JPS55103472A - Withstand voltage test method - Google Patents
Withstand voltage test methodInfo
- Publication number
- JPS55103472A JPS55103472A JP1144279A JP1144279A JPS55103472A JP S55103472 A JPS55103472 A JP S55103472A JP 1144279 A JP1144279 A JP 1144279A JP 1144279 A JP1144279 A JP 1144279A JP S55103472 A JPS55103472 A JP S55103472A
- Authority
- JP
- Japan
- Prior art keywords
- coils
- corona
- coil
- withstand voltage
- featuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE: To prevent the corona occurrence between coils by providing the filling featuring an appropriate amount of volume resistivity to the area of the SiC coating layer between coils of different phases.
CONSTITUTION: When the withstand voltage test is given to the windings by one set, the test voltage is applied to, for example, lower coil 2a from high-voltage power source 8. And coil conductor 3b of upper coil 2b and stator core 1 are earthed. In this case, filling 7 featuring the volume resistivity in the range of 3× 106W1×1010Ω.cm is provided between coils 2a and 2b. As a result, no corona occurs at the coil end part between coils 2a and 2b, thus preventing the damage caused by the corona and given to SiC coating layers 6a and 6b for easing of the electric field.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1144279A JPS55103472A (en) | 1979-02-05 | 1979-02-05 | Withstand voltage test method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1144279A JPS55103472A (en) | 1979-02-05 | 1979-02-05 | Withstand voltage test method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55103472A true JPS55103472A (en) | 1980-08-07 |
Family
ID=11778201
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1144279A Pending JPS55103472A (en) | 1979-02-05 | 1979-02-05 | Withstand voltage test method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55103472A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5077768A (en) * | 1989-02-20 | 1991-12-31 | Fuji Photo Film Co., Ltd. | Fault detection and recovery device used in a radiation imaging information processing system |
US5564012A (en) * | 1989-03-29 | 1996-10-08 | Fuji Photo Film Co., Ltd. | Support apparatus for use with radiation image information processing system |
US5651362A (en) * | 1989-03-29 | 1997-07-29 | Fuji Photo Film Co., Ltd. | Support apparatus for use with radiation image information processing system |
-
1979
- 1979-02-05 JP JP1144279A patent/JPS55103472A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5077768A (en) * | 1989-02-20 | 1991-12-31 | Fuji Photo Film Co., Ltd. | Fault detection and recovery device used in a radiation imaging information processing system |
US5564012A (en) * | 1989-03-29 | 1996-10-08 | Fuji Photo Film Co., Ltd. | Support apparatus for use with radiation image information processing system |
US5651362A (en) * | 1989-03-29 | 1997-07-29 | Fuji Photo Film Co., Ltd. | Support apparatus for use with radiation image information processing system |
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