JPS55103472A - Withstand voltage test method - Google Patents

Withstand voltage test method

Info

Publication number
JPS55103472A
JPS55103472A JP1144279A JP1144279A JPS55103472A JP S55103472 A JPS55103472 A JP S55103472A JP 1144279 A JP1144279 A JP 1144279A JP 1144279 A JP1144279 A JP 1144279A JP S55103472 A JPS55103472 A JP S55103472A
Authority
JP
Japan
Prior art keywords
coils
corona
coil
withstand voltage
featuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1144279A
Other languages
Japanese (ja)
Inventor
Takanori Sato
Kenzo Kadotani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1144279A priority Critical patent/JPS55103472A/en
Publication of JPS55103472A publication Critical patent/JPS55103472A/en
Pending legal-status Critical Current

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  • Testing Relating To Insulation (AREA)

Abstract

PURPOSE: To prevent the corona occurrence between coils by providing the filling featuring an appropriate amount of volume resistivity to the area of the SiC coating layer between coils of different phases.
CONSTITUTION: When the withstand voltage test is given to the windings by one set, the test voltage is applied to, for example, lower coil 2a from high-voltage power source 8. And coil conductor 3b of upper coil 2b and stator core 1 are earthed. In this case, filling 7 featuring the volume resistivity in the range of 3× 106W1×1010Ω.cm is provided between coils 2a and 2b. As a result, no corona occurs at the coil end part between coils 2a and 2b, thus preventing the damage caused by the corona and given to SiC coating layers 6a and 6b for easing of the electric field.
COPYRIGHT: (C)1980,JPO&Japio
JP1144279A 1979-02-05 1979-02-05 Withstand voltage test method Pending JPS55103472A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1144279A JPS55103472A (en) 1979-02-05 1979-02-05 Withstand voltage test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1144279A JPS55103472A (en) 1979-02-05 1979-02-05 Withstand voltage test method

Publications (1)

Publication Number Publication Date
JPS55103472A true JPS55103472A (en) 1980-08-07

Family

ID=11778201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1144279A Pending JPS55103472A (en) 1979-02-05 1979-02-05 Withstand voltage test method

Country Status (1)

Country Link
JP (1) JPS55103472A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5077768A (en) * 1989-02-20 1991-12-31 Fuji Photo Film Co., Ltd. Fault detection and recovery device used in a radiation imaging information processing system
US5564012A (en) * 1989-03-29 1996-10-08 Fuji Photo Film Co., Ltd. Support apparatus for use with radiation image information processing system
US5651362A (en) * 1989-03-29 1997-07-29 Fuji Photo Film Co., Ltd. Support apparatus for use with radiation image information processing system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5077768A (en) * 1989-02-20 1991-12-31 Fuji Photo Film Co., Ltd. Fault detection and recovery device used in a radiation imaging information processing system
US5564012A (en) * 1989-03-29 1996-10-08 Fuji Photo Film Co., Ltd. Support apparatus for use with radiation image information processing system
US5651362A (en) * 1989-03-29 1997-07-29 Fuji Photo Film Co., Ltd. Support apparatus for use with radiation image information processing system

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