
1979
- 1979-06-29 JP JP54081578A patent/JPS6042422B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5715527A (en) * | 1980-06-25 | 1982-01-26 | Ibm | Method of generating pulse |
JPS6326925B2 (en) * | 1980-06-25 | 1988-06-01 | Intaanashonaru Bijinesu Mashiinzu Corp | |
JPS61172431A (en) * | 1985-01-28 | 1986-08-04 | Fujisoku:Kk | Sampling signal generating circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS6042422B2 (en) | 1985-09-21 |
FR2406912A1 (en) | 1979-05-18 |
JPS5465463A (en) | 1979-05-26 |
JPS6042421B2 (en) | 1985-09-21 |
FR2406912B1 (en) | 1982-06-04 |
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