JPS55112654A - Test unit for digital logic circuit - Google Patents
Test unit for digital logic circuitInfo
- Publication number
- JPS55112654A JPS55112654A JP1845879A JP1845879A JPS55112654A JP S55112654 A JPS55112654 A JP S55112654A JP 1845879 A JP1845879 A JP 1845879A JP 1845879 A JP1845879 A JP 1845879A JP S55112654 A JPS55112654 A JP S55112654A
- Authority
- JP
- Japan
- Prior art keywords
- tested body
- transmission line
- test unit
- line
- logic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Logic Circuits (AREA)
Abstract
PURPOSE: To prevent damage and malfunction of tested body and to increase the reliability of test unit, by connecting the primary coil of small sized pulse transformer in series with the transmission line.
CONSTITUTION: When two switches 25 and 33 are open with the control signal C interlockingly, the self inductance of the primary coil 24a is produced in the transmission line 22, the transmission line 22 is of high impedance substantially and the output line from the tested body 1 at the same time. When two switches 25, 33 are closed, the transmission line 22 holds the essential characteristic impedance and the input line to the tested body 1 at the same time. Accordingly, reflection wave can be reduced when obtaining the output signal from the tested body 1, and the distortion in the input signal can be reduced when the input signal is fed to the tested body 1.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54018458A JPS6019531B2 (en) | 1979-02-21 | 1979-02-21 | Test equipment for digital logic circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54018458A JPS6019531B2 (en) | 1979-02-21 | 1979-02-21 | Test equipment for digital logic circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55112654A true JPS55112654A (en) | 1980-08-30 |
JPS6019531B2 JPS6019531B2 (en) | 1985-05-16 |
Family
ID=11972179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54018458A Expired JPS6019531B2 (en) | 1979-02-21 | 1979-02-21 | Test equipment for digital logic circuits |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6019531B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107037311A (en) * | 2016-10-27 | 2017-08-11 | 国家电网公司 | A kind of Transformer Winding turn-to-turn insulation method for diagnosing faults and device |
-
1979
- 1979-02-21 JP JP54018458A patent/JPS6019531B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107037311A (en) * | 2016-10-27 | 2017-08-11 | 国家电网公司 | A kind of Transformer Winding turn-to-turn insulation method for diagnosing faults and device |
Also Published As
Publication number | Publication date |
---|---|
JPS6019531B2 (en) | 1985-05-16 |
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